Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)最新文献

{"title":"A robust and compact recorder system for Ocean Bottom Seismometers","authors":"S. Shariat Panahi, A. Mànuel, J. del Río, S. Ventosa, M. Papis, H. Torruella, G. Olivar, A. Bermudez, R. González, J. Dañobeitia","doi":"10.1109/IMTC.2003.1207985","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1207985","url":null,"abstract":"We are involved in a new and small development of an ocean bottom seismometer OBS. The equipment represents the achievement of a joint work from different scientific and technological disciplines as electronics, mechanics, acoustics, communications, information technology, marine geophysics, etc. This easy to handle and sophisticated equipment allows to record useful active and passive seismicity information, as well as other wave front, with multiple applications to the marine environment research. We are in the second series prototype hopping to improve many of the aspects that keep the equipment easy to handle and useful to work at deep-water areas.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129815390","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Evaluation of measurement uncertainties in conducted emissions by adjustable speed electrical power drives systems","authors":"G. Betta, D. Capriglione, Giuseppe Tomasso","doi":"10.1109/IMTC.2003.1207949","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1207949","url":null,"abstract":"The evaluation of the uncertainties involved in the measurement of conducted emissions by adjustable speed drive was dealt with. Besides the measurement uncertainty due to the all components of the measurement chain, the uncertainty contribution due to nonrepeatability and the additional one that may arise from configuration set-up and working conditions were investigated. Following the test arrangements suggested by EMC standards, the effects of the reciprocal position of power and motor cables, of the motor cable length, and of the PWM switching frequency used in the test were analyzed in detail and quantified.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131039659","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Numerical analysis of a coaxial line terminated with a complex gap capacitance","authors":"J. Obrzut, A. Anopchenko","doi":"10.1109/IMTC.2003.1207918","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1207918","url":null,"abstract":"A full wave numerical analysis was performed for a coaxial line terminated by a complex gap capacitance. The scattering parameters, input impedance and the spatial distribution of the electromagnetic field have been obtained in the frequency range of 100 MHz to 20 GHz for specimens 8 /spl mu/m to 320 /spl mu/m thick, with a dielectric constant of up to 70. It was found that the impedance characteristic of the network is affected by the LC resonance coupled with the cavity resonance. Embedding in the network an inductive component, such as section of the coaxial transmission line, allows one to decouple these two resonant behaviors. The specimen inductance is linearly dependent on the specimen thickness. At frequencies near the cavity resonance, the specimen section can be treated as a network of a transmission line with capacitance, where the fundamental mode propagates along the diameter of the specimen. The results are useful in improving accuracy of broadband dielectric measurements in extended frequency range of thin films with high dielectric constant that are of interest to bio- and nano-technology.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131048798","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Unconventional non-intrusive measurement and modeling of millimeter-wave devices","authors":"V. Niculae, V. Teppati, U. Pisani","doi":"10.1109/IMTC.2003.1207953","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1207953","url":null,"abstract":"A fast, non-intrusive and low-cost methodology for characterizing and modeling planar devices with applications at millimeter-wave frequencies is investigated in this paper. The characterization process at such frequencies asks for the implementation of the real calibration standards models in the calibration algorithm. The influence of several parameters that appear in the characterization process has been analyzed for frequencies up to 36 GHz. An example of a Schottky diode characterization and modeling at microwave frequencies with further possible applications at millimeter-wave frequencies underlines the good accuracy level provided by the proposed methodology.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125669405","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Measurement, calibration and pre-processing of signals for single-ended subscriber line identification","authors":"P. Boets, T. Bostoen, L. van Biesen, T. Pollet","doi":"10.1109/IMTC.2003.1208177","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208177","url":null,"abstract":"A measurement set-up is proposed to measure the one- port scattering parameter of a subscriber line at the Central Office. The measurements are performed in the time domain using periodic multi-sine signals. A pre-processing algorithm will deliver the impulse response of the one-port scattering parameter. It will de-noise and de-alias the impulse response and search for the first significant reflection. It will be shown that the processed impulse response of the one-port scattering parameter reveals the most important signal features, which would otherwise remain undetectable using classic time domain reflectometry. I. INTRODUCTION It is known that a number of channel impairments complicate the deployment of Discrete Subscriber Line services, i.e. the line attenuation, bridged taps (stubs), different wire gauges are used in one loop, crosstalk noise and RF-ingress etc. These channel impairments can cause a communication link to malfunction. Nowadays, commercial available instrumentation is based on double -ended line testing. It requires two technicians at both line extremities in order to qua ntify the loop power transfer function and noise power spectral density. The determination of the subscriber line in this way is expensive and requires the cooperation of the customer itself. Recently, the focus shifted to the single-ended line testing. The idea is to perform measurements at the Central Office only and using advanced pre-processing algorithms combined with artificial intelligence techniques to come to a reasonable estimate of the channel capacity in bits/s of the subscriber line. There exist sufficiently accurate cable models (4)(5) to describe a twisted pair line, so a white box approach to predict the channel capacity