Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)最新文献

{"title":"A time-frequency field fingerprint enhancement technology and three-order spline curve fitting matching algorithm research","authors":"Yuanning Liu, Senmiao Yuan, Xiaodong Zhu","doi":"10.1109/IMTC.2003.1207916","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1207916","url":null,"abstract":"We present a fast fingerprint enhancement algorithm in the paper. In order to enhance the fingerprint images, the algorithm firstly estimate local ridge orientation and frequency of the fingerprint images and then apply an even-symmetric Gabor filter for fingerprint images, adaptively improve the clarity of the ridge and the furrow structures of input fingerprint images. At the same time, this paper gives out an algorithm which is based on three-order spline curve fitting curve of point matching, creation of some definitions and lemmas. The results indicate that the algorithm shows out excellent features in good velocity and precision.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132386002","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Thermal emittance monitoring in cooling lava process","authors":"B. Andò, M. Coltelli, N. Pitrone","doi":"10.1109/IMTC.2003.1208138","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208138","url":null,"abstract":"Absrrac, In recent years great effort were dedicated to the comprehension of phenomena connected to volcanic activities. In particular, the behaviour offlowing lava during a big eruption is of main interest in managing this kind of emergency. The very first parameters to be taken into accountfor studying thepath of the lava flow are those defining the crust properties, which are deeply dependent on the coolingprocess. In this DaDer a multi-sensorial measurement svstem is DroDosed. value in the selected area, due to the operating mode of the adopted instruments based on the sensing of radiation emitted by the whole target area. In this paper a new measurement set-up is proposed, which aims to monitor emittance values recorded on a user-defined grid of a cooling lava region. The set-up uses instruments based on radiation thermometry which produce data to be 1. 1. I which aims IO the characterization of the WUSI formation by monitoring changes of its thermalproperties. processed and stored by a virtual instrument developed in LabVIEW'. In particular a thermal camera is adopted allowing to perform measurements with the required resolution. The use of this device will improve the quality of the information in the respect of the previous experimental I. INTRODUCTION The understanding of phenomena ruling the cooling process of flowing lava in big eruptions has gained more and more interest due to the needs of suitable actions managing this kind of emergency. These actions are strictly related to the behaviour of the magma in terms of both its flow rate and its rheological characteristic, which depend on the evolution of the process regulating the crust formation. The cooling process, regulated by the beat transfer between magma and atmosphere, is assumed to be the major responsible of the solidification of external layers of lava and hence of the crust growing process. Thermal emittance is a material property regulating the heat transfer process between the material body and the surroundings. It depends on size, shape, surface roughness and angle of viewing and can be used to study the structural evolution of the analyzed material during the observed process. In the case of growing crust the emittance varies accordingly and characterizes the state evolution. Observation of the thermal emittance would allow for the estimation of the heat transfer evolution, which dictates both the formation of the crust and the behaviour of the magma. Some of the authors, in previous work, proposed a methodology for direct measurement of heat transfer in cooling lava [I]. It is based on the contemporaneous use of three different instruments to measure the temperature gradient in a lava flow close to the surface, and the temperature and thermal radiation of the lava-atmosphere interface.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"55 10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132704821","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Measurements of transient phenomena with digital oscilloscopes","authors":"A. Moschitta, F. Stefani, D. Petri","doi":"10.1109/IMTC.2003.1207970","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1207970","url":null,"abstract":"While the dynamic accuracy of an oscilloscope is usually defined in terms of its bandwidth, actually it also depends on the measured signal properties, and, for digital oscilloscopes, also on ADC performances. In this paper, the effects of sampling upon rise time measurements with a digital oscilloscope are considered. The effects of sampling are analyzed and modeled for various input step signals. In particular, a simple expression is derived, which conveniently models the sampling contribution to the overall rise time measurement error. Using these results, a correction technique is proposed to remove the interpolation error bias, and its applicability is discussed also with respect to analog error sources.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127852808","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"An intelligent FFT-analyzer with harmonic interference effect correction and uncertainty evaluation","authors":"C. Liguori, A. Paolillo, A. Pignotti","doi":"10.1109/IMTC.2003.1207900","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1207900","url":null,"abstract":"In the paper, the problem of the correction of harmonic interference effects on FFT results is discussed. A procedure for the effect evaluation and correction is proposed and implemented in an intelligent FFT-analyzer able also to provide the results with their uncertainty.