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2025 Index IEEE Transactions on Magnetics Vol. 61 2025索引IEEE电磁学学报第61卷
IF 1.9 3区 工程技术
IEEE Transactions on Magnetics Pub Date : 2026-02-16 DOI: 10.1109/TMAG.2026.3664267
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引用次数: 0
Multilevel Green’s Function Interpolation Method for Low-Frequency Layered Magnetic Problems 低频层状磁问题的多级格林函数插值方法
IF 1.9 3区 工程技术
IEEE Transactions on Magnetics Pub Date : 2026-02-03 DOI: 10.1109/TMAG.2026.3659986
Muhammad Adeel Khan;Haogang Wang;Shidong Jiang;Xiaofeng Jin
{"title":"Multilevel Green’s Function Interpolation Method for Low-Frequency Layered Magnetic Problems","authors":"Muhammad Adeel Khan;Haogang Wang;Shidong Jiang;Xiaofeng Jin","doi":"10.1109/TMAG.2026.3659986","DOIUrl":"https://doi.org/10.1109/TMAG.2026.3659986","url":null,"abstract":"Fast and memory-efficient computation of magnetic signature of the geometrically complex ferromagnetic objects submerged in the layered marine environment (LME) is challenging because of the z-directional translation-variant dyadic layered Green’s functions (DLGFs). In this article, the kernel-independent multilevel Green’s function interpolation method (MLGFIM) is implemented to compute the low-frequency magnetic signature of ferromagnetic object submerged in LME, for the first time. In the implementation, the z-directional translation-variant DLGFs are interpolated via the peer-level and lower-to-upper level interpolation techniques. The closed-formed approximation formulas instead of time-consuming Sommerfeld integrals (SIs) are used to generate the interpolation table of the DLGF used in MLGFIM. The magnetic signature of an underwater vessel with 171 948 unknowns is calculated using a seven-level MLGFIM. The Lagrange interpolation points for each cube is set to K = 27. A total of 7.3 GB memory storage is used despite the z-directional translation-variant DLGFs and 6.3 s CPU time for one matrix-vector-multiplication in GMRES. To validate, the numerical results of the proposed method are compared with FEKO reference solution. The estimation of the magnetic signature is important for underwater detection and remote sensing application.","PeriodicalId":13405,"journal":{"name":"IEEE Transactions on Magnetics","volume":"62 3","pages":"1-10"},"PeriodicalIF":1.9,"publicationDate":"2026-02-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147383063","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Magnetics Society Information IEEE磁学学会信息
IF 1.9 3区 工程技术
IEEE Transactions on Magnetics Pub Date : 2026-01-30 DOI: 10.1109/TMAG.2026.3655707
{"title":"IEEE Magnetics Society Information","authors":"","doi":"10.1109/TMAG.2026.3655707","DOIUrl":"https://doi.org/10.1109/TMAG.2026.3655707","url":null,"abstract":"","PeriodicalId":13405,"journal":{"name":"IEEE Transactions on Magnetics","volume":"62 2","pages":"C2-C2"},"PeriodicalIF":1.9,"publicationDate":"2026-01-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11369242","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146082293","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Transactions on Magnetics Publication Information IEEE电磁学学报出版信息
IF 1.9 3区 工程技术
IEEE Transactions on Magnetics Pub Date : 2026-01-30 DOI: 10.1109/TMAG.2026.3655708
{"title":"IEEE Transactions on Magnetics Publication Information","authors":"","doi":"10.1109/TMAG.2026.3655708","DOIUrl":"https://doi.org/10.1109/TMAG.2026.3655708","url":null,"abstract":"","PeriodicalId":13405,"journal":{"name":"IEEE Transactions on Magnetics","volume":"62 2","pages":"C3-C3"},"PeriodicalIF":1.9,"publicationDate":"2026-01-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11369407","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146082301","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Magnetics Society Distinguished Lecturers for 2026–2027 IEEE磁学学会2026-2027杰出讲师
IF 1.9 3区 工程技术
