{"title":"BDD and DNF Based Algorithms for Constructing All Testability Functions of Combinational Circuit","authors":"O. Golubeva","doi":"10.1109/SIBCON50419.2021.9438879","DOIUrl":"https://doi.org/10.1109/SIBCON50419.2021.9438879","url":null,"abstract":"Constructing testability functions of a combinational circuit line, such as: the controllability, observability and stuck-at fault detection functions, as well as the complement of the observability function is considered. Methods and algorithms for constructing testability functions based on Binary Decision Diagram (BDD) and Disjunctive Normal Form (DNF), as well as methods for constructing Conjunctive Normal Form (CNF) and obtaining testability functions using a SAT solver are proposed. Methods and algorithms for constructing testability functions for all and a subset of lines of a circuit are also proposed. Proposed methods and algorithms make it possible to significantly reduce the computational costs for constructing testability functions of a combinational circuit.","PeriodicalId":150550,"journal":{"name":"2021 International Siberian Conference on Control and Communications (SIBCON)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128435591","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Application of the User’s Digital Footprint in the Adaptive Authentication Problem","authors":"A. Salomatin, A. Iskhakov, R. Meshcheryakov","doi":"10.1109/SIBCON50419.2021.9438880","DOIUrl":"https://doi.org/10.1109/SIBCON50419.2021.9438880","url":null,"abstract":"This paper describes the application of adaptive user authentication based on a calculated digital footprint. The digital footprint is considered as an integrated indicator that the user is unique in its set of characteristics and behavior on the network. The main classes of digital footprint sources are marked, with the greatest attention paid to browser fingerprints. Using a mathematically supported method based on the comparison of the digital footprint, an experiment is conducted to determine the authenticity of the user in the three cases under consideration. The experiment showed that the method works correctly and successfully and can give better results by optimizing its parameters: the weights of criteria, the weights of browser fingerprints and the threshold value of user’s uniqueness.","PeriodicalId":150550,"journal":{"name":"2021 International Siberian Conference on Control and Communications (SIBCON)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128764111","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
R. Torshin, G. Sorokoumov, D. Bobrovsky, D. Titovets, M.O. Kalashnikova
{"title":"Measurement of Parameters of Analog-to-Digital Converters Based on the NI Hardware-Software Complex in the Course of a Radiation Experiment","authors":"R. Torshin, G. Sorokoumov, D. Bobrovsky, D. Titovets, M.O. Kalashnikova","doi":"10.1109/SIBCON50419.2021.9438886","DOIUrl":"https://doi.org/10.1109/SIBCON50419.2021.9438886","url":null,"abstract":"The paper presents an automated system for functional and parametric control of analog-to-digital converters (ADC) during a radiation experiment. The automated measuring system is based on the combined use of modular PXI equipment manufactured by National Instruments and the signal generator SMA100B manufactured by Rohde & Schwarz (R&S). The PXI-4461 module is the most significant module in the system. Hardware and software operations of the measuring system are discussed in the paper. The parameters controlled during total ionizing dose (TID) tests are listed in the paper alongside the algorithm for parametric control. We describe a histogram method for removing input noise. In order to mitigate drawbacks of histogram method, we measured sample median for each ADC code value during the experiment. With the help of this system, the main static and dynamic parameters of test ADCs are calculated and their degradation during irradiation at the Cs-137 isotope source is shown. Specifications for quantifying ADC dynamic performance were based on an FFT results analysis. Typical TID effects in ADCs are observed: degradation of the transfer function and associated deterioration of the accuracy parameters: integral nonlinearity, differential nonlinearity, offset and gain errors.","PeriodicalId":150550,"journal":{"name":"2021 International Siberian Conference on Control and Communications (SIBCON)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127339867","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Simple Algorithm of Antenna Array Calibration","authors":"V. Kurganov, V. Djigan","doi":"10.1109/SIBCON50419.2021.9438897","DOIUrl":"https://doi.org/10.1109/SIBCON50419.2021.9438897","url":null,"abstract":"This paper presents a simple algorithm for the calibration of antenna arrays. It belongs to the phase-less algorithms family, because it does not require the expensive phase measurement equipment. The