Life cycle planning from product development to long term sustainment

J. Harnack
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Abstract

One of the major challenges engineers face when developing military test systems is balancing the life cycle mismatch of test equipment that's commonly deployed for 20+ years with the shorter life cycle of commercial-off-the-shelf (COTS) components often used in those systems. To ensure long term supportability of these systems, it is important to plan for obsolescence issues starting in the product development phase and continuing through the sustaining state to end of life. Successful long term support of test systems requires careful up-front planning, a proper system architecture, and a comprehensive long term life cycle management plan. Software is becoming increasingly more important in long term sustainment as it continues to define more and more of the test system functionality. A key software architecture for mitigating the impact of obsolescence is the implementation of hardware abstraction layers (HALs). A modular software architecture, such as a HAL, is an important proactive component of a life cycle management plan that also includes traditional hardware life cycle management strategies such as sparing, obsolescence tracking and planned technology refreshes. This paper examines some of the techniques used to manage test system obsolescence through HALs and hardware life cycle management.
从产品开发到长期维护的生命周期规划
在开发军用测试系统时,工程师面临的主要挑战之一是平衡测试设备的生命周期不匹配,这些设备通常部署20年以上,而这些系统中通常使用的商用现货(COTS)组件的生命周期较短。为了确保这些系统的长期可支持性,重要的是要计划从产品开发阶段开始并持续到生命周期结束的过时问题。成功的测试系统的长期支持需要仔细的前期计划、适当的系统架构和全面的长期生命周期管理计划。软件在长期维护中变得越来越重要,因为它继续定义越来越多的测试系统功能。减轻过时影响的关键软件体系结构是硬件抽象层(hal)的实现。模块化软件体系结构(如HAL)是生命周期管理计划的重要组成部分,该计划还包括传统的硬件生命周期管理策略,如节约、过时跟踪和计划中的技术更新。本文研究了通过hal和硬件生命周期管理来管理测试系统过时的一些技术。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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