2012 IEEE AUTOTESTCON Proceedings最新文献_第2页

Integration of mobile devices and ATE systems 移动设备和ATE系统的集成

2012 IEEE AUTOTESTCON Proceedings Pub Date : 2012-10-22 DOI: 10.1109/AUTEST.2012.6334537

Sok Lao

引用次数: 1

Windows Presentation Foundation (WPF) technology meets the challenges of operator interface design in automatic test systems Windows Presentation Foundation (WPF)技术满足了自动测试系统中操作界面设计的挑战

2012 IEEE AUTOTESTCON Proceedings Pub Date : 2012-10-22 DOI: 10.1109/AUTEST.2012.6334585

A. Kozminski

{"title":"Windows Presentation Foundation (WPF) technology meets the challenges of operator interface design in automatic test systems","authors":"A. Kozminski","doi":"10.1109/AUTEST.2012.6334585","DOIUrl":"https://doi.org/10.1109/AUTEST.2012.6334585","url":null,"abstract":"The operator interface is the critical link between a test system and its operator. When a test fails, the operator must quickly process the results and decide whether to troubleshoot, rerun or halt the test based on information displayed by the software. An effective and well-designed operator interface can increase productivity, reduce testing time and operator error as well as improve adoption of the software. Whether the interface displays a simple pass/fail status or offers sophisticated troubleshooting operations, implementing a good user interface experience can be a challenging task. Windows Presentation Foundation (WPF) is a user interface framework for building Windows client applications with immersive and intuitive user experiences. WPF combines the application user interface, 2D graphics, 3D graphics, documents and multimedia into one single framework to help developers create rich and interactive applications. This framework was created to help developers meet increasing expectations of the experience and usability of software applications. WPF facilitates the creation of high-quality user interfaces that stand out amongst competitors and help test operators accomplish their tasks faster with less opportunity for error. Windows Presentation Foundation provides developers with the tools needed to more rapidly iterate on the UI and reach a better quality user interface in a shorter amount of time. This paper discusses the fundamental principles behind Windows Presentation Foundation technology and demonstrates the advantages of building test operator interfaces using this modern design framework.","PeriodicalId":142978,"journal":{"name":"2012 IEEE AUTOTESTCON Proceedings","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128880530","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 6

An integrated toolset for ontology-guided diagnostic knowledge discovery 用于本体引导的诊断知识发现的集成工具集

2012 IEEE AUTOTESTCON Proceedings Pub Date : 2012-10-22 DOI: 10.1109/AUTEST.2012.6334527

S. Strasser, E. Howard, J. Sheppard

引用次数: 1

Applying system engineering processes to legacy test program set modernization 将系统工程过程应用于遗留测试程序集现代化

2012 IEEE AUTOTESTCON Proceedings Pub Date : 2012-10-22 DOI: 10.1109/AUTEST.2012.6334541

P. F. Austin

{"title":"Applying system engineering processes to legacy test program set modernization","authors":"P. F. Austin","doi":"10.1109/AUTEST.2012.6334541","DOIUrl":"https://doi.org/10.1109/AUTEST.2012.6334541","url":null,"abstract":"Automatic Test Equipment (ATE) Engineering often involves modernization of legacy test systems. With anticipated reductions in the DoD budgets and increasing system test complexity, modernization can be quite challenging. Most of the time these legacy systems have minimal or occasionally no documentation. How do you get from an aging legacy system lacking documentation to an updated modern test system that is highly capable and fully documented and validated? The challenges are many. Missing test requirements, outdated software revisions, partial product specifications, no Test Program Set (TPS) definition, lack of operating system updates, outdated vendor-supplied software drivers, instrument and component obsolescence, customer data system compatibility requirements issues, and system build software not defined, just to name a few. This paper will discuss getting from a confused, unorganized place to one that's meaningful, containing complete requirements, design, and validation documentation using a robust Systems Engineering (SE) design approach. This paper will trace how to efficiently achieve good performance and suggest a logical way to get there, employing modular principles for today and be able to reuse them for tomorrow's challenges. What are good and bad approaches to this problem? Information about design choices and how they can lead to success will be discussed.","PeriodicalId":142978,"journal":{"name":"2012 IEEE AUTOTESTCON Proceedings","volume":"733 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128308171","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Circuit card test and diagnosis using electromagnetic emission analysis 利用电磁发射分析对电路卡进行测试和诊断

