2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel最新文献_第6页

On Extrinsic Information of Good Codes Operating Over Memoryless Channels with Incremental Noisiness 基于增量噪声的无记忆信道上运行良好码的外部信息

2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel Pub Date : 2006-11-01 DOI: 10.1109/EEEI.2006.321086

M. Peleg, A. Sanderovich, S. Shamai

{"title":"On Extrinsic Information of Good Codes Operating Over Memoryless Channels with Incremental Noisiness","authors":"M. Peleg, A. Sanderovich, S. Shamai","doi":"10.1109/EEEI.2006.321086","DOIUrl":"https://doi.org/10.1109/EEEI.2006.321086","url":null,"abstract":"We show that the Extrinsic Information about the coded bits of any good (capacity achieving) code operating over a binary symmetric channel is zero when the code operates at code rate above capacity and a positive constant otherwise, that is, the Extrinsic Information Transfer (EXIT) chart is a step function of channel quality, for any capacity achieving code. This extends similar previous results proved over the erasure channel and over the AWGN channel, indicating the step function property of the EXIT chart is rather general. It follows that, for a common class of iterative receivers where the error correcting decoder must operate at the first iterations at rate above capacity (such as in turbo equalization, turbo channel estimation, parallel and serial concatenated coding and the like), classical good codes which achieve capacity over the relevant channels are not effective and should be replaced by different new ones. The authors are with the Department of Electrical Engineering, Technion¿Israel Institute of Technology, 32000 Haifa, Israel. M. Peleg is also with Rafael ltd. The work was supported by the US-Israel Binational Science Foundation (BSF).","PeriodicalId":142814,"journal":{"name":"2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131192604","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Using Mobile Base Stations to Improve Network Performance in Densely Populated Areas 利用移动基站改善人口密集地区的网络性能

2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel Pub Date : 2006-11-01 DOI: 10.1109/EEEI.2006.321122

M. Zaslavsky, A. Freedman

引用次数: 6

Blind Source Separation for MIMO-AR Mixtures Using GMM 基于GMM的MIMO-AR混合盲源分离

2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel Pub Date : 2006-11-01 DOI: 10.1109/EEEI.2006.321090

T. Routtenberg, J. Tabrikian

引用次数: 1

Dynamic Test Composition In Hierarchical Software Testing 分层软件测试中的动态测试组成

2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel Pub Date : 2006-11-01 DOI: 10.1109/EEEI.2006.321078

B. Bergelson, I. Exman

引用次数: 4

Investigation of Transactional Memory Using FPGAs 基于fpga的事务性内存研究

2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel Pub Date : 2006-11-01 DOI: 10.1109/EEEI.2006.321125

S. Grinberg, S. Weiss

引用次数: 13

Reliability Analysis of Two Protection System Configurations for High Voltage Transmission Lines 高压输电线路两种保护系统配置的可靠性分析

2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel Pub Date : 2006-11-01 DOI: 10.1109/EEEI.2006.321059

A. Lisnianski, D. Laredo, H. Ben Haim

{"title":"Reliability Analysis of Two Protection System Configurations for High Voltage Transmission Lines","authors":"A. Lisnianski, D. Laredo, H. Ben Haim","doi":"10.1109/EEEI.2006.321059","DOIUrl":"https://doi.org/10.1109/EEEI.2006.321059","url":null,"abstract":"Protection systems play a crucial role in power systems. The increasing demand for electric power leads to the complexity of the network and, therefore, to an increasing search for the improvement of the reliability of the high voltage (161 kV and over) line system protections. In order to achieve the required reliability level, the redundancy technique is often used. Two alternatives of redundancy are usually used. The first one is the use of two distance-protections connected in parallel, named as configuration {z, z}, and the second one is the use of one distance-protection and a differential-protection connected in parallel, named as configuration {z, Delta} . These two configurations are compared, in the paper, based on their calculated reliability. The comparison was made using new developed Markov stochastic models. Based on these models, the CIGRE reliability index for protection systems was computed for each configuration. It was shown that the configuration {z, z} is more reliable than the configuration {z, Delta} . Therefore, for high voltage line protection, where redundancy is required, it is recommended to use the configuration {z, z}.","PeriodicalId":142814,"journal":{"name":"2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130931660","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Analysis and fabrication of sub micron scale directional coupler in high-index Silicon-On-Insulator 高折射率绝缘体上硅亚微米级定向耦合器的分析与制作

2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel Pub Date : 2006-11-01 DOI: 10.1109/EEEI.2006.321085

Ido E. Dotan, D. Goldring, D. Mendlovic

引用次数: 1

Measuring Behavioral Software Design Patterns 测量行为软件设计模式

2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel Pub Date : 2006-11-01 DOI: 10.1109/EEEI.2006.321116

Marat Teplitsky, I. Exman

引用次数: 3

New design method for one-dimensional photonic crystal reflectors in strip waveguides 条形波导中一维光子晶体反射器的新设计方法

2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel Pub Date : 2006-11-01 DOI: 10.1109/EEEI.2006.321114

D. Goldring, D. Mendlovic

引用次数: 1

A Novel Optical OOK Multiple Access Method by Self-Heterodyne Filtering for FTTx Communication Network 一种FTTx通信网自外差滤波光OOK多址新方法

2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel Pub Date : 2006-11-01 DOI: 10.1109/EEEI.2006.321132

H. Joseph, D. Sadot

引用次数: 0