A sub-100 nm thickness flat jet for extreme ultraviolet to soft X-ray absorption spectroscopy

IF 2.4 3区物理与天体物理 Q2 INSTRUMENTS & INSTRUMENTATION

Journal of Synchrotron Radiation Pub Date : 2024-04-09 DOI:10.1107/s1600577524001875

De Angelis, D., Longetti, L., Bonano, G., Pelli Cresi, J.S., Foglia, L., Pancaldi, M., Capotondi, F., Pedersoli, E., Bencivenga, F., Krstulovic, M., Menk, R.H., D'Addato, S., Orlando, S., de Simone, M., Ingle, R.A., Bleiner, D., Coreno, M., Principi, E., Chergui, M., Masciovecchio, C., Mincigrucci, R.

引用次数: 0

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用于极紫外至软 X 射线吸收光谱分析的厚度小于 100 纳米的平面射流

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来源期刊

Journal of Synchrotron Radiation 物理-光学

CiteScore

5.10

自引率

12.00%

发文量

289

审稿时长

4-8 weeks

期刊介绍： Synchrotron radiation research is rapidly expanding with many new sources of radiation being created globally. Synchrotron radiation plays a leading role in pure science and in emerging technologies. The Journal of Synchrotron Radiation provides comprehensive coverage of the entire field of synchrotron radiation and free-electron laser research including instrumentation, theory, computing and scientific applications in areas such as biology, nanoscience and materials science. Rapid publication ensures an up-to-date information resource for scientists and engineers in the field.