Counting on the future: fast charge-integrating detectors for X-ray nanoimaging.

IF 2.4 3区物理与天体物理 Q2 INSTRUMENTS & INSTRUMENTATION

Journal of Synchrotron Radiation Pub Date : 2023-09-01 DOI:10.1107/S1600577523007269

Junjing Deng, Antonino Miceli, Chris Jacobsen

引用次数: 0

Abstract

A fast charge-integrating detector has been showcased for high-resolution X-ray ptychography. The advancement in developing detectors of this kind, with rapid framing capabilities, holds paramount significance in harnessing the full potential of emerging diffraction-limited synchrotron sources for X-ray nanoimaging.

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展望未来:用于x射线纳米成像的快速电荷集成探测器。

一种用于高分辨率x射线摄影的快速电荷积分探测器已经被展示。开发这种具有快速分幅能力的探测器的进展，对于充分利用新兴的衍射限制同步加速器源用于x射线纳米成像的全部潜力具有至关重要的意义。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Journal of Synchrotron Radiation 物理-光学

CiteScore

5.10

自引率

12.00%

发文量

289

审稿时长

4-8 weeks

期刊介绍： Synchrotron radiation research is rapidly expanding with many new sources of radiation being created globally. Synchrotron radiation plays a leading role in pure science and in emerging technologies. The Journal of Synchrotron Radiation provides comprehensive coverage of the entire field of synchrotron radiation and free-electron laser research including instrumentation, theory, computing and scientific applications in areas such as biology, nanoscience and materials science. Rapid publication ensures an up-to-date information resource for scientists and engineers in the field.