2012 IEEE AUTOTESTCON Proceedings最新文献_第3页

Interpreting system switching specifications and how they relate to waveform quality 解释系统开关规格以及它们与波形质量的关系

2012 IEEE AUTOTESTCON Proceedings Pub Date : 2012-10-22 DOI: 10.1109/AUTEST.2012.6334526

K. Paton

引用次数: 0

A standards-based approach to gray-scale health assessment using fuzzy fault trees 基于标准的模糊故障树灰阶健康评估方法

2012 IEEE AUTOTESTCON Proceedings Pub Date : 2012-10-22 DOI: 10.1109/AUTEST.2012.6334529

P. Donnelly, L. Sturlaugson, J. Sheppard

引用次数: 7

Simplifying test system development with IVI.NET 使用IVI简化测试系统开发。网

2012 IEEE AUTOTESTCON Proceedings Pub Date : 2012-10-22 DOI: 10.1109/AUTEST.2012.6334546

K. Fertitta

{"title":"Simplifying test system development with IVI.NET","authors":"K. Fertitta","doi":"10.1109/AUTEST.2012.6334546","DOIUrl":"https://doi.org/10.1109/AUTEST.2012.6334546","url":null,"abstract":"The IVI Foundation has developed and maintained specifications for building instrument drivers for more than a decade. Until recently, there were two choices for building IVI-compliant instrument drivers - IVI-COM and IVI-C. Each of these driver technologies offers its own advantages for specific types of users, and each comes with its own set of disadvantages. The release of the IVI.NET specifications from the IVI Foundation introduces a new mechanism for controlling instrumentation from test system software. As a great deal of Windows desktop application development (as well as a considerable amount of web development) has shifted to the Microsoft .NET platform, the demand for tools that help test system developers work with .NET has grown. Conventional desktop application developers have benefited considerably from the productivity gains of working with .NET, and test system developers have already begun to enjoy the same. Having a driver technology that fully capitalizes on the benefits of the .NET platform and that marries naturally with .NET-based test system software is critical. This paper will examine the new IVI.NET standard and take a practical look at how IVI.NET drivers can simplify test system development.","PeriodicalId":142978,"journal":{"name":"2012 IEEE AUTOTESTCON Proceedings","volume":"135 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126888749","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 4

Automatic Modulation Recognition techniques based on cyclostationary and multifractal features for distinguishing LFM, PWM and PPM waveforms used in radar systems as example of artificial intelligence implementation in test 基于循环平稳和多重分形特征的LFM、PWM和PPM波形自动调制识别技术在雷达系统中的应用，作为人工智能实现的测试实例

2012 IEEE AUTOTESTCON Proceedings Pub Date : 2012-10-22 DOI: 10.1109/AUTEST.2012.6334562

S. Sobolewski, W. L. Adams, R. Sankar

{"title":"Automatic Modulation Recognition techniques based on cyclostationary and multifractal features for distinguishing LFM, PWM and PPM waveforms used in radar systems as example of artificial intelligence implementation in test","authors":"S. Sobolewski, W. L. Adams, R. Sankar","doi":"10.1109/AUTEST.2012.6334562","DOIUrl":"https://doi.org/10.1109/AUTEST.2012.6334562","url":null,"abstract":"Automatic Modulation Recognition (AMR) is an example of implementation of Artificial Intelligence to cognitive radio received signal software testing. This article proposes two fairly simple and computationally feasible AMR algorithms, based on the principles of cyclostationarity and multi-fractals, suitable for practical real-time software radio communications applications for distinguishing Linear Frequency Modulation (LFM or Chirp), Pulse Width and Pulse Position Modulations (PWM/PPM) waveforms used in Radar systems, both commercial and military, from other commonly employed modulations such as, for example, BPSK, BFSK, GMSK. In these techniques, the incoming received signal is processed to determine the cyclostationary and multifractal features of the waveforms which are later matched by a neural network classifier with corresponding feature patterns of stored modulated waveforms, declaring the appropriate modulation present for whichever waveform produces the highest matching output. A spreadsheet of classification probabilities for both techniques is generated which compares their performance for the six studied waveforms.","PeriodicalId":142978,"journal":{"name":"2012 IEEE AUTOTESTCON Proceedings","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132212495","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 14

What to do when your automated test equipment and Unit Under Test are out of reach? 当您的自动化测试设备和被测单元无法触及时，该怎么办?

