Journal of Research of the National Institute of Standards and Technology最新文献

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Design Considerations for a Surface Disinfection Device Using Ultraviolet-C Light-Emitting Diodes. 使用紫外线 C 发光二极管的表面消毒装置的设计考虑因素。
IF 1.5 4区 工程技术
Journal of Research of the National Institute of Standards and Technology Pub Date : 2022-02-16 eCollection Date: 2021-01-01 DOI: 10.6028/jres.126.045
Pratibha Sharma, Pao Chen, Saya Han, Peter Chung, Jungpin Chen, Justin Tseng, Chang Han
{"title":"Design Considerations for a Surface Disinfection Device Using Ultraviolet-C Light-Emitting Diodes.","authors":"Pratibha Sharma, Pao Chen, Saya Han, Peter Chung, Jungpin Chen, Justin Tseng, Chang Han","doi":"10.6028/jres.126.045","DOIUrl":"10.6028/jres.126.045","url":null,"abstract":"<p><p>Ultraviolet-C (UV-C) radiation, spanning wavelengths between 200 nm and 280 nm, has proven germicidal qualities and medical, industrial, and environmental applications. The need for new disinfection technologies and the prospect of eliminating mercury-based radiation sources compels research on ultraviolet (UV) light-emitting diodes (LEDs). UV-LED technology could be used for customized and point-of-use products for disinfection and sterilization. We focused on the design and development of a surface disinfection device using UV-C LEDs, including potential user targets, important design parameters, and final validation methods. Optical and thermal simulations were used to illustrate the design process and associated challenges. A sample device prototype was developed, and microbial validation results are presented.</p>","PeriodicalId":17039,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5,"publicationDate":"2022-02-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9707634/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"10370770","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
AbsorbanceQ: An App for Generating Absorbance Images from Brightfield Images. AbsorbanceQ:从明场图像生成吸收率图像的应用程序。
IF 1.5 4区 工程技术
Journal of Research of the National Institute of Standards and Technology Pub Date : 2022-01-04 eCollection Date: 2021-01-01 DOI: 10.6028/jres.126.039
Stephen M Zimmerman, Carl G Simon, Greta Babakhanova
{"title":"AbsorbanceQ: An App for Generating Absorbance Images from Brightfield Images.","authors":"Stephen M Zimmerman, Carl G Simon, Greta Babakhanova","doi":"10.6028/jres.126.039","DOIUrl":"10.6028/jres.126.039","url":null,"abstract":"","PeriodicalId":17039,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5,"publicationDate":"2022-01-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9707636/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"10431075","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Broadband Dielectric Spectroscopy as a Potential Label-Free Method to Rapidly Verify Ultraviolet-C Radiation Disinfection. 宽带介电光谱法是一种潜在的无标签方法,可用于快速验证紫外线-C 辐射消毒。
IF 1.5 4区 工程技术
Journal of Research of the National Institute of Standards and Technology Pub Date : 2021-08-20 eCollection Date: 2021-01-01 DOI: 10.6028/jres.126.022
Yaw S Obeng, Brian J Nablo, Darwin R Reyes, Dianne L Poster, Michael T Postek
{"title":"Broadband Dielectric Spectroscopy as a Potential Label-Free Method to Rapidly Verify Ultraviolet-C Radiation Disinfection.","authors":"Yaw S Obeng, Brian J Nablo, Darwin R Reyes, Dianne L Poster, Michael T Postek","doi":"10.6028/jres.126.022","DOIUrl":"10.6028/jres.126.022","url":null,"abstract":"<p><p>Microwave (MW) sensing offers noninvasive, real-time detection of the electromagnetic properties of biological materials via the highly concentrated electromagnetic fields, for which advantages include wide bandwidth, small size, and cost-effective fabrication. In this paper, we present the application of MW broadband dielectric spectroscopy (BDS) coupled to a fabricated biological thin film for evaluating ultraviolet-C (UV-C) exposure effects. The BDS thin film technique could be deployed as a biological indicator for assessing whole-room UV-C surface disinfection. The disinfection process is monitored by BDS as changes in the electrical properties of surface-confined biological thin films photodegraded with UV-C radiation. Fetal bovine serum (FBS, a surrogate for protein) and bacteriophage lambda double-stranded deoxyribonucleic acid (dsDNA) were continuously monitored with BDS during UV-C radiation exposure. The electrical resistance of FBS films yielded promising yet imprecise readings, whereas the resistance of dsDNA films discernibly decreased with UV-C exposure. The observations are consistent with the expected photo-oxidation and photodecomposition of protein and DNA. While further research is needed to characterize these measurements, this study presents the first application of BDS to evaluate the electrical properties of solid-state biological thin films. This technique shows promise toward the development of a test method and a standard biological test to determine the efficacy of UV-C disinfection. Such a test with biological indicators could easily be applied to hospital rooms between patient occupancy for a multipoint evaluation to determine if a room meets a disinfection threshold set for new patients.</p>","PeriodicalId":17039,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5,"publicationDate":"2021-08-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9681222/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"10370768","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Perspectives and Recommendations Regarding Standards for Ultraviolet-C Whole-Room Disinfection in Healthcare. 关于医疗保健中紫外线-C 全室消毒标准的观点和建议。
