{"title":"利用IVI进行仪器包装开发","authors":"T. Lopes","doi":"10.1109/AUTEST.2012.6334583","DOIUrl":null,"url":null,"abstract":"Most Automatic Test System environments create an abstraction layer that sits between the test program and the instruments drivers, a wrapper. This paper provides an overview of existing wrapper implementations, describes the benefits of abstraction layers, primarily to facilitate instrument replacement, and explores using the architecture defined by IVI to implement wrappers. Use of both existing IVI classes and new custom classes are discussed.","PeriodicalId":142978,"journal":{"name":"2012 IEEE AUTOTESTCON Proceedings","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Leveraging IVI for instrument wrapper development\",\"authors\":\"T. Lopes\",\"doi\":\"10.1109/AUTEST.2012.6334583\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Most Automatic Test System environments create an abstraction layer that sits between the test program and the instruments drivers, a wrapper. This paper provides an overview of existing wrapper implementations, describes the benefits of abstraction layers, primarily to facilitate instrument replacement, and explores using the architecture defined by IVI to implement wrappers. Use of both existing IVI classes and new custom classes are discussed.\",\"PeriodicalId\":142978,\"journal\":{\"name\":\"2012 IEEE AUTOTESTCON Proceedings\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-10-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE AUTOTESTCON Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2012.6334583\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE AUTOTESTCON Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2012.6334583","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Most Automatic Test System environments create an abstraction layer that sits between the test program and the instruments drivers, a wrapper. This paper provides an overview of existing wrapper implementations, describes the benefits of abstraction layers, primarily to facilitate instrument replacement, and explores using the architecture defined by IVI to implement wrappers. Use of both existing IVI classes and new custom classes are discussed.
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