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2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel最新文献

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Competitive Minimax Universal Decoding for Several Ensembles of Random Codes 几种随机码集成的竞争极大极小通用译码
2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel Pub Date : 2006-11-01 DOI: 10.1109/EEEI.2006.321148
Yaniv Akirav, N. Merhav
{"title":"Competitive Minimax Universal Decoding for Several Ensembles of Random Codes","authors":"Yaniv Akirav, N. Merhav","doi":"10.1109/EEEI.2006.321148","DOIUrl":"https://doi.org/10.1109/EEEI.2006.321148","url":null,"abstract":"Universally achievable error exponents pertaining to certain families of channels (most notably, discrete memoryless channels (DMCs)), and various ensembles of random codes, are studied by combining the competitive minimax approach, proposed by Feder and Merhav, and Gallager's techniques for the analysis of error exponents. In particular, we derive a single¿letter expression for a lower bound to the largest, universally achievable fraction ¿ of the optimum error exponent pertaining to the optimum ML decoding. To demonstrate the tightness of this lower bound, we show that ¿ = 1, for the binary symmetric channel (BSC), when the random coding distribution is uniform over: (i) all codes (of a given rate), and (ii) all linear codes, in agreement with well¿known results. We also show that ¿ = 1 for the uniform ensemble of systematic linear codes, and for that of time¿varying convolutional codes in the bit-error¿rate sense. For the latter case, we also show how the corresponding universal decoder can be efficiently implemented using a slightly modified version of the Viterbi algorithm which employs two trellises.","PeriodicalId":142814,"journal":{"name":"2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131797838","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
How to Manage the Degree of Impulsiveness of Other Cell Interference 如何管理其他手机干扰的冲动程度
2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel Pub Date : 2006-11-01 DOI: 10.1109/EEEI.2006.321111
M. Gariby, T. Gariby, R. Zamir
{"title":"How to Manage the Degree of Impulsiveness of Other Cell Interference","authors":"M. Gariby, T. Gariby, R. Zamir","doi":"10.1109/EEEI.2006.321111","DOIUrl":"https://doi.org/10.1109/EEEI.2006.321111","url":null,"abstract":"We develop mechanisms for reducing the effect of interference between users by means of controlling the degree of impulsiveness of their interference signals. Our analysis assumes spread-spectrum multiple-access, and in particular ternary CDMA signaling, whose interference statistics can be parameterized while keeping the desired de-spread signal fixed. We find the spreading patterns of the interferer and user which minimize the bit error rate (BER) at the user, as a function of the signal-to-interference signal-to-noise ratio matrix. The results are shown numerically, and in some extreme cases are supported by theoretic analysis. Finally we propose distributed protocols which try to approach the optimal operation points (i.e., pairs of spreading patterns) in the lack of central coordination.","PeriodicalId":142814,"journal":{"name":"2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127952852","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Prediction of Insulator Flashover Based on Leakage Current and Humidity Measurements 基于泄漏电流和湿度测量的绝缘子闪络预测
2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel Pub Date : 2006-11-01 DOI: 10.1109/EEEI.2006.321067
Erez Natan, R. Munteanu, R. Rabinovici
{"title":"Prediction of Insulator Flashover Based on Leakage Current and Humidity Measurements","authors":"Erez Natan, R. Munteanu, R. Rabinovici","doi":"10.1109/EEEI.2006.321067","DOIUrl":"https://doi.org/10.1109/EEEI.2006.321067","url":null,"abstract":"A procedure for prediction of flashover on ceramic insulators based on leakage currents and environmental humidity measurements is presented. A new approach, which takes into account the connection between leakage currents and humidity, for prediction of flashover is presented. The analysis of the leakage current peaks and humidity measurements on the insulator surface for long and different periods of time suggest that as the flashover would be closer, the mean leakage current peak would be higher. Based on this assumption, a new real time process uses a fuzzy logic method to combine humidity and leakage current peak measurements to produce a severity scale. Experimental results are presented.","PeriodicalId":142814,"journal":{"name":"2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116665878","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Self-Oscillating Constant-Current Fluorescent Lamp Driver 自振荡恒流荧光灯驱动器
