{"title":"液体超声密度计上引起误差的薄层沉积物的检测和补偿","authors":"J. V. Deventer","doi":"10.1109/IMTC.2003.1208238","DOIUrl":null,"url":null,"abstract":"A pulse echo ultrasonic densitometer can measure the acoustic impedance of a liquid by listening to the echo of an acoustic pulse reflected from the densitometer probe and liquid interface. The den ...","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Detection of, and compensation for error inducing thin layer deposits on an ultrasonic densitometer for liquids\",\"authors\":\"J. V. Deventer\",\"doi\":\"10.1109/IMTC.2003.1208238\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A pulse echo ultrasonic densitometer can measure the acoustic impedance of a liquid by listening to the echo of an acoustic pulse reflected from the densitometer probe and liquid interface. The den ...\",\"PeriodicalId\":135321,\"journal\":{\"name\":\"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-05-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.2003.1208238\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.2003.1208238","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Detection of, and compensation for error inducing thin layer deposits on an ultrasonic densitometer for liquids
A pulse echo ultrasonic densitometer can measure the acoustic impedance of a liquid by listening to the echo of an acoustic pulse reflected from the densitometer probe and liquid interface. The den ...