{"title":"3a technology based fault diagnosis and fault mining","authors":"Lei Jia, Renqing Pei, Bin Li, Guangxiao Yao","doi":"10.1109/IMTC.2003.1208149","DOIUrl":null,"url":null,"abstract":"A Condition monitor and fault diagnosis is an important research topic to improve the qualily of production Now, the traditional methods can not meet the requirement of the manufacturing. We propose 3A Technology Io improve the eflciency in the process of condition monifor and faulf diagnosis. I t include gather the data automatically, transmit the dafa aufomafically and faul! diagnosis aufomatically. We also infroduce a new notion, fault mining, which integrates fault diagnosis with Now, we often use the chip microcomputer as the frontdafa mining, a new promising fechnologv. Through the end terminal to collect the data automatically. It has unique application, we find this method is usefu.! hardware environment and specific software design. We can II.3A TECHNOLOGY","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.2003.1208149","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A Condition monitor and fault diagnosis is an important research topic to improve the qualily of production Now, the traditional methods can not meet the requirement of the manufacturing. We propose 3A Technology Io improve the eflciency in the process of condition monifor and faulf diagnosis. I t include gather the data automatically, transmit the dafa aufomafically and faul! diagnosis aufomatically. We also infroduce a new notion, fault mining, which integrates fault diagnosis with Now, we often use the chip microcomputer as the frontdafa mining, a new promising fechnologv. Through the end terminal to collect the data automatically. It has unique application, we find this method is usefu.! hardware environment and specific software design. We can II.3A TECHNOLOGY