IEEE Transactions on Magnetics Pub Date : 2026-01-30 DOI: 10.1109/TMAG.2025.3650089
{"title":"IEEE Magnetics Society Distinguished Lecturers for 2026–2027","authors":"","doi":"10.1109/TMAG.2025.3650089","DOIUrl":"https://doi.org/10.1109/TMAG.2025.3650089","url":null,"abstract":"","PeriodicalId":13405,"journal":{"name":"IEEE Transactions on Magnetics","volume":"62 2","pages":"1-3"},"PeriodicalIF":1.9,"publicationDate":"2026-01-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11369240","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146082291","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
TechRxiv: Share Your Preprint Research with the World! techxiv：与世界分享你的预印本研究！
IF 1.9 3区 工程技术
IEEE Transactions on Magnetics Pub Date : 2026-01-30 DOI: 10.1109/TMAG.2026.3659540
{"title":"TechRxiv: Share Your Preprint Research with the World!","authors":"","doi":"10.1109/TMAG.2026.3659540","DOIUrl":"https://doi.org/10.1109/TMAG.2026.3659540","url":null,"abstract":"","PeriodicalId":13405,"journal":{"name":"IEEE Transactions on Magnetics","volume":"62 2","pages":"1-1"},"PeriodicalIF":1.9,"publicationDate":"2026-01-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11369412","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146082309","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Transactions on Magnetics Institutional Listings 《IEEE磁学汇刊》
IF 1.9 3区 工程技术
IEEE Transactions on Magnetics Pub Date : 2026-01-30 DOI: 10.1109/TMAG.2026.3655709
{"title":"IEEE Transactions on Magnetics Institutional Listings","authors":"","doi":"10.1109/TMAG.2026.3655709","DOIUrl":"https://doi.org/10.1109/TMAG.2026.3655709","url":null,"abstract":"","PeriodicalId":13405,"journal":{"name":"IEEE Transactions on Magnetics","volume":"62 2","pages":"C4-C4"},"PeriodicalIF":1.9,"publicationDate":"2026-01-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11369243","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146082306","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Bistable Microwire Usage as the Sensor for Single-Chip Applications With Bifilar Excitation Coil 双稳态微线在双线励磁线圈单片机传感器中的应用
IF 1.9 3区 工程技术
IEEE Transactions on Magnetics Pub Date : 2026-01-22 DOI: 10.1109/TMAG.2026.3657033
P. Jacko;M. Bereš;P. Duranka;R. Varga
{"title":"Bistable Microwire Usage as the Sensor for Single-Chip Applications With Bifilar Excitation Coil","authors":"P. Jacko;M. Bereš;P. Duranka;R. Varga","doi":"10.1109/TMAG.2026.3657033","DOIUrl":"https://doi.org/10.1109/TMAG.2026.3657033","url":null,"abstract":"Bistable amorphous microwires enable time-domain sensing through abrupt magnetization switching but typically require complex electronic interfaces with bipolar supplies. This article presents a single-chip bistable microwire sensor interface based on the STM32G474RE microcontroller using a bifilar excitation coil to generate an effective bipolar magnetic field from a unipolar supply, eliminating the need for dc–dc converters, symmetrical power rails, and external amplifiers. Experimental results demonstrate reliable microwire switching and linear displacement measurement over a 5.25 mm range with a resolution down to 10 μm. The proposed solution significantly reduces component count, size, and complexity, making it suitable for embedded and internet of things (IoT) applications.","PeriodicalId":13405,"journal":{"name":"IEEE Transactions on Magnetics","volume":"62 3","pages":"1-4"},"PeriodicalIF":1.9,"publicationDate":"2026-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147383059","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Angular Evolution of Magnetoresistance in Magnetic Tunnel Junctions With Synthetic Antiferromagnets 合成反铁磁体磁隧道结中磁电阻的角演化
IF 1.9 3区 工程技术
IEEE Transactions on Magnetics Pub Date : 2026-01-15 DOI: 10.1109/TMAG.2026.3654873
N. Strelkov;S. Dounia;L. Cuchet;C. Ducruet;J. R. Childress