is appropriate because in that way it can handle a priori knowledge and explain every feature detected in the excitation response. Due to the diversity and complexity of the measurement and the detection of features in the response of the subscriber line on a stimulus, the approach will be multidisciplinary: it includes a one -port measurement, after which the data needs pre- processing before being fed to the loop topology classification (7) and the loop identification part using the physical cable models (2). This paper will treat the measurement set-up used to qualify any subscriber loop and the further pre-processing of the data. Excitation signals will be injected in the subscriber loop and the frequency response function of the one-port scattering parameter will be determined. The obtained data will be pre -processed in order to derive a valid impulse response, which is fu rther used by the loop topology classification. It will be demonstrated that the processed impulse response of a subscriber line contains well- pronounced reflections despite its high attenuation and high dispersion.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127954649","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Selecting a multifunction data acquisition board for a computer-based measurement system","authors":"P. Packebush","doi":"10.1109/IMTC.2003.1207890","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1207890","url":null,"abstract":"Totally automated measurement systems are the norm for manufacturing test, research and any other areas where measurements are made. Measurement automation leads to extensive data sharing, inter-instrument communication, and remote measurement control. Multifunction data acquisition (DAQ) devices meet these measurement needs. Designed to meet the needs of a general-purpose measurement system leveraged with a computer, DAQ devices provide features such as analogue input, analogue output, digital input, digital output, and counter-timer functionality. This paper introduces the basics of a DAQ board and provides the reader with information on how to evaluate a DAQ product for use in a computer-based measurement system.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131737200","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Expandible high-order cascade ya modulator with constant, reduced systematic loss of resolution","authors":"F. Medeiro, R. del Río, J. M. de la Rosa, B. Pérez-Verdú, Á. Rodríguez-Vázquez","doi":"10.1109/IMTC.2003.1208157","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208157","url":null,"abstract":"A-t - An arbitrary order sigma-delta modulator cascude architecture is presented with only I-bit loss of resolution due to scaling issues, even with single-bit quantizulion. This loss is kept with a high overloading point, regardless of the order. Simulations reveol that circuit imperfections can be tolerated up to 6th order, so that 90-dB SNDR can be obtained with x16 oversampling, without multi-bit quantization.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129172804","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Detection-transmission 900 mhz electric signals using an electro-optic coherence modulator","authors":"J. Rodríguez-Asomoza, R. Rosas-Romero, S. Lobato-Larios, R. Alejos-Palomares, J.A. Navarro-Martinez, C. Gutiérrez‐Martínez, G. Trinidad-García","doi":"10.1109/IMTC.2003.1208133","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208133","url":null,"abstract":"J. Rodriguez-Asomozal, R. Rosas-Romero', S. Lobato-Lariosl, R. Alejos-Palomaresl, J.A. NavarroMartinez', C. Gutiirrez-Martinez', G. Trinidad-Garcia'. 'Departamento de Ingenieria Electrhica, Universidad de las AmBricas-Puebla (UDLA-P) Exhacienda Sta. Catarina Mirtir, 72820 Cholula, Puebla, Mexico. 21nstituto Nacional de Astofisica, Optica y Electrhica (INAOE) Apdos Postales 51 y 216 72000 Puebla, Pue. MEXICO","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126696308","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A system for thermal gravimeter conditioning","authors":"B. Andò, S. Graziani","doi":"10.1109/IMTC.2003.1208112","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208112","url":null,"abstract":"AoSflPEI - A novel system is described for the thermal control of a chamber hosting a gravimeter. The proposed system has been developed by taking into account bofh metrological, economic and power consumption constraints. Experimental data analysk shows the suitabiliry of the proposed approach to improve the thermal insulation of thegravimeter. 1. 1NTRODUCTION Several measuring systems operating in hard environment are deeply influenced by exogenous parameters [l]. This is of course the case of gravimeters working very close to active volcanic areas. A thermal conditioned chamber for gravimeters is proposed, which is based on both a multi-sensor distributed architecture and non-linear signal processing, implemented by using dedicated electronics. Thermal excursions characterized by both daily and seasonal time scales, significantly affect the behavior of continuously running gravimeters. Amplitudes of such dynamics are quite higher than signals actually correlated to gravity excursions [2-3]. Moreover, thermal gradients arise along the vertical axis of the gravimeter which greatly influence the device functioning. Strategy usually adopted for fixing this kind of problems can he classified as:","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126751905","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Adaptive online calibration in time stretched ADC arrays","authors":"Yan Han, B. Rezaei, V. Roychowdhury, B. Jalali","doi":"10.1109/IMTC.2003.1207945","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1207945","url":null,"abstract":"It has recently been shown that photonics can be a powerful tool for manipulating the timescale of electrical signals. Stretching the signal prior to digitization has been proposed as a method to increase the effective sampling rate and the input bandwidth of the ADC, and to effect a reduction in the sampling-jitter noise. Sampling rates greater than 100Gsample/s have been demonstrated with this technique. This paper analyzes the performance of Time Stretch ADC (TSADC) arrays and proposes a novel adaptive calibration technique for mitigating the interchannel mismatch errors. The technique exploits the fact that each channel in the TSADC array is sampled at or above Nyquist rate, a key feature not shared by the conventional sample-interleaved architecture.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"212 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123168249","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}