2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel Pub Date : 2006-11-01 DOI: 10.1109/EEEI.2006.321077
S. Ben-Yaakov, M. Peretz, J. M. Parra
{"title":"Self-Oscillating Constant-Current Fluorescent Lamp Driver","authors":"S. Ben-Yaakov, M. Peretz, J. M. Parra","doi":"10.1109/EEEI.2006.321077","DOIUrl":"https://doi.org/10.1109/EEEI.2006.321077","url":null,"abstract":"A high frequency AC current-sourcing driver that can feed electrical loads with a constant current that is independent of the load resistance is presented, analyzed and tested experimentally. The power source is a self-oscillating inverter that includes a resonant network and a Current Comparing and Toggling Circuit (CCTC) that is used to generate the control signals of the inverter's power switches. The power driver can be used to ignite and operate one or several serially connected fluorescent lamps, without the need of additional resonant networks and redesign of the power stage, while still maintaining high efficiency and low output crest factor. The CCTC is realized, in present work, by a multi-winding transformer that is designed to change the polarity of the gate drive of the power switches whenever the input signal drops to the level of the desired output current and hence, will cause the driver to behave as a current source.","PeriodicalId":142814,"journal":{"name":"2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117021951","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Generalized Nyquist Criterion and Generalized Bode Diagram for Analysis and Synthesis of Uncertain Control Systems 不确定控制系统分析与综合的广义Nyquist准则与广义Bode图
2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel Pub Date : 2006-11-01 DOI: 10.1109/EEEI.2006.321065
Arie Nakhmani, M. Lichtsinder, E. Zeheb
{"title":"Generalized Nyquist Criterion and Generalized Bode Diagram for Analysis and Synthesis of Uncertain Control Systems","authors":"Arie Nakhmani, M. Lichtsinder, E. Zeheb","doi":"10.1109/EEEI.2006.321065","DOIUrl":"https://doi.org/10.1109/EEEI.2006.321065","url":null,"abstract":"Uncertainties in control systems models often have to be taken into account in their analysis and/or design. Negligence of such uncertainties is often unjustifiable and is done only due to lack of methods to treat the uncertainties. The presented work is concerned with analysis and design of interval uncertainty control systems, with regard to clustering of poles inside a simple symmetric bounded contour ¿. We extend the well known Nyquist and Mikhailov stability theorems to ¿ - stability tests of uncertain systems, defined by their generalized Bode envelopes. Also, using generalized definitions and theorems we solve the design problem of a controller which ensures clustering of closed loop poles of an interval uncertain family of transfer functions inside such prescribed ¿ -region.","PeriodicalId":142814,"journal":{"name":"2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126395008","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Detection of Anomalies in Textures Based on Multi-Resolution Features 基于多分辨率特征的纹理异常检测
2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel Pub Date : 2006-11-01 DOI: 10.1109/EEEI.2006.321102
Lior Shadhan, I. Cohen
{"title":"Detection of Anomalies in Textures Based on Multi-Resolution Features","authors":"Lior Shadhan, I. Cohen","doi":"10.1109/EEEI.2006.321102","DOIUrl":"https://doi.org/10.1109/EEEI.2006.321102","url":null,"abstract":"Multi-resolution decompositions, such as the wavelet transform, are often employed in anomaly detection algorithms for feature extraction. However, the extracted features may be unreliable for anomaly detection in textures due to inconsistencies between the assumed background model and the true data. In this paper, we present an anomaly detection scheme which relies on a statistical model of textures and is specifically designed for detection of anomalies in textures. Motivated by recent works on texture segmentation and texture classification, we introduce a multi-resolution feature space that facilitates anomaly detection with constant false alarm rate for a wide range of textures. Experimental results demonstrate that the proposed algorithm, when applied to images containing background texture, achieves improved detection results and lower false alarm rate than a competitive anomaly detection scheme.","PeriodicalId":142814,"journal":{"name":"2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121864210","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Charge Loss Mechanisms in a Localized Trapping Based Nonvolatile Memory Device 基于局域捕获的非易失性存储器件中的电荷损失机制