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131692376","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Uncertainty propagation in the discrete-time wavelet transform","authors":"L. Peretto, R. Sasdelli, R. Tinarelli","doi":"10.1109/IMTC.2003.1207993","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1207993","url":null,"abstract":"Signal analysis based on the wavelet transform is applied in many fields. Detection and classification of electromagnetic transients in power systems is a significant application. The use of the wavelet transform for measurement purposes involves issues of uncertainty evaluation. In this paper, an analytical model for the evaluation of the uncertainty affecting the details and the approximation coefficients determined means of the discrete-time wavelet transform is proposed. The results of some experimental work showing the performance of the method are also presented and discussed.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115422768","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"The development of image processing and analysis unit for building a solderability tester","authors":"D. Sankowski, K. Strzecha","doi":"10.1109/IMTC.2003.1208113","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208113","url":null,"abstract":"Absfrcrd In this paper problems which occurs during development of image processing and anaIysis unit for hightemperafure measurement system are presented Described vision unit were built especially for computerized sysiem for measurement of solderability by means of measure of the basic measurabIe quantifies characterizing interfaciaI interactions: the surface energy (suface tension) of the liquid phase and the exlreme weftability of the base with liquid","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114772415","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Determining a confidence index of cheese ripening prediction by fuzzy trend sensory indicators","authors":"G. Mauris, N. Perrot, L. Berrah, S. Hamlaoui","doi":"10.1109/IMTC.2003.1207903","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1207903","url":null,"abstract":"In the food process, building tools taking human measurements and knowledge into account is relevant for the control of the sensory quality of food product. In this view, we propose a fuzzy linguistic model, which predicts the ripening state of a cheese from sensory measurements achieved during the ripening process lasting one month. In order to avoid carrying out damaging actions generated by erroneous predictions, a confidence index is defined by a redundancy with information issued from a fuzzy trend model of sensory indicators.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114996384","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Efficient nyquist rate pipelined quantizer reliably yielding spurious free dynamic range beyond 100 db","authors":"Zheming Li, A. Abidi","doi":"10.1109/IMTC.2003.1208274","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208274","url":null,"abstract":"Abmaa -Based on a new insight on the nonlinearity of non-ideal quantizers, a eflcient technique for improving the spurious free dynamic range (SFDR) of pipelined quantizers is develeped A Nyquist rate quantizer architecture that implements the technique to reliably achieve over 100 dB SFDR is proposed. The main advanrage of the proposed architecture over fhe known Nquist rate ADC SFDR improving fechniqaes such as dither and dynamic element match is that the proposed architecfure requires no significant modification of the underlying pipeline structure, and, therefore is capable of high speed operation. Monte Carlo simulations in MATLAB indicate that theproposed architecture can guarantee over IO0 dB SFDR performance, even in the presence of large component non-ideality.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126011191","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Balancing procedure for an IVD bridge","authors":"S. Avramov-Zamurovic, B. Waltrip, K. Stricklett, A. Koffman","doi":"10.1109/IMTC.2003.1208019","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208019","url":null,"abstract":"This paper presents a detector balancing procedure for a bridge based on the straddling method that is used to calibrate inductive voltage dividers (IVDs). A bridge of this type requires multiple, simultaneous balances, which, due to interactions between the various circuit networks involved, are difficult to achieve in practice. An algorithm will be demonstrated that achieves balances on the order of 1 part in 10/sup 9/.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124646795","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Modeling and simulation of a tdi line scan camera","authors":"Yong Feng, Xuqiang Yang, Xiaoli Chen","doi":"10.1109/IMTC.2003.1208198","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208198","url":null,"abstract":"mThis paperproposes a model of a TDI line scan camera.. The camera geometric model is deduced firstly, which gives a perspective transformation from continuous known objects to a discrete image on fhe T D I CCD line scan sensor. Then the T D I CCD line scan sensor model is addressed' I n order IO obfain the model, the T D I CCD line scan sensor is divided into fhree components, thephotodefector, the transferprocess and the output stage, which are analyzed and modeled individually. The T D I CCD line scan sensor model describing the mathematical relationship between the light illuminance input and the analog output signal is esfablished by using fhe fheories in optics and electric circuits. The model of the sensorpresented in thispaper can be used to simulate the real sensor operating at high frequency, which is useful to design and evaluafe the electronics of the camera, to develop the virtual CCD camera and to research the methods af enhancing the image qua&.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124742141","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}