检测器限制数字阻抗桥的评估。

IF 1.5 4区 工程技术
Mona Feige, Stephan Schlamminger, Bryan Waltrip, Michael Berilla, Yicheng Wang
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引用次数: 2

摘要

我们测试了一个简单的数字阻抗桥,使用两个名义上相等的电阻形成1:1的比例。我们关注的是探测器的分辨率和稳定性。通过对数字化数据的后处理,很大程度上消除了源电压的波动,测量结果受检测器噪声的限制。这种检测器限制的工作条件首先使用三个改进的Keysight 3458A万用表进行电压比测量,在1 kHz下,在不到15分钟的时间内实现0.01 μV/V A型不确定度。为了扩大适用频率范围并开发具有现成组件的系统,我们使用三个锁相检测器测试了一个系统,用于测量单位量级的完美交流比的小偏差,在1 kHz至5 kHz的每个点上,在几个小时内实现了0.1 μV/V的稳定性和分辨率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Evaluations of a Detector-Limited Digital Impedance Bridge.

Evaluations of a Detector-Limited Digital Impedance Bridge.

Evaluations of a Detector-Limited Digital Impedance Bridge.

Evaluations of a Detector-Limited Digital Impedance Bridge.

We tested a simple digital impedance bridge using two nominally equal resistors to form a 1:1 ratio. We focused on resolution and stability of the detectors. Fluctuations of the source voltages were largely removed through postprocessing of the digitized data, and the measurement results were limited by the detector noise. This detector-limited operating condition was first demonstrated using three modified Keysight 3458A multimeters for measurements of the voltage ratios, achieving 0.01 μV/V type A uncertainty in less than 15 min at 1 kHz. In an effort to extend the applicable frequency range and develop a system with off-the-shelf components, we tested a system using three lock-in detectors for measuring small deviations from the perfect AC ratio of unity magnitude, achieving stabilities and resolutions of 0.1 μV/V in a few hours for each point from 1 kHz to 5 kHz.

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来源期刊
自引率
33.30%
发文量
10
期刊介绍: The Journal of Research of the National Institute of Standards and Technology is the flagship publication of the National Institute of Standards and Technology. It has been published under various titles and forms since 1904, with its roots as Scientific Papers issued as the Bulletin of the Bureau of Standards. In 1928, the Scientific Papers were combined with Technologic Papers, which reported results of investigations of material and methods of testing. This new publication was titled the Bureau of Standards Journal of Research. The Journal of Research of NIST reports NIST research and development in metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, information technology.
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