2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel Pub Date : 2006-11-01 DOI: 10.1109/EEEI.2006.321104
Y. Shur, Y. Shacham-Diamand, E. Lusky, B. Eitair, A. Shappir
{"title":"Charge Loss Mechanisms in a Localized Trapping Based Nonvolatile Memory Device","authors":"Y. Shur, Y. Shacham-Diamand, E. Lusky, B. Eitair, A. Shappir","doi":"10.1109/EEEI.2006.321104","DOIUrl":"https://doi.org/10.1109/EEEI.2006.321104","url":null,"abstract":"In this work, quantification of the theories and models attributed to the NROM cell Vt decay and the dominant charge loss mechanism dictating this phenomenon are discussed. The main objective is to determine whether the transport of the localized trapped charge is mainly lateral within the nitride layer or vertical back to the silicon substrate. Electrical characterizations and analytic modeling are employed for comparison of theories.","PeriodicalId":142814,"journal":{"name":"2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133107681","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Anomaly Gas Remote Sensing and Tracking Using a Field-Portable Imaging Thermal Radiometric Spectrometer 野外便携式成像热辐射光谱仪的异常气体遥感与跟踪
2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel Pub Date : 2006-09-28 DOI: 10.1117/12.687021
E. Ohel, S. Rotman, D. Blumberg, L. Sagiv
{"title":"Anomaly Gas Remote Sensing and Tracking Using a Field-Portable Imaging Thermal Radiometric Spectrometer","authors":"E. Ohel, S. Rotman, D. Blumberg, L. Sagiv","doi":"10.1117/12.687021","DOIUrl":"https://doi.org/10.1117/12.687021","url":null,"abstract":"Using a set of radiometric thermal hyperspectral data cubes, we developed an algorithm which detects the formation of an anomalous gas cloud. Once we've established the presence of the cloud in the latter images, we determine the origin of the cloud in the earlier ones and track its propagation. Gas usually expands from point sources and it is difficult to know whether it is significant when it occupies merely a few pixels in the image. After the gas size expands, it is easier to analyze as an interesting anomalous feature. Our algorithm includes techniques such as the improved K-Means classification, Spectral Angle Mapper (SAM), match filter and tracking; in the paper we will show results based on real data taken by the \"FIRST\" camera (Field-portable Imaging Radiometric Spectrometer Technology).","PeriodicalId":142814,"journal":{"name":"2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-09-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116024657","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Coding for Parallel Channels: Gallager Bounds and Applications to Repeat-Accumulate Codes 并行信道的编码:加拉格边界和重复累加码的应用
2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel Pub Date : 2006-09-17 DOI: 10.1109/EEEI.2006.321095
I. Sason, I. Goldenberg
{"title":"Coding for Parallel Channels: Gallager Bounds and Applications to Repeat-Accumulate Codes","authors":"I. Sason, I. Goldenberg","doi":"10.1109/EEEI.2006.321095","DOIUrl":"https://doi.org/10.1109/EEEI.2006.321095","url":null,"abstract":"This paper is focused on the performance analysis of binary linear block codes (or ensembles) whose transmission takes place over independent and memoryless parallel channels. New upper bounds on the maximum-likelihood (ML) decoding error probability are derived. The framework of the second version of the Duman and Salehi (DS2) bounds is generalized to the case of parallel channels, along with the derivation of optimized tilting measures. The connection between the generalized DS2 and the 1961 Gallager bounds, known previously for a single channel, is revisited for the case of parallel channels. The new bounds are used to obtain improved inner bounds on the attainable channel regions under ML decoding. These improved bounds are applied to ensembles of turbo-like codes, focusing on repeat-accumulate codes and their recent variations.","PeriodicalId":142814,"journal":{"name":"2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel","volume":"100 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127826207","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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