{"title":"图像处理算子和光学模型对深度估计质量的影响","authors":"C. Simon, F. Bicking, T. Simon","doi":"10.1109/IMTC.2003.1208140","DOIUrl":null,"url":null,"abstract":"Absfrnd This able deals with a spoficll approoch Io depfh csfimntion by analysis o/edges in imega. A Depthfrom Defooeus methodis exploinednnd thephysicalprocess is described Theoretid developments w e made to op ply if on fhin or thick edges and fhc imflaence o/fhc used imageprocessing operators and opticd models ispointed DUI and discussed Some results 01 images are presented Io illusbate the mefhod efleieney and the oppropriafrness of fhc used modeis in noisy cmf&","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Influence of image processing operators and optical models used on the quality of depth estimation\",\"authors\":\"C. Simon, F. Bicking, T. Simon\",\"doi\":\"10.1109/IMTC.2003.1208140\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Absfrnd This able deals with a spoficll approoch Io depfh csfimntion by analysis o/edges in imega. A Depthfrom Defooeus methodis exploinednnd thephysicalprocess is described Theoretid developments w e made to op ply if on fhin or thick edges and fhc imflaence o/fhc used imageprocessing operators and opticd models ispointed DUI and discussed Some results 01 images are presented Io illusbate the mefhod efleieney and the oppropriafrness of fhc used modeis in noisy cmf&\",\"PeriodicalId\":135321,\"journal\":{\"name\":\"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)\",\"volume\":\"31 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-05-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.2003.1208140\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.2003.1208140","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Influence of image processing operators and optical models used on the quality of depth estimation
Absfrnd This able deals with a spoficll approoch Io depfh csfimntion by analysis o/edges in imega. A Depthfrom Defooeus methodis exploinednnd thephysicalprocess is described Theoretid developments w e made to op ply if on fhin or thick edges and fhc imflaence o/fhc used imageprocessing operators and opticd models ispointed DUI and discussed Some results 01 images are presented Io illusbate the mefhod efleieney and the oppropriafrness of fhc used modeis in noisy cmf&