Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)最新文献_第7页

UML model for the IEEE 1451.1 standard UML模型的IEEE 1451.1标准

Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208017

Kang B. Lee, E. Song

引用次数: 18

Quantification of swirling flow in hydraulic conveying from resistance tomography images 从阻力层析成像定量分析水力输送中的旋流

Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208029

W. Yin, Huaxiang Wang

引用次数: 3

A wavelet-based method for the measuring particulate velocity by an active electrostatic sensor 一种用有源静电传感器测量粒子速度的基于小波的方法

Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1207994

Jian Qiu Zhang, Y. Guo, Yi Shen

引用次数: 0

Sensor management based on cross-entropy 基于交叉熵的传感器管理

Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208011

Lu Di, Zeng Yi, Yao Yu

引用次数: 4

Influence of image processing operators and optical models used on the quality of depth estimation 图像处理算子和光学模型对深度估计质量的影响

Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208140

C. Simon, F. Bicking, T. Simon

引用次数: 1

An instrument for real-time emulation of multipath fading in indoor power-line networks 一种室内电力线网络多径衰落实时仿真仪器

Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208222

D. Anastasiadou, P. Savvopoulos, T. Antonakopouls

引用次数: 1

Environmental based characterization of soc for stratified testing 分层测试中基于环境的soc特性

Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208175

N. Park, K. M. George, N. Park, M. Choi, Y. Kim, F. Lombardi

引用次数: 2

Detection and estimation of a fault on coaxial cable via time-frequency domain reffectometry 同轴电缆故障的时频反射检测与估计

Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208150

T. Choe, Chan-Young Hong, Eun-Seok Song, J. Yook, JinBae Park, Y. Shin, E. Powers

{"title":"Detection and estimation of a fault on coaxial cable via time-frequency domain reffectometry","authors":"T. Choe, Chan-Young Hong, Eun-Seok Song, J. Yook, JinBae Park, Y. Shin, E. Powers","doi":"10.1109/IMTC.2003.1208150","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208150","url":null,"abstract":"The time-frequency domain reflecfometfy (TFDR) is a newlyproposed method to detect and locafe a foulf in a e o a i d esble. Thepurpose of fhispnper is lo discuss fhe usefulness and effediwness of fhe T F D R for defedion andloculizafion of (I fault. The fraditional repccfometfy methods can be chofegorized in either fhe time domain or frequency domain only; however, the T F D R utilizes rime ond frequency information of (I tronsienf signal fo defect and locafe fhe faull. The T F D R opproaeh described in fhis paper is summarized by the design of a time-frequency reference signor end the post-processing of fhe reference and r@ecfred signols The design ondposfprocessing are eomplefely based on joinf fime-frequemy analysis & deal with time and frequency localized information. W f h the aid of signalgenerofion and ocq\"risifion instruments, the T F D R algorithm hns been verijied for a red world coaxial cable (RC 142 fype) for differemf stales of fhe fault Also fhe T F D R algorithm is eompored with fhe fradifionol TDR. On fhe basis of the experintenfa1 resulfsprovidcd in fhbpoper, T F D R locales fhe faulf with smaller error than time domnin mflecfometfy,","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124675913","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

A self-calibrating bandpass filter and transceiver system tuning and test technique 一种自校准带通滤波器和收发器系统调谐和测试技术

Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1207965

C. Frost, G. Levy, B. Allison

{"title":"A self-calibrating bandpass filter and transceiver system tuning and test technique","authors":"C. Frost, G. Levy, B. Allison","doi":"10.1109/IMTC.2003.1207965","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1207965","url":null,"abstract":"The design of a self-calibrating, tunable, channel select filter and transceiver system tuning and test technique implemented in standard 0.25 /spl mu/m CMOS technology for personal area network applications is presented. The active RC bandpass filter features a cascade of biquadratic sections and is used in a low-IF receiver with a 2 MHz IF. A calibration technique adjusts for center frequency skewing by using the final biquad stage as an oscillator to track process variation. The calibration approach is a hybrid of the direct frequency measurement and the master/slave approaches whereby the actual filter resonator is used as a voltage controlled oscillator without the need for additional master block circuitry thus minimizing complexity and die area. The bandpass filter is accessible within the receiver through an integrated test capability that allows for direct measurement of filter parameters. The filter has been successfully fabricated in the design of a fully-integrated, single-chip 2.4 GHz CMOS RFIC. The mean bandpass filter center frequency for a 20-chip lot is 2.0090 MHz with an 11 kHz standard deviation. The group delay ranges from 1.1 to 1.9 /spl mu/s and the BPF consumes 7.4 mA from a 2.5 V supply under typical conditions.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122719142","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Measurement of water concentration in oil/water dispersions by a single-electrode capacitance probe 用单电极电容探头测量油/水分散体中的水浓度

Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208234

R. Schüller, B. Engebretsen, M. Halleraker

引用次数: 10