{"title":"Design and measurement of 2.5 gsps digital receiver","authors":"C.-i.H. Chen, K. George, W. McCormick, J. Tsui","doi":"10.1109/IMTC.2003.1208163","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208163","url":null,"abstract":"1ABsfrarf - A design of 2.5 GSPS digifal receiver using fhe superresolufion fechnique to improve fhe insfanfaneous dynamic range is presenfed The digifal design can cover 1 GHz bandwidfh (125 MHz - 1125 MHZ) and can correcffy process fwo simultaneous signals. This design uses a fast Fourier fransform (FFV fo obfain frequencies on two simultaneous signals. If has a beffer sensiriviry than IFM receivers because fhe FFT channelizes the input info narrower bandwidth It has fine frequency resolufion (able fo separaie two closefrequencies) and goodfrequency accuracy. The single signal, fwo signal spur free dynamic ranges, 'and two signal insfanfaneous dynamic ranges are high.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"78 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121462935","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Feature selection for defect classification in machine condition monitoring","authors":"A. Malhi, R. Gao","doi":"10.1109/IMTC.2003.1208117","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208117","url":null,"abstract":"A M As the sensitivily of various parameters to a defect condition of a machine differs, it i s imperative to devise a feature selection scheme that selects the best parameters to maximize the accuracy of the &feet classification scheme A feature selection scheme based on principal component analysis (PCA) is proposed in this paper. A methodology was developed for bearing defect classificatwn using. neural newrks. The scheme has shown to provide more accurate defect classifcation with less parameter inputs than using all parameters initially considered relevant","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116079679","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A new method of high-accuracy level-measure based on combining radar frequency-modulation and phase-discrimination","authors":"Yaqing Tu, Kaichun Ren, Du Zhang","doi":"10.1109/IMTC.2003.1207914","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1207914","url":null,"abstract":"The basic principle of frequency-modulation radar level gauge is analyzed briefly. A new method to improve the precision of radar level gauge is proposed based on combining radar frequency-modulation and phase discrimination. The method adopts frequency-modulation technique to get rough data of an unknown level, uses phase-discrimination technique to get subtle data, and then joins them together to get high accuracy composition data of the level. Effective conditions for data composition of rough data and subtle data are also discussed especially.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"519 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116259098","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Sensor fusion using Dempster-Shafer theory II: static weighting and Kalman filter-like dynamic weighting","authors":"Huadong Wu, Mel Siegel, Sevim Ablay","doi":"10.1109/IMTC.2003.1207885","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1207885","url":null,"abstract":"Context sensing for context-aware HCI challenges traditional sensor fusion methods with its requirements for (1) adaptability to a constantly changing sensor suite and (2) sensing quality commensurate with human perception. We build this paper on two IMTC2002 papers, where the Dempster-Shafer \"theory of evidence\" was shown to be a practical approach to implementing the sensor fusion system architecture. The implementation example involved fusing video and audio sensors to find and track a meeting participant's focus-of-attention. An extended Dempster-Shafer approach, incorporating weights representative of sensor precision, was newly suggested. In the present paper we examine the weighting mechanism in more detail; especially as the key point of this paper, we further extend the weighting idea by allowing the sensor-reliability-based weights to change over time. We will show that our novel idea - in a manner resembling Kalman filtering remnance effects that allow the weights to evolve in response to the evolution of dynamic factors can improve sensor fusion accuracy as well as better handle the evolving environments in which the system operates.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115270153","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Detection of, and compensation for error inducing thin layer deposits on an ultrasonic densitometer for liquids","authors":"J. V. Deventer","doi":"10.1109/IMTC.2003.1208238","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208238","url":null,"abstract":"A pulse echo ultrasonic densitometer can measure the acoustic impedance of a liquid by listening to the echo of an acoustic pulse reflected from the densitometer probe and liquid interface. The den ...","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125141400","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Analytical redundancy for sensor fault isolation and accommodation in public transportation vehicles","authors":"D. Capriglione, C. Liguori, A. Pietrosanto","doi":"10.1109/IMTC.2003.1208121","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208121","url":null,"abstract":"The paper discusses an instrument fault detection, isolation, and accommodation procedure for public transportation vehicles. After a brief introduction to the topic, the rule set implementing the procedure with reference to the kinds of sensors usually installed on public transportation vehicles is widely discussed. Particular attention is paid to the description of the rules aimed at allowing the vehicle to continue working regularly even after a sensor fault develops. Finally, both the estimated diagnostic and dynamic performances in the off-line processing of the data acquired in several drive tests are then analyzed and commented upon.