2012 IEEE AUTOTESTCON Proceedings Pub Date : 2012-10-22 DOI: 10.1109/AUTEST.2012.6334549

R. G. Wright

{"title":"Circuit card test and diagnosis using electromagnetic emission analysis","authors":"R. G. Wright","doi":"10.1109/AUTEST.2012.6334549","DOIUrl":"https://doi.org/10.1109/AUTEST.2012.6334549","url":null,"abstract":"This paper describes the exploitation of spurious unwanted electromagnetic emissions from electronic circuits as a means to test and diagnose failures and performance anomalies within circuit cards and assemblies. Enhanced diagnostic capability with order-of-magnitude reduction in development and recurring costs as well as development time are likely outcomes of the successful realization of this approach. Testing is accomplished using non-contact methods providing a means to establish virtual test connectors throughout multi-layer circuit cards. Signals within electromagnetic fields that emanate across the frequency spectrum can be acquired and measured without removing protective conformal coatings. Signal propagation through the circuit card and between components is readily discernible using this technique, and the information content and intelligence contained within these signals can be used to determine the existence and the nature of faults, and probable fault location(s). Results achieved to date also indicate that electromagnetic field anomalies can reveal the existence of marginally performing components that may fail prematurely or where failure is imminent.","PeriodicalId":142978,"journal":{"name":"2012 IEEE AUTOTESTCON Proceedings","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114230321","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Leveraging IVI for instrument wrapper development 利用IVI进行仪器包装开发

2012 IEEE AUTOTESTCON Proceedings Pub Date : 2012-10-22 DOI: 10.1109/AUTEST.2012.6334583

T. Lopes

引用次数: 3

Accelerated aging experiments for capacitor health monitoring and prognostics 用于电容器健康监测和预测的加速老化实验

2012 IEEE AUTOTESTCON Proceedings Pub Date : 2012-10-22 DOI: 10.1109/AUTEST.2012.6334580

Chetan S. Kulkarni, J. Celaya, G. Biswas, K. Goebel

{"title":"Accelerated aging experiments for capacitor health monitoring and prognostics","authors":"Chetan S. Kulkarni, J. Celaya, G. Biswas, K. Goebel","doi":"10.1109/AUTEST.2012.6334580","DOIUrl":"https://doi.org/10.1109/AUTEST.2012.6334580","url":null,"abstract":"This paper discusses experimental setups for health monitoring and prognostics of electrolytic capacitors under nominal operation and accelerated aging conditions. Electrolytic capacitors have higher failure rates than other components in electronic systems like power drives, power converters etc. Our current work focuses on developing first-principles-based degradation models for electrolytic capacitors under varying electrical and thermal stress conditions. Prognostics and health management for electronic systems aims to predict the onset of faults, study causes for system degradation, and accurately compute remaining useful life. Accelerated life test methods are often used in prognostics research as a way to model multiple causes and assess the effects of the degradation process through time. It also allows for the identification and study of different failure mechanisms and their relationships under different operating conditions. Experiments are designed for aging of the capacitors such that the degradation pattern induced by the aging can be monitored and analyzed. Experimental setups and data collection methods are presented to demonstrate this approach.","PeriodicalId":142978,"journal":{"name":"2012 IEEE AUTOTESTCON Proceedings","volume":"81 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123383181","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 34

