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Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)最新文献

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An immunity test method using electromagnetic wave of rotating polarization 一种旋转极化电磁波抗扰度测试方法
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1207951
K. Murano, Y. Kami
{"title":"An immunity test method using electromagnetic wave of rotating polarization","authors":"K. Murano, Y. Kami","doi":"10.1109/IMTC.2003.1207951","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1207951","url":null,"abstract":"An immunity/susceptibility test method using electromagnetic waves of rotating polarization is presented. Low-rate rotation of the field polarization is controlled electrically and continuously in a two-dimensional plane, so that radiated immunity/susceptibility characteristics depicted three-dimensionally can be obtained by using a turntable together with the method. This paper describes how to generate the rotating fields, and some experimentally measured characteristics of some examples. The results show the effectiveness of the proposed method to reveal the weak/strong immunity/susceptibility directions at a glance, so that it would be advantageous for trial phase of manufactured products.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114062380","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A multichannel dsp-based dvrt instrument 基于dsp的多通道dvrt仪器
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208136
A. Flammini, D. Marioli, E. Sisinni, A. Taroni
{"title":"A multichannel dsp-based dvrt instrument","authors":"A. Flammini, D. Marioli, E. Sisinni, A. Taroni","doi":"10.1109/IMTC.2003.1208136","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208136","url":null,"abstract":"Am - This paper presents a novel instrument for the analysis of signals coming from matrix of DiJprential Variable Reluctance Transducer. The signal processing technique is based on FFT evaluation. The muin objective is compactness and, more imporlant, a short elaborafion time. In particular, information from up to I I different sensors can be simultaneously processed, supposing U measuring lime of about 300p. Experimenial resalts show a resolution in the +0.2 pm order.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121487774","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A pre-iteration method for the inverse problem in electrical impedance tomography 电阻抗层析反演问题的预迭代方法
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208187
Huaxiang Wang, Chao Wang, W. Yin
{"title":"A pre-iteration method for the inverse problem in electrical impedance tomography","authors":"Huaxiang Wang, Chao Wang, W. Yin","doi":"10.1109/IMTC.2003.1208187","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208187","url":null,"abstract":"In this paper, the relationship between Landweber iteration and the generalized inverse has been analyzed, and it is shown that Landweber iteration is, in fact, a modification of the generalized inverse that is implemented by using the iteration solution. At the same time, a new reconstruction algorithm, termed the pre-iteration method, is proposed, which splits the image reconstruction process into two steps that are the off-line pre-iteration and the on-line one-step reconstruction. The speed of image reconstruction is remarkably increased.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121560459","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 30
A novel technique for dynamic alignment of ultrasonic transducers in real-time non-destructive testing 一种实时无损检测中超声换能器动态对准的新技术
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1207931
G. Gunarathne, Y. Qureshi
{"title":"A novel technique for dynamic alignment of ultrasonic transducers in real-time non-destructive testing","authors":"G. Gunarathne, Y. Qureshi","doi":"10.1109/IMTC.2003.1207931","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1207931","url":null,"abstract":"Ultrasonic non-contact inspection methods require the correct alignment of test probes before return signals (echoes) are acquired. However, for critical remote applications, such as pipeline inspection, there are no accurate means of achieving this objective, and hence the accuracy and full potential of ultrasonic inspection is not realized. In this paper, a novel sensing technique to detect angular misalignment of a test probe with a view to ensure automatic alignment of the probe with the target is presented. The technique is based on analyzing the waveform features of the received signals. In this regard, a theoretical formulation concerning the applicability of the method is first reported, followed by a detailed practical study. The technique could be employed for automatic alignment of the test probes in remote ultrasonic inspection.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"793 ","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113994509","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Evaluation of the standard uncertainty in estimating the trend of parameters characterizing the operation of power systems 电力系统运行参数趋势估计的标准不确定度评定
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208221
L. Peretto, R. Sasdelli, R. Tinarelli, G. Luculano
{"title":"Evaluation of the standard uncertainty in estimating the trend of parameters characterizing the operation of power systems","authors":"L. Peretto, R. Sasdelli, R. Tinarelli, G. Luculano","doi":"10.1109/IMTC.2003.1208221","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208221","url":null,"abstract":"A In a previous work, the authors presented a statistical model for estimating functions that represent the trend of electrical quantities over long time intervals. The model aIIows the estimators of the above functions be determined by acquiring and processing o limited antounf of dafa The theoretical study of the sfandard uncertainry associated to the results provided by the recalled strafegy is dealt wifh in this paper. An application example is ulso reported, where both the sfatisticol model and fhe achievemenis of the present study are applied to data obfained during infield measuremenfs. The resulfs show the correcfness of the study.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126202257","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Complexity as a measure for machine fault detection and diagnosis 复杂性作为机器故障检测和诊断的度量
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208123
Ruqiang Yan, R. Gao
