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Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)最新文献

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Amplitude-only vs. complex field measurements for mobile terminal antennas with a small number of measurement locations 仅振幅与具有少量测量位置的移动终端天线的复杂场测量
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1207894
T. Laitinen, P. Vainikainen, T. Koskinen, O. Kivekas
{"title":"Amplitude-only vs. complex field measurements for mobile terminal antennas with a small number of measurement locations","authors":"T. Laitinen, P. Vainikainen, T. Koskinen, O. Kivekas","doi":"10.1109/IMTC.2003.1207894","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1207894","url":null,"abstract":"Amplitude-only and complex field measurements for characterizing 3D radiated fields of mobile phones with a small number of measurement locations by applying field expansion methods are examined. The uncertainties of the determination of the total radiated power and the radiation pattern are compared. Examination is carried out by computer simulations for several models of mobile phones beside a head phantom. The results provide guidelines for choosing a reasonable number of measurement locations for amplitude-only and complex field characterization. The results also show that complex field measurements provide lower uncertainty of the determination of the radiation pattern of a mobile terminal antenna beside a head phantom compared to amplitude-only measurement, when the number of measurement locations is relatively small.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116511578","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
A wavelet-based multi-sensor data fusion algorithm 一种基于小波的多传感器数据融合算法
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208199
Lijun Xu, Jian Qiu Zhane, Yong Yan
{"title":"A wavelet-based multi-sensor data fusion algorithm","authors":"Lijun Xu, Jian Qiu Zhane, Yong Yan","doi":"10.1109/IMTC.2003.1208199","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208199","url":null,"abstract":"Absfrnd - This paper presents a wavelef transform-based data fusion algorithm for multi-sensor systems. Wfh fhis algorithm fhe optimum estimafe of a measurand can be obtained in terms of Minimum Mean Square Error. The variance of the optimum esfimate is not only smaller than that of each observalion sequence but also smaller than the arifhmefic average estimate. To implement this algorithm, fhe variance of each observalion sequence is estimafed using wavelef tronsform and fhe optimum weighfing factor to each observation is obtained accordingly. Since fhe variance of each observation sequence is esfimafed only from ifs most recent dafa of a predefermined lengfh, the algorithm is sew-adaptive. This algorithm is applicable to both stafic and dynamk sysfems including timeinvariant and lime-variant processes. The effeciiveness of the algorifhm is denwnsfraled using apiecewise-smoofh signal and a time-varyingflow signol.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128119318","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Non-invasive ultrasonic instrument for counter-terrorism and drug interdiction operations - the acoustic inspection device (AID) 反恐怖主义和禁毒行动用无创超声仪器-声学检查装置
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1207956
Aaron A. Diaz, B. Burghard, J. Skorpik, Chester L. Shepard, Todd J. Samuel, Richard A. Pappas
{"title":"Non-invasive ultrasonic instrument for counter-terrorism and drug interdiction operations - the acoustic inspection device (AID)","authors":"Aaron A. Diaz, B. Burghard, J. Skorpik, Chester L. Shepard, Todd J. Samuel, Richard A. Pappas","doi":"10.1109/IMTC.2003.1207956","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1207956","url":null,"abstract":"The Pacific Northwest National Laboratory (PNNL) has developed a portable, battery-operated, handheld ultrasonic device that provides non-invasive container interrogation and material identification capabilities. The technique governing how the acoustic inspection device (AID) functions, involves measurements of ultrasonic pulses (0.1 to 5 MHz) that are launched into a container or material. The return echoes from these pulses are analyzed in terms of time-of-flight and frequency content to extract physical property measurements (the acoustic velocity and attenuation coefficient) of the material under test. The AID performs an automated analysis of the return echoes to identify the material, and detect contraband in the form of submerged packages and concealed compartments in liquid filled containers and solid-form commodities. This device utilizes a database consisting of material property measurements acquired from an automated, ultrasonic fluid characterization system called the Velocity-Attenuation Measurement System (VAMS). Both prototype technologies are discussed here. This manuscript describes the functionality, capabilities and measurement methodology of the technology as it relates to the material property measurements and homeland security applications.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"111 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132687722","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A low-cost interface to high-value resistive sensors varying over a wide range 一个低成本的接口，以高价值的电阻传感器在大范围内变化
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208252
A. Flammini, D. Marioli, A. Taroni
{"title":"A low-cost interface to high-value resistive sensors varying over a wide range","authors":"A. Flammini, D. Marioli, A. Taroni","doi":"10.1109/IMTC.2003.1208252","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208252","url":null,"abstract":"This paper presents a low-cost interface for high-value resistive sensors varying over a wide range, from k/spl Omega/ to G/spl Omega/. The proposed circuit that acts as a \"resistance to period converter\" is suitable to be interfaced to a microcontroller or a counting device. The behavior of real electronic components that produce estimation errors, is taken into account. Experimental results obtained by the realized prototype show a good resolution and repeatability.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133299180","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 50
Performance of integrated silicon infrared microspectrometers 集成硅红外微光谱仪的性能研究
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208248
S. Kong, G. de Graaf, L. Rocha, R. Wolffenbuttel
