Leakage Currents Automated Monitoring System for Memory ICs under Dose Exposure

Abstract

The paper presents an automated control system for leakage currents monitoring in memory ICs based on National Instruments PXI platform. One of the two standard low-level boards used in our laboratory has been modified with an intermediate board to measure the leakage currents. The ability to break the monitored lines was implemented using relays on the intermediate board. Also, lines were added for relay control, and connectors were added for measuring leakage currents and memory access time. After successful testing, a replacement for the second lower-level board was developed and manufactured. A complete list of used equipment is presented, the advantages of using the NI PXI-4141 source measurement unit and possible variants for its replacement were described. The software and front control panel of the automated system were presented. The process of monitoring the leakage current and the specifics of its measurement were described. The features of control and data lines commutation were described. After testing the automated system for the correct commutation, it was used to monitor leakage currents during TID tests. The experimental results of monitoring the leakage current along 7 lines are presented (CE, WE, OE, DQ0, DQ7, A0, A7). The test results, possible options for equipment and a block diagram of the automated system are presented.