{"title":"Complexity as a measure for machine fault detection and diagnosis","authors":"Ruqiang Yan, R. Gao","doi":"10.1109/IMTC.2003.1208123","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208123","url":null,"abstract":"Conventional techniques used for the deteciion and diagnosis of machine defects, such as spectral analysis and timefrequency analysis, are based on the assumption that a physical sysrem possesses linear transfer functions. However, these techniques cannot truthfully identify fault features when the actual behavior of the physical system is far from linear due to the change of its operating conditions, and involves nonlineari@. This paper presents a nonlinear dynamics method called complexi@, which has been investigated to extract feature parameters from raw vibration signals measured from a bearing system. The result3 demonstrated that complexi@presents a good measure for detecting machine defects.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122244257","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
The design and implementation of a general-purpose, secure, measurement and control network incorporating Internet-based access 设计和实现一个通用的，安全的，测量和控制网络，包括基于internet的访问
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208028
J. Smit, G. Hancke
{"title":"The design and implementation of a general-purpose, secure, measurement and control network incorporating Internet-based access","authors":"J. Smit, G. Hancke","doi":"10.1109/IMTC.2003.1208028","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208028","url":null,"abstract":"Distributed measurement and control is a large field which has been receiving much attention in the past years. This is the topic of this paper in which the development and implementation of a low-cost measurement network is discussed. While not based on new technologies, this paper brings forth some novel aspects such as the securing of the communications on the industrial network as well as the reduction in cost by implementation on embedded processors. Most systems that have been developed are aimed at large companies with equally large budgets, whereas the systems described here is aimed at the small business and cost-conscious consumers.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131970309","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Performance analysis of the Fiber Bragg grating Interrogation system based on an arrayed waveguide grating 基于阵列波导光栅的光纤光栅讯问系统性能分析
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208002
P. Niewczas, A. J. Willshire, L. Dziuda, J. R. McDonald
{"title":"Performance analysis of the Fiber Bragg grating Interrogation system based on an arrayed waveguide grating","authors":"P. Niewczas, A. J. Willshire, L. Dziuda, J. R. McDonald","doi":"10.1109/IMTC.2003.1208002","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208002","url":null,"abstract":"In this paper we analyze performance of the Fiber Bragg Grating (FBG) Interrogation System based on an Arrayed Waveguide Grating (AWG) device. The spectrum of light reflected from the FBG sensor is analyzed using an AWG which acts as a coarse spectrometer. Using measurement points from the AWG channels, the original spectrum of the sensing element is reconstructed by a means of curve fitting. The measurement system is modeled in LabView environment, which allows to modify the FBG and AWG parameters and to simulate the measurement process. This, in turn, allows quantifying the measurement errors resulting from the nonlinearity of the particular FBG/AWG configuration, and allows optimizing the system design for the particular measurement errors permitted. In addition to the simulations of the proposed measurement system, we provide details of the laboratory evaluation.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131477453","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
A near-field-sensing transceiver for intra-body communication based on the electro-optic effect 一种基于电光效应的体内通信近场传感收发器
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208170
M. Shinagawa, M. Fukumoto, K. Ochiai, H. Kyuragi
{"title":"A near-field-sensing transceiver for intra-body communication based on the electro-optic effect","authors":"M. Shinagawa, M. Fukumoto, K. Ochiai, H. Kyuragi","doi":"10.1109/IMTC.2003.1208170","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208170","url":null,"abstract":"This paper describes a near-field-sensing transceiver for intrabody communication, in which the human body is the transmission medium. The key component of the transceiver is an electric-field sensor implemented with an electrooptic crystal and laser light. This sensor is suitable for detection of the small and unstable electric fields produced by the human body because it has extremely high input impedance. This transceiver enables IEEE 802.3 half-duplex communication of 10 Mb/s through a person's body in an operating range of about 150 cm between the hands. The packet error rate of 0.04% is obtained at packet size of 1070 octet. This paper explains the configuration and performance of the transceiver and presents results of a communication test.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131797063","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 169
A novel fully differential pixel concept for indirect TOF 3D measurement 一种新的全差分像素概念用于间接TOF三维测量
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208139
D. Stoppa, L. Gonzo, M. Gottardi, A. Simoni, L. Viarani
{"title":"A novel fully differential pixel concept for indirect TOF 3D measurement","authors":"D. Stoppa, L. Gonzo, M. Gottardi, A. Simoni, L. Viarani","doi":"10.1109/IMTC.2003.1208139","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208139","url":null,"abstract":"Abstraef - Thk pnper describes the design of a CMOS sensor for reo1 fima three-dimensional meosuremmts based on multiple-pulse indirect Time Of Flight technique. A novel fully differentid active pixel architecture, which allows for the detection of very shon and low intensiry light pulses. is presented Circuit simulations allowed the design nppronch to be validated and the electrical performance of the circuit to be predicted. The photodiode and the required read-out and processing electronics are sveeessfully implemented in II 80 x 80pmz pixel with nn upectedpower consumption of about 1 OOp W. A preliminary test-chip, consisting of 16 x 1 I-pixel 41ray with column read-out and digital conlml logic has been designed and fabricated in a 0.35pm, 3.36 CMOS fednology.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130802343","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
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