In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy

IF 2.4 3区物理与天体物理 Q2 INSTRUMENTS & INSTRUMENTATION

Journal of Synchrotron Radiation Pub Date : 2024-01-01 DOI:10.1107/s1600577523010093

Lotze, G., Iyer, A.H.S., Bäcke, O., Kalbfleisch, S., Colliander, M.H.

引用次数: 0

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利用透射 X 射线纳米衍射显微镜对薄膜的应力、变形和断裂进行现场表征

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来源期刊

Journal of Synchrotron Radiation 物理-光学

CiteScore

5.10

自引率

12.00%

发文量

289

审稿时长

4-8 weeks

期刊介绍： Synchrotron radiation research is rapidly expanding with many new sources of radiation being created globally. Synchrotron radiation plays a leading role in pure science and in emerging technologies. The Journal of Synchrotron Radiation provides comprehensive coverage of the entire field of synchrotron radiation and free-electron laser research including instrumentation, theory, computing and scientific applications in areas such as biology, nanoscience and materials science. Rapid publication ensures an up-to-date information resource for scientists and engineers in the field.

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