Preparing for an IPv6 world with LXI instruments 准备IPv6世界与LXI仪器

2012 IEEE AUTOTESTCON Proceedings Pub Date : 2012-10-22 DOI: 10.1109/AUTEST.2012.6334579

T. Fay

{"title":"Preparing for an IPv6 world with LXI instruments","authors":"T. Fay","doi":"10.1109/AUTEST.2012.6334579","DOIUrl":"https://doi.org/10.1109/AUTEST.2012.6334579","url":null,"abstract":"IPv6 has been an evolving, relatively mature, but poorly-adopted internet protocol standard for a number of years. The original motivation for IPv6 was to work around exhausting the IPv4 address space used by the original internet protocol. Already, the last large free blocks of IPv4 addresses have been allocated to particular geographic regions for them to sub-allocate within their regions. In many regions of the world, IPv6 addresses will soon become the only addresses available for remote access to new devices, including remote access to instruments supporting LAN control connections. IPv6 brings advantages of its own, as well. Stateless address autoconfiguration (SLAAC) makes it easier to set up IPv6 devices with stable global and local IPv6 addresses with nothing but IPv6-enabled routers, which are becoming much more common. Coupled with LXI-supported zero configuration hostnames via mDNS, that reduces the administration required to set up LAN-based instruments in a test system. In practical terms, IPv4 will continue to see wide use, so LXI instruments will maintain support for IPv4 while adding support for IPv6. Most LAN-based instruments are used only on the local subnet, which can continue to use and re-use the local DHCPsupplied IPv4 addresses for instruments. It is only when subnets become IPv6-only or when instrument connections must be made over the WAN that IPv6 becomes more important. This paper describes key aspects of IPv6 as they relate to instrument control and how the LXI Consortium has adopted a new LXI IPv6 standard to make observing and controlling LXI instruments over IPv6 easy. Among the IPv6 aspects covered are real-world experiences setting up IPv6 access to instruments with existing networking infrastructure.","PeriodicalId":142978,"journal":{"name":"2012 IEEE AUTOTESTCON Proceedings","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131500470","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Enhancing vibration analysis by embedded sensor data validation technologies 通过嵌入式传感器数据验证技术增强振动分析

2012 IEEE AUTOTESTCON Proceedings Pub Date : 2012-10-22 DOI: 10.1109/AUTEST.2012.6334522

F. J. Maldonado, S. Oonk, T. Politopoulos

{"title":"Enhancing vibration analysis by embedded sensor data validation technologies","authors":"F. J. Maldonado, S. Oonk, T. Politopoulos","doi":"10.1109/AUTEST.2012.6334522","DOIUrl":"https://doi.org/10.1109/AUTEST.2012.6334522","url":null,"abstract":"This paper discusses a Structural Health Monitoring framework developed for aircraft airframes, where the objective is high performance vibration-based diagnostics using validated data from low power and miniaturized smart sensors. Although considerable research has been devoted to the structural health monitoring discipline, successful field implementations have not been widely achieved. This research presents a new embedded solution by integrating several state-of-the-art technologies. The system architecture is divided into two levels, with the low level built on embedded smart sensors capable of: self-diagnostics; high performance data acquisition; advanced vibration analysis; embedded admittance measurements; elastic wave generation; and wireless communications. A key capability is sensor data validation using an electromechanical impedance method, where failures in piezoelectric transducer elements as well as damage to the host structure are detected. Then, at the next level is a computation system hosting a graphical user interface with visualization methods, a feature extraction toolset, and advanced artificial neural network diagnostics. The overall goal of this research effort was to develop a system architecture with smart sensors and intelligent processing to be deployed in aircraft for the detection and isolation of global and incipient failures.","PeriodicalId":142978,"journal":{"name":"2012 IEEE AUTOTESTCON Proceedings","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126843145","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Soft error detection via double execution with hardware assistance 软错误检测通过双执行与硬件协助

2012 IEEE AUTOTESTCON Proceedings Pub Date : 2012-10-22 DOI: 10.1109/AUTEST.2012.6334568

L. Bustamante, H. Al-Asaad

引用次数: 7