{"title":"Performance of integrated silicon infrared microspectrometers","authors":"S. Kong, G. de Graaf, L. Rocha, R. Wolffenbuttel","doi":"10.1109/IMTC.2003.1208248","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208248","url":null,"abstract":"The performance of a microspectrometer fabricated in silicon using micromachining techniques is presented. The optical system is composed of two bonded silicon wafers, which have been subjected to microelectronic process compatible micromachining to co-integrate the optical components (an aluminum based grating, an optical path in crystalline silicon and array of poly-silicon thermo-couples) with readout circuits in silicon. Design considerations, fabrication and performance are presented. Measurements confirm an IR operating range between 1 and 9 µm and a half-power spectral resolution of 0.5 µm.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"304 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132119579","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Space environment testbed (set): adaptable system for piggybacked satellite experiments 空间环境试验台(套):用于搭载卫星实验的适应性系统
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208146
K. Fowler, L. Frank, R.L. Williams
{"title":"Space environment testbed (set): adaptable system for piggybacked satellite experiments","authors":"K. Fowler, L. Frank, R.L. Williams","doi":"10.1109/IMTC.2003.1208146","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208146","url":null,"abstract":"This paper introduces the concept of a flexible, adaptable subsystem for satellites that provides a platform for space-based experiments. The subsystem, called a carrier, comprises mechanical, electrical/electronic, thermal, data, and software components. We have performed a number of tradeoff studies and recommend a general type of architecture for the carrier that will satisfy many requirements and accommodate the constraints of space-based experimentation.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134283498","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Configurable two-dimensional linear feedback shifter registers for built-in self-test 可配置的二维线性反馈移位寄存器内置自检
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1207987
C.-i.H. Chen, K. George
{"title":"Configurable two-dimensional linear feedback shifter registers for built-in self-test","authors":"C.-i.H. Chen, K. George","doi":"10.1109/IMTC.2003.1207987","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1207987","url":null,"abstract":"A configurable 2D LFSR based test generator and an automated synthesis procedure is presented. Without storage of test patterns, a 2D LFSR based test pattern generator can generate a sequence of pre-computed test patterns (detecting random-pattern-resistant faults) and followed by random patterns (detecting random-pattern-detectable). The hardware overhead is decreased considerably through configuration. The configurable 2D LFSR test generator can be adopted in two basic BIST execution options: test-per-clock (parallel BIST) and test-per-scan (serial BIST). Experimental results of test-per-clock and test-per-scan BIST of benchmark circuits demonstrate the effectiveness of the proposed technique. The configurable 2D LFSR can also be adopted in chip-level and system-on-chip (SoC) BIST.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"32 11","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114033785","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
An audio-card based RF spectrum analyzer for educational purposes 一个基于音频卡的射频频谱分析仪，用于教育目的
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208010
A. Carullo, F. Ferraris, M. Parvis, A. Vallan
{"title":"An audio-card based RF spectrum analyzer for educational purposes","authors":"A. Carullo, F. Ferraris, M. Parvis, A. Vallan","doi":"10.1109/IMTC.2003.1208010","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208010","url":null,"abstract":"In this paper, a simple RF spectrum analyzer based on a single frequency conversion is described. The analyzer is conceived to be employed as an educational tool for the electronic and measurement courses. The spectrum analyzer is composed of a board that actually performs the conversion and generates an analogue signal proportional to the spectrum and a virtual panel that takes advantage of the conversion capabilities of any PC audio-card. The complete system is a component of the Instrument Training Project (ITP), which is being developed at the Politecnico di Torino.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115192746","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
A neuro-fuzzy application for AC motor drives monitoring system 神经模糊控制在交流电机驱动监控系统中的应用
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208025
L. Cristaldi, Massimo Lazzaroni, A. Monti, F. Ponci
{"title":"A neuro-fuzzy application for AC motor drives monitoring system","authors":"L. Cristaldi, Massimo Lazzaroni, A. Monti, F. Ponci","doi":"10.1109/IMTC.2003.1208025","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208025","url":null,"abstract":"Nowadays industrial applications require suitable monitoring systems able to identify any decrement in the efficiency involving economical losses. This paper shows that the information coming from a general purpose monitoring system can be usefully exploited to realize a sensorless instrument able to monitor an ac motor drive and diagnostic tools providing useful risk coefficients. The method is based on a complex digital processing of the line signals acquired by means of a Virtual Instrument. The employed wavelet algorithms have been implemented in a Matlab environment and risk coefficients are elaborated by means of suitable neuro fuzzy algorithms.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115659567","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
3a technology based fault diagnosis and fault mining 基于3a技术的故障诊断与故障挖掘
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208149
Lei Jia, Renqing Pei, Bin Li, Guangxiao Yao
{"title":"3a technology based fault diagnosis and fault mining","authors":"Lei Jia, Renqing Pei, Bin Li, Guangxiao Yao","doi":"10.1109/IMTC.2003.1208149","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208149","url":null,"abstract":"A Condition monitor and fault diagnosis is an important research topic to improve the qualily of production Now, the traditional methods can not meet the requirement of the manufacturing. We propose 3A Technology Io improve the eflciency in the process of condition monifor and faulf diagnosis. I t include gather the data automatically, transmit the dafa aufomafically and faul! diagnosis aufomatically. We also infroduce a new notion, fault mining, which integrates fault diagnosis with Now, we often use the chip microcomputer as the frontdafa mining, a new promising fechnologv. Through the end terminal to collect the data automatically. It has unique application, we find this method is usefu.! hardware environment and specific software design. We can II.3A TECHNOLOGY","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114701905","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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