IF 1.5 4区 工程技术
Journal of Research of the National Institute of Standards and Technology Pub Date : 2021-08-20 eCollection Date: 2021-01-01 DOI: 10.6028/jres.126.015
Arthur Kreitenberg, Richard A Martinello
{"title":"Perspectives and Recommendations Regarding Standards for Ultraviolet-C Whole-Room Disinfection in Healthcare.","authors":"Arthur Kreitenberg, Richard A Martinello","doi":"10.6028/jres.126.015","DOIUrl":"10.6028/jres.126.015","url":null,"abstract":"<p><p>Patient well-being must be the driving force for determining standards for disinfection systems based on ultraviolet-C (UV-C) radiation. Reductions of inoculated bacteria on carriers is the optimal method of validating a UV-C-emitting system. We make specific, evidence-based recommendations regarding room description, organism selection, carrier material, quantity, orientations, and locations. Criteria for a satisfactory performance are discussed. Adoption of these requirements will ensure that devices intended for room disinfection provide the greatest chances for prevention of environmentally derived healthcare-associated infections.</p>","PeriodicalId":17039,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5,"publicationDate":"2021-08-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9681192/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"10370775","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Atomic Model Structure of the NIST Monoclonal Antibody (NISTmAb) Reference Material. NIST 单克隆抗体 (NISTmAb) 标准物质的原子模型结构。
IF 1.5 4区 工程技术
Journal of Research of the National Institute of Standards and Technology Pub Date : 2021-07-15 eCollection Date: 2021-01-01 DOI: 10.6028/jres.126.012
Christina Bergonzo, D Travis Gallagher
{"title":"Atomic Model Structure of the NIST Monoclonal Antibody (NISTmAb) Reference Material.","authors":"Christina Bergonzo, D Travis Gallagher","doi":"10.6028/jres.126.012","DOIUrl":"10.6028/jres.126.012","url":null,"abstract":"","PeriodicalId":17039,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5,"publicationDate":"2021-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9681211/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"10431081","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Porosity, Powder X-Ray Diffraction Patterns, Skeletal Density, and Thermal Stability of NIST Zeolitic Reference Materials RM 8850, RM 8851, and RM 8852. NIST沸石标准物质RM 8850、RM 8851和RM 8852的孔隙度、粉末x射线衍射模式、骨架密度和热稳定性。
IF 1.5 4区 工程技术
Journal of Research of the National Institute of Standards and Technology Pub Date : 2021-01-01 DOI: 10.6028/jres.126.047
Huong Giang T Nguyen, Ran Tao, Roger D van Zee
{"title":"Porosity, Powder X-Ray Diffraction Patterns, Skeletal Density, and Thermal Stability of NIST Zeolitic Reference Materials RM 8850, RM 8851, and RM 8852.","authors":"Huong Giang T Nguyen,&nbsp;Ran Tao,&nbsp;Roger D van Zee","doi":"10.6028/jres.126.047","DOIUrl":"https://doi.org/10.6028/jres.126.047","url":null,"abstract":"<p><p>This paper reports the powder X-ray diffraction patterns, argon isotherms at 87 K, Brunauer-Emmett-Teller surface areas, pore size distributions, pore volumes, skeletal densities, and thermal gravimetric analyses for three National Institute of Standards and Technology zeolitic reference materials, RM 8850 (zeolite Y), RM 8851 (zeolite A), and RM 8852 (ZSM-5).</p>","PeriodicalId":17039,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9707632/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"10370773","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Evaluations of a Detector-Limited Digital Impedance Bridge. 检测器限制数字阻抗桥的评估。
IF 1.5 4区 工程技术
Journal of Research of the National Institute of Standards and Technology Pub Date : 2021-01-01 DOI: 10.6028/jres.126.006
Mona Feige, Stephan Schlamminger, Bryan Waltrip, Michael Berilla, Yicheng Wang
{"title":"Evaluations of a Detector-Limited Digital Impedance Bridge.","authors":"Mona Feige,&nbsp;Stephan Schlamminger,&nbsp;Bryan Waltrip,&nbsp;Michael Berilla,&nbsp;Yicheng Wang","doi":"10.6028/jres.126.006","DOIUrl":"https://doi.org/10.6028/jres.126.006","url":null,"abstract":"<p><p>We tested a simple digital impedance bridge using two nominally equal resistors to form a 1:1 ratio. We focused on resolution and stability of the detectors. Fluctuations of the source voltages were largely removed through postprocessing of the digitized data, and the measurement results were limited by the detector noise. This detector-limited operating condition was first demonstrated using three modified Keysight 3458A multimeters for measurements of the voltage ratios, achieving 0.01 μV/V type A uncertainty in less than 15 min at 1 kHz. In an effort to extend the applicable frequency range and develop a system with off-the-shelf components, we tested a system using three lock-in detectors for measuring small deviations from the perfect AC ratio of unity magnitude, achieving stabilities and resolutions of 0.1 μV/V in a few hours for each point from 1 kHz to 5 kHz.</p>","PeriodicalId":17039,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9681207/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"9742001","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