{"title":"Angular Evolution of Magnetoresistance in Magnetic Tunnel Junctions With Synthetic Antiferromagnets","authors":"N. Strelkov;S. Dounia;L. Cuchet;C. Ducruet;J. R. Childress","doi":"10.1109/TMAG.2026.3654873","DOIUrl":"https://doi.org/10.1109/TMAG.2026.3654873","url":null,"abstract":"We investigate a magnetic tunnel junction (MTJ) with a pinned synthetic antiferromagnet (SAF) under the influence of an in-plane magnetic field applied at an angle to the SAF reference direction. The conductance of such an MTJ pillar deviates from a perfect cosine-like angle dependence primarily due to the presence of uniaxial anisotropy in the free layer (FL) and the finite values of the pinning field and Ruderman–Kittel–Kasuya–Yosida (RKKY) coupling, which stabilize the SAF. We also consider other causes for the occurrence of angular error, such as the stray field from the SAF and the “orange peel” coupling effect. We develop a theory considering deviations of MTJ conductance up to the third harmonic based on the single domain (macrospin) approximation, allowing us to predict the angular error based on measured parameters at the thin-film level.","PeriodicalId":13405,"journal":{"name":"IEEE Transactions on Magnetics","volume":"62 3","pages":"1-12"},"PeriodicalIF":1.9,"publicationDate":"2026-01-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147383062","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Analytical Method for Pulsed Eddy Current Field of Flat-Bottomed Hole Defect Based on Defect Equivalent Source Model 基于缺陷等效源模型的平底孔缺陷脉冲涡流场分析方法
IF 1.9 3区 工程技术
IEEE Transactions on Magnetics Pub Date : 2026-01-15 DOI: 10.1109/TMAG.2026.3654683
Shixuan Feng;Xingle Chen
{"title":"Analytical Method for Pulsed Eddy Current Field of Flat-Bottomed Hole Defect Based on Defect Equivalent Source Model","authors":"Shixuan Feng;Xingle Chen","doi":"10.1109/TMAG.2026.3654683","DOIUrl":"https://doi.org/10.1109/TMAG.2026.3654683","url":null,"abstract":"Pulsed eddy current testing (PECT) is an electromagnetic nondestructive inspection technology capable of detecting pipe corrosion in-service without the need to remove the insulation coating. However, current PECT inspection methods based on intact conductor models lack sufficient accuracy in quantitative evaluation of localized corrosion defects, restricting their wider application. Based on the analytical model of the intact metal plate, this article develops a defect equivalent source model to analytically solve the eddy current field of conductors containing flat-bottomed hole defects, thereby improving computational accuracy and efficiency. First, artificial current excitation sources are introduced in the defect region to establish a defect equivalent source model, and the boundary-value problem for this model is solved. Then an iterative algorithm is employed to determine the defect equivalent source magnitudes based on the condition that the total current density within the defect region is zero. Subsequently, the time-domain analytical solution for the induced voltage in the PECT of the metal plate with defects is derived using the superposition principle. Finally, experiments on an aluminum alloy plate containing cylindrical flat-bottom hole defects validate the accuracy of the proposed defect equivalent source model and demonstrate its feasibility and advantages in analytically solving the eddy current field involving defects. The findings significantly enrich the analytical methods for defect-containing eddy current field and lay a theoretical foundation for innovation in PECT technology for localized corrosion defects.","PeriodicalId":13405,"journal":{"name":"IEEE Transactions on Magnetics","volume":"62 3","pages":"1-9"},"PeriodicalIF":1.9,"publicationDate":"2026-01-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147383117","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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