{"title":"用数字示波器测量瞬态现象","authors":"A. Moschitta, F. Stefani, D. Petri","doi":"10.1109/IMTC.2003.1207970","DOIUrl":null,"url":null,"abstract":"While the dynamic accuracy of an oscilloscope is usually defined in terms of its bandwidth, actually it also depends on the measured signal properties, and, for digital oscilloscopes, also on ADC performances. In this paper, the effects of sampling upon rise time measurements with a digital oscilloscope are considered. The effects of sampling are analyzed and modeled for various input step signals. In particular, a simple expression is derived, which conveniently models the sampling contribution to the overall rise time measurement error. Using these results, a correction technique is proposed to remove the interpolation error bias, and its applicability is discussed also with respect to analog error sources.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Measurements of transient phenomena with digital oscilloscopes\",\"authors\":\"A. Moschitta, F. Stefani, D. Petri\",\"doi\":\"10.1109/IMTC.2003.1207970\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"While the dynamic accuracy of an oscilloscope is usually defined in terms of its bandwidth, actually it also depends on the measured signal properties, and, for digital oscilloscopes, also on ADC performances. In this paper, the effects of sampling upon rise time measurements with a digital oscilloscope are considered. The effects of sampling are analyzed and modeled for various input step signals. In particular, a simple expression is derived, which conveniently models the sampling contribution to the overall rise time measurement error. Using these results, a correction technique is proposed to remove the interpolation error bias, and its applicability is discussed also with respect to analog error sources.\",\"PeriodicalId\":135321,\"journal\":{\"name\":\"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)\",\"volume\":\"47 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-05-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.2003.1207970\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.2003.1207970","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Measurements of transient phenomena with digital oscilloscopes
While the dynamic accuracy of an oscilloscope is usually defined in terms of its bandwidth, actually it also depends on the measured signal properties, and, for digital oscilloscopes, also on ADC performances. In this paper, the effects of sampling upon rise time measurements with a digital oscilloscope are considered. The effects of sampling are analyzed and modeled for various input step signals. In particular, a simple expression is derived, which conveniently models the sampling contribution to the overall rise time measurement error. Using these results, a correction technique is proposed to remove the interpolation error bias, and its applicability is discussed also with respect to analog error sources.