An Analysis of an Inventory of Community Resilience Frameworks. 社区复原力框架清单分析。
IF 1.5 4区 工程技术
Journal of Research of the National Institute of Standards and Technology Pub Date : 2021-01-01 DOI: 10.6028/jres.126.031
Jarrod Loerzel, Maria Dillard
{"title":"An Analysis of an Inventory of Community Resilience Frameworks.","authors":"Jarrod Loerzel,&nbsp;Maria Dillard","doi":"10.6028/jres.126.031","DOIUrl":"https://doi.org/10.6028/jres.126.031","url":null,"abstract":"This data article provides details of an analysis of an inventory of 56 community resilience frameworks. In this article, a description of how the inventory data was catalogued is presented. Section 3 outlines the categories used to analyze the frameworks as well as the categories used to bin the indicators and measures used in each. Section 3.1 describes the results of the categorization process for the 56 resilience frameworks. Section 3.2 outlines the results of the categorization of the 3,298 indicators used in each framework. Section 3.3 describes the 7,165 measures used in the 56 frameworks.","PeriodicalId":17039,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9683026/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"10431077","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Efficacy of Ultraviolet-C Devices for the Disinfection of Personal Protective Equipment Fabrics and N95 Respirators. 紫外线- c装置对个人防护用品织物和N95口罩消毒效果的研究
IF 1.5 4区 工程技术
Journal of Research of the National Institute of Standards and Technology Pub Date : 2021-01-01 DOI: 10.6028/jres.126.023
Kumari Moothedath Chandran, Praveen C Ramamurthy, Kawkab Kanjo, Rohan Narayan, S Raghu Menon
{"title":"Efficacy of Ultraviolet-C Devices for the Disinfection of Personal Protective Equipment Fabrics and N95 Respirators.","authors":"Kumari Moothedath Chandran,&nbsp;Praveen C Ramamurthy,&nbsp;Kawkab Kanjo,&nbsp;Rohan Narayan,&nbsp;S Raghu Menon","doi":"10.6028/jres.126.023","DOIUrl":"https://doi.org/10.6028/jres.126.023","url":null,"abstract":"<p><p>Since the onset of the coronavirus disease 2019 (COVID-19) pandemic, a plethora of ultraviolet-C (UV-C) disinfection products have come to market, especially in emerging economies. UV-C-based disinfection products for mobile phones, food packaging, face masks and personal protective equipment (PPE), and other everyday objects are available in popular electronic-commerce platforms as consumer products. Product designers from multinational to startup companies began to design UV-C disinfection products but had no prior-art reference, user feedback, or validation of product efficacy, which are important stages in product design. A UV-C disinfection product cannot be assessed by most consumers for its viricidal efficacy. Many firms entered the domain of UV-C products and were unaware of the necessary validation requirements. Lack of availability and access to virology laboratories, due to lockdowns in countries, and lack of standards and certification for UV-C disinfection products limited product designers and firms in benchmarking their UV-C-based devices before market release. This work evaluates two UV-C disinfection devices for viricidal efficacy on PPE fabric and National Institute for Occupational Safety and Health (NIOSH)-certified N95 respirators through controlled experiments using the H1N1 virus, which is enveloped and is transmitted via the respiratory route similar to severe acute respiratory syndrome coronavirus 2 (SARS-CoV-2), the cause of COVID-19. The experiment also evaluated the effectiveness of chemical disinfectants along with and versus UV-C disinfection. Experiments for material selection, UV dose calculation, and UV endurance of PPE samples to be disinfected are also discussed. The outcome of this work establishes a systematic method to validate the efficacy of UV-C disinfection products. The design guidelines would benefit product designers in designing UV-C-based disinfection products.</p>","PeriodicalId":17039,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9681524/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"10370771","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Optical Fiber Time Delay Comparison Between NIST and LAMETRO. NIST与LAMETRO光纤时延比较。
IF 1.5 4区 工程技术
Journal of Research of the National Institute of Standards and Technology Pub Date : 2021-01-01 DOI: 10.6028/jres.126.040
T Dennis, J Jimenez
{"title":"Optical Fiber Time Delay Comparison Between NIST and LAMETRO.","authors":"T Dennis,&nbsp;J Jimenez","doi":"10.6028/jres.126.040","DOIUrl":"https://doi.org/10.6028/jres.126.040","url":null,"abstract":"<p><p>We describe the results of a bilateral measurement comparison of optical fiber time delay between the National Institute of Standards and Technology (NIST, USA) and Laboratorio de Metrología, Instituto Costarricense de Electricidad (LAMETRO-ICE, Costa Rica), which was conducted on a single-mode optical fiber reference spool at wavelengths of 1310 nm and 1550 nm. The measurement results showed the largest difference to be less than 0.93 ns, which is within the combined standard uncertainty (coverage factor k = 1) for the measurement systems at the two laboratories.</p>","PeriodicalId":17039,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9707631/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"10431076","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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