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125335900","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Identification method of error sources of A/D measuring chain","authors":"J. Jakubiec, K. Kanopka","doi":"10.1109/IMTC.2003.1208031","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208031","url":null,"abstract":"Measurement data in modern measuring instruments and systems is obtained using a chain which typically consists of an instrumentation amplifier, sample-and-hold circuit and an analog-to-digital converter. These elements introduce errors which influence uncertainty of the output results. To evaluate this uncertainty one must determine an error model of the chain and distributions of particular errors. The paper describes an identification method of the A/D chain errors. The method consists in operations of two kinds. First, using a function generator, one measures the output (resultant) error distribution in selected conditions. Next, probability density functions of partial errors are determined basing on the obtained resultant error distribution and using the relationship between errors given by the error model. In order to verify hypotheses concerning the shape of distribution, relations between uncertainties defined as parameters of error value sets are used. The method has been applied to determine selected errors of an A/D conversion card.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125628407","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Approximation of the skin effect to improve cable-fault location by tdr","authors":"D. Agrez","doi":"10.1109/IMTC.2003.1208120","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208120","url":null,"abstract":"A m The development of an dgorirhm for lhe pulse propngntion lime 10 lhefaulr on cnble nnd back lo rhe en@, faces hvo major problems which hove lo be solved: estimalion of representative poinls of Ihe reJ7ecled pulse with low sensilivily to noise and elim‘nnlion of lhe additionnl “measurement“ delay cnused by lhe skin effect. The pnper shows theprocedure of estimaling lhe slartpoint of the reflected pulse wilh the quadratic regression function. The start point hides also lhe delay caused by the skin effect, thus lhe correction, the curve of which is partly erponenlially shaped, should be subtracted from i t Non-linenrily decreases considernbly ifcompnred with the resulls wilhout correclion.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"252 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122511619","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A current conveyor design in wide bandwidth isolation amplifier","authors":"C.E. Lin, A. Hou, Kai Shun Hsu","doi":"10.1109/IMTC.2003.1207905","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1207905","url":null,"abstract":"In this paper, the dual-channel optocoupler and current conveyors are employed to achieve the wide bandwidth isolation amplifier. The high gain feedback technique and pole-zero compensation are applied to overcome the inherent nonlinear characteristics of optocouplers and to obtain a good transient response. Its bandwidth is up to 563 kHz and the output response exhibits linear transfer characteristics. The mathematical model of proposed isolation amplifier is proposed. The dynamic responses and static characteristics are also demonstrated with experimental results.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131405474","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Measurement of four terminal-pair impedances by means of a sine-fit based technique","authors":"A. Carullo, M. Parvis, A. Vallan","doi":"10.1109/IMTC.2003.1208194","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208194","url":null,"abstract":"This paper deals with an impedance measuring system that can be arranged by means of general purpose instruments usually available in most calibration laboratories, without requiring dedicated and costly devices. Impedance measurements are performed by employing a comparison technique and taking advantage of a sine-fit processing to make negligible the effect of noise and signal distortion on the obtained results. The system have been specialized for the measurement of impedances defined as four terminal-pair networks, therefore a suitable technique has been implemented in order to compensate for the voltages at the impedance low-potential ports. Both measuring and compensation processes are automatically managed by means of a personal computer, thus giving the possibility to remotely exercise the calibration of impedance standards through the Internet. Preliminary results are described in the paper, which have shown the functionality of the whole system. The expected measurement uncertainty is respectively of 0.05% and of 0.04° for amplitude and phase of the measured impedance in the frequency range of 40 Hz to 10 kHz.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130189259","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}