estimation and compensation of the complex-valued gains of the array channels, caused by non-identical characteristics of these channels, is the aim of a calibration task. For the estimation, the considered calibration algorithm uses only three measurements of the array output power under 0°, 90° and 270° phase shifter states in each channel. The algorithm explanation and the main steps of the algorithm development, based on the geometrical representation of the antenna array signals, are presented. The algorithm efficiency is proved via simulation.","PeriodicalId":150550,"journal":{"name":"2021 International Siberian Conference on Control and Communications (SIBCON)","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131901416","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Monitoring of the Earth’s Surface in Conditions of Low Visibility","authors":"M. I. Mokrova, I. K. Kotelnikov","doi":"10.1109/SIBCON50419.2021.9438865","DOIUrl":"https://doi.org/10.1109/SIBCON50419.2021.9438865","url":null,"abstract":"Aviation monitoring of fires using unmanned aerial vehicles (UAVs), in particular, forest fires, in the process of which various objects of interest are searched for (people, cars, etc.) is one of the most effective measures to reduce the level of possible losses. This paper discusses approaches to the formation of algorithms for processing and improving images obtained in the course of the fire situation monitoring in order to search for various objects of interest.","PeriodicalId":150550,"journal":{"name":"2021 International Siberian Conference on Control and Communications (SIBCON)","volume":"2010 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125628744","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
R. E. Vaskin, V. D. Kalashnikov, G. Sorokoumov, D. Boychenko
{"title":"The Optimal Measuring System Composition for the Transceivers Radiation Hardness Investigation","authors":"R. E. Vaskin, V. D. Kalashnikov, G. Sorokoumov, D. Boychenko","doi":"10.1109/SIBCON50419.2021.9438912","DOIUrl":"https://doi.org/10.1109/SIBCON50419.2021.9438912","url":null,"abstract":"Modern transceivers are widely used in the design of the on-board equipment of spacecraft. The effects of space ionizing radiation can lead to failures in operation of transceivers, leading to a loss of the transmitted data. It is necessary to provide radiation hardness assurance of transceivers in order to evaluate the rate of upsets in the operation of transceivers used the on-board equipment of spacecraft. The paper describes main types of failures observed in interface ICs operating in space radiation environment. The classification of functional failures in transceivers exposed to ionizing radiation and monitoring methods are presented in this paper. Parameters of transceivers that has to be monitored during radiation testing are listed. We reviewed National Instruments equipment used in radiation testing of different types of transceivers. A measuring system based on this equipment was used for radiation testing of TLK2711 transceiver in loop operation mode over a serial data channel.","PeriodicalId":150550,"journal":{"name":"2021 International Siberian Conference on Control and Communications (SIBCON)","volume":"166 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124648680","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
L. Kessarinskiy, V.S. Kessarinskiy, A. Tararaksin, A. Shirin, D. Boychenko
{"title":"Single Event Burnout Sensitivity Prediction Based on Commercial MOSFET Electrical Characteristics Analysis","authors":"L. Kessarinskiy, V.S. Kessarinskiy, A. Tararaksin, A. Shirin, D. Boychenko","doi":"10.1109/SIBCON50419.2021.9438864","DOIUrl":"https://doi.org/10.1109/SIBCON50419.2021.9438864","url":null,"abstract":"Power MOSFET transistors are the main part of the power supply system for any equipment, including spacecraft. Modern vertical MOSFETs are designed as regular matrix structures of elementary parallel cells (mini-transistors), made according to submicron process. Single event burnout (SEB) of a vertical cell is the main mechanism for failure of vertical MOSFETs from single particle effect. In addition to SEB, there are several other reasons for the MOSFET burnout, caused by extremal bias, that are tested during manufacturing. The MOSFETs SEB sensitivity prediction model is presented. The model is based on the analysis of burnout bias characteristics from the datasheets. The comparison of experimental data and model prediction results is presented in the article. The figure of merit (FOM) for SEB sensitivity prediction is proposed. The optimal value of FOM for n-MOSFETs and LET 40 MeV cm2/mg is presented. So, the model helps to determine the most sensitive MOSFET transistors before expensive testing done.","PeriodicalId":150550,"journal":{"name":"2021 International Siberian Conference on Control and Communications (SIBCON)","volume":"89 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122235813","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Y. Choni, A. G. Romanov, A. Dardymov, Igor Yurievich Danilov