2012 IEEE AUTOTESTCON Proceedings Pub Date : 2012-10-22 DOI: 10.1109/AUTEST.2012.6334528

P. Gilenberg

{"title":"What to do when your automated test equipment and Unit Under Test are out of reach?","authors":"P. Gilenberg","doi":"10.1109/AUTEST.2012.6334528","DOIUrl":"https://doi.org/10.1109/AUTEST.2012.6334528","url":null,"abstract":"Cabling from the Unit Under Test (UUT) to the Test System has become an increasingly difficult challenge to overcome. There are a few distinct challenges. The distance between the UUTs and the Test System has become a major challenge with today's high speed busses. Current UUTs and Test Systems have trouble driving long cable lengths of 10 meters or more due to signal integrity reasons, latency, and the skew across high speed busses which can run as fast as 5Gb/s. Also, multipoint busses such as PCI do not have support for external cabling solutions which makes testing difficult. Furthermore, limited space in the General Purpose Interface (GPI) prevents the tester from cabling out all necessary signals. This paper will explore a solution to these problems, which is to bring a piece of the Test System close to the UUT, instead of bringing the UUT close to the Test System. In most Test Systems, there exists a master chassis with instrumentation. The key to solving this problem is to create a small form factor chassis that can be placed close to the UUT, which can be thought of as a Remote Test Head. The Remote Test Head is an extension of the Master Chassis allowing the same instrumentation and software to be used as in the local system; therefore saving the System Designer and TPS Developer from having to design new instrumentation or writing new tests. The connection between the Test System and the Remote Test Head is optical thus alleviating problems with signal integrity. The connection allows the Remote Test Head and the Test System to be more than 10m apart while still maintaining a throughput of 5Gb/s even when going through a GPI.","PeriodicalId":142978,"journal":{"name":"2012 IEEE AUTOTESTCON Proceedings","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132413402","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Dealing with the multitudes of legacy TPSs 处理大量遗留tps

2012 IEEE AUTOTESTCON Proceedings Pub Date : 2012-10-22 DOI: 10.1109/AUTEST.2012.6334545

T. Mcquillen

引用次数: 0

Life cycle planning from product development to long term sustainment 从产品开发到长期维护的生命周期规划

2012 IEEE AUTOTESTCON Proceedings Pub Date : 2012-10-22 DOI: 10.1109/AUTEST.2012.6334559

J. Harnack

{"title":"Life cycle planning from product development to long term sustainment","authors":"J. Harnack","doi":"10.1109/AUTEST.2012.6334559","DOIUrl":"https://doi.org/10.1109/AUTEST.2012.6334559","url":null,"abstract":"One of the major challenges engineers face when developing military test systems is balancing the life cycle mismatch of test equipment that's commonly deployed for 20+ years with the shorter life cycle of commercial-off-the-shelf (COTS) components often used in those systems. To ensure long term supportability of these systems, it is important to plan for obsolescence issues starting in the product development phase and continuing through the sustaining state to end of life. Successful long term support of test systems requires careful up-front planning, a proper system architecture, and a comprehensive long term life cycle management plan. Software is becoming increasingly more important in long term sustainment as it continues to define more and more of the test system functionality. A key software architecture for mitigating the impact of obsolescence is the implementation of hardware abstraction layers (HALs). A modular software architecture, such as a HAL, is an important proactive component of a life cycle management plan that also includes traditional hardware life cycle management strategies such as sparing, obsolescence tracking and planned technology refreshes. This paper examines some of the techniques used to manage test system obsolescence through HALs and hardware life cycle management.","PeriodicalId":142978,"journal":{"name":"2012 IEEE AUTOTESTCON Proceedings","volume":"160 Pt 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128741706","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Digital up conversion VS IQ modulation using a wideband arbitrary waveform generator 数字上变频VS IQ调制使用宽带任意波形发生器

2012 IEEE AUTOTESTCON Proceedings Pub Date : 2012-10-22 DOI: 10.1109/AUTEST.2012.6334570

B. Hoehne

引用次数: 4

Stress testing software to determine fault tolerance for hardware failure and anomalies 压力测试软件用于确定硬件故障和异常的容错能力

2012 IEEE AUTOTESTCON Proceedings Pub Date : 2012-10-22 DOI: 10.1109/AUTEST.2012.6334582

J. Wu

{"title":"Stress testing software to determine fault tolerance for hardware failure and anomalies","authors":"J. Wu","doi":"10.1109/AUTEST.2012.6334582","DOIUrl":"https://doi.org/10.1109/AUTEST.2012.6334582","url":null,"abstract":"Today's military systems rely for their performance on combinations of hardware and software. While testing of hardware performance during design, development and operation is well understood, the testing of software is less mature. In particular, the effect of hardware failures in the field on software performance, and therefore systems performance, is all-too-often overlooked or is tested in a far less rigorous manner that that applied to Hardware failures alone. Numerous examples exist of major system failures driven by software anomalies but triggered by Hardware failures, with consequences that range from degraded mission performance to weapons system destruction and operator fatalities. Measuring software development quality and fault tolerance is a challenging task. Many software test methods focus on source-code only approach (unit tests, modular test) and neglect the impacts caused by hardware anomalies or failures. Such missing test coverage can and will result in potential degraded software performance quality, thereby adding to project cost and delaying schedule. It can also result in far more disastrous consequences for the warfighters. This paper will discuss the general nature of the hardware-failure-software anomaly - system failure flow-down. It will then describe techniques that exist for system software testing and will highlight extensions of these techniques to focus on an effective and comprehensive software testing that includes performance prediction and hardware failure fault tolerance. The end result is a suite of test methods that, when properly applied, offer a systematic and comprehensive analysis of prime software behaviors under a range of hardware field failure conditions.","PeriodicalId":142978,"journal":{"name":"2012 IEEE AUTOTESTCON Proceedings","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134553963","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Supporting a wide variety of communication protocols using partial dynamic reconfiguration 使用局部动态重新配置支持多种通信协议

2012 IEEE AUTOTESTCON Proceedings Pub Date : 2012-10-22 DOI: 10.1109/AUTEST.2012.6334561

R. Dunkley

引用次数: 6