分层测试中基于环境的soc特性

Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI:10.1109/IMTC.2003.1208175

N. Park, K. M. George, N. Park, M. Choi, Y. Kim, F. Lombardi

{"title":"分层测试中基于环境的soc特性","authors":"N. Park, K. M. George, N. Park, M. Choi, Y. Kim, F. Lombardi","doi":"10.1109/IMTC.2003.1208175","DOIUrl":null,"url":null,"abstract":"A B Thispaperproposes II noref environmat&bmed mefhod for evaluating thegoodyield m e (CYR) of Systems-on-Chip (SoC) during fabrication Testing nndyield evoluotion at high confidence are MM of the most critical irsues for the fechnologifal SUECCSS of Soc. Since 4 SoC is designed and assembled using deeply embedded InteUecfuol Propem (IP) cores om SoC a rapidly expanding market with great potential","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Environmental based characterization of soc for stratified testing\",\"authors\":\"N. Park, K. M. George, N. Park, M. Choi, Y. Kim, F. Lombardi\",\"doi\":\"10.1109/IMTC.2003.1208175\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A B Thispaperproposes II noref environmat&bmed mefhod for evaluating thegoodyield m e (CYR) of Systems-on-Chip (SoC) during fabrication Testing nndyield evoluotion at high confidence are MM of the most critical irsues for the fechnologifal SUECCSS of Soc. Since 4 SoC is designed and assembled using deeply embedded InteUecfuol Propem (IP) cores om SoC a rapidly expanding market with great potential\",\"PeriodicalId\":135321,\"journal\":{\"name\":\"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-05-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.2003.1208175\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.2003.1208175","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 2

摘要

本文提出了一种用于评估片上系统(SoC)在制造过程中良率(CYR)的非环境方法，高置信度的测试和良率演变是SoC技术sueccs的最关键问题。由于4soc是使用深度嵌入的IP内核设计和组装的，因此SoC的市场迅速扩大，潜力巨大

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Environmental based characterization of soc for stratified testing

A B Thispaperproposes II noref environmat&bmed mefhod for evaluating thegoodyield m e (CYR) of Systems-on-Chip (SoC) during fabrication Testing nndyield evoluotion at high confidence are MM of the most critical irsues for the fechnologifal SUECCSS of Soc. Since 4 SoC is designed and assembled using deeply embedded InteUecfuol Propem (IP) cores om SoC a rapidly expanding market with great potential

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)

自引率

0.00%

发文量