{"title":"Retrieving Best-Fit Paraboloid from Signals of a Ground Based Beacon for Electroic Compensation of Satellite Multi-beam Hybrid Reflector Antenna Distortions","authors":"Y. Choni, A. G. Romanov, A. Dardymov, Igor Yurievich Danilov","doi":"10.1109/SIBCON50419.2021.9438869","DOIUrl":"https://doi.org/10.1109/SIBCON50419.2021.9438869","url":null,"abstract":"Due to the influence of operating conditions, the reflector profile of a large-sized satellite antenna undergoes distortions, which lead to a deterioration in antenna performance and a decrease in the energy efficiency of the communication system. Monitoring the current state of the reflector and compensating for detected displacements can significantly reduce these losses. In the case of a multi-beam hybrid reflector antenna, it is possible and of interest to control the reflector profile using signals from a ground beacon received by an antenna array or a cluster of its elements. In this paper, we discuss an iterative algorithm for recovering the parameters of the so-called best-fit paraboloid, analyze its convergence (depending on reflector distortion), and discuss the simulation results both for specific conditions and for a large number of random situations.","PeriodicalId":150550,"journal":{"name":"2021 International Siberian Conference on Control and Communications (SIBCON)","volume":"71 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128214373","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Suren G. Matinyan, N. Mamedova, M. Afanasev, Ekaterina V. Makarenkova
{"title":"New Promising Ways of Widespread Popular Mobile Devices Practical Use Value Increase","authors":"Suren G. Matinyan, N. Mamedova, M. Afanasev, Ekaterina V. Makarenkova","doi":"10.1109/SIBCON50419.2021.9438899","DOIUrl":"https://doi.org/10.1109/SIBCON50419.2021.9438899","url":null,"abstract":"The number of people who use popular mobile electronic devices on a daily basis has been growing significantly. As opposed to the disadvantages of the mentioned fact, the research is aimed to explore the most promising ways to expand currently presented and future devices capabilities (e.g., in the healthcare area). Although the described visions of the leading technology companies about the growing role of the mobile devices in people everyday life have a lot in common, their current efforts can be focused in different directions. The conclusions made by us in the paper are aimed at helping to develop an independent opinion on the mentioned topic.","PeriodicalId":150550,"journal":{"name":"2021 International Siberian Conference on Control and Communications (SIBCON)","volume":"80 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127274052","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. A. Gracheva, I. Shvetsov-Shilovskiy, S. Shmakov, A. Petrov, A. Yanenko
{"title":"Leakage Currents Automated Monitoring System for Memory ICs under Dose Exposure","authors":"A. A. Gracheva, I. Shvetsov-Shilovskiy, S. Shmakov, A. Petrov, A. Yanenko","doi":"10.1109/SIBCON50419.2021.9438909","DOIUrl":"https://doi.org/10.1109/SIBCON50419.2021.9438909","url":null,"abstract":"The paper presents an automated control system for leakage currents monitoring in memory ICs based on National Instruments PXI platform. One of the two standard low-level boards used in our laboratory has been modified with an intermediate board to measure the leakage currents. The ability to break the monitored lines was implemented using relays on the intermediate board. Also, lines were added for relay control, and connectors were added for measuring leakage currents and memory access time. After successful testing, a replacement for the second lower-level board was developed and manufactured. A complete list of used equipment is presented, the advantages of using the NI PXI-4141 source measurement unit and possible variants for its replacement were described. The software and front control panel of the automated system were presented. The process of monitoring the leakage current and the specifics of its measurement were described. The features of control and data lines commutation were described. After testing the automated system for the correct commutation, it was used to monitor leakage currents during TID tests. The experimental results of monitoring the leakage current along 7 lines are presented (CE, WE, OE, DQ0, DQ7, A0, A7). The test results, possible options for equipment and a block diagram of the automated system are presented.","PeriodicalId":150550,"journal":{"name":"2021 International Siberian Conference on Control and Communications (SIBCON)","volume":"212 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115589087","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}