ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)最新文献_第5页

Electric behaviour of ZnO varistor studied from TSC measurement 用TSC法研究ZnO压敏电阻的电性能

ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709308

F. Yoshida, Y. Kamitani, M. Yoshiura, S. Maeta

引用次数: 1

Experimental investigation of treeing growth in polyethylene insulation 聚乙烯绝缘材料中树木生长的实验研究

ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709288

M.M. Rezinkina, O.L. Rezinkin

{"title":"Experimental investigation of treeing growth in polyethylene insulation","authors":"M.M. Rezinkina, O.L. Rezinkin","doi":"10.1109/ICSD.1998.709288","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709288","url":null,"abstract":"Experimental investigation of PE insulation distortion in power electrical fields was carried out by means of optical registration of treeing growth in electrode system \"needle-plate\". Experiments were performed at following conditions: radius of the needle tip was 2 /spl mu/m; distance between needle and plate -1, 5 mm, applied voltage -6, 7, 8, 9 kV. Carried out experiments have shown some typical features of treeing growth in PE under electrical stress. After initial stage, which is accompanied by increase of fractal dimension, the next stage follows. Stabilization of fractal dimension occurs at this stage. Duration of this stage depends on the level of electrical stress. Period that precedes the breakdown is accompanied by the decrease of fractal dimension of treeing and strong increase of its leading branch length. Another peculiarity of PE treeing growth is increase of its boughs' thickness. If time of the breakdown was less then 20 minutes, branches that are thicker near the needle tip were still thin at their ends. Upon prolong electrical stress treeing boughs have thickened all along. This process may lead to electrical field decrease in the growth area of a treeing and almost complete cessation of treeing penetration inside insulation gap. Treeing with weakly ramified thin boughs are the most dangerous from the point of view of insulation gap breakdown. If treeing has not caused insulator gap breakdown for short time (less then 2-3 minutes), its growth may substantially slow down even upon big stress (U-9 kV). These processes are accompanied by thickening of treeing branches and may be connected with it. Bushing-like ramified treeing with strongly thickening branches are typical for smaller stress (U=6 kV). Such treeing may grow during much longer time without insulation gap breakdown.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"110 1","pages":"313-316"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76997843","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Numerical simulation of electric currents through insulating materials 绝缘材料电流的数值模拟

ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709261

F. Frutos, A. Jimenez, J. A. Perez

引用次数: 3

On polyaniline-polyvinylchloride blends 聚苯胺-聚氯乙烯共混物的研究

ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709303

M. Chipara, I. Munteanu, P. Notingher, M. Chipara, J. Reyes Romero, B. Negreanu, D. Panaitescu

引用次数: 1

Observation of space charge distribution up to electric breakdown in acetophenone-coated polyethylene film 苯乙酮包覆聚乙烯薄膜电击穿前空间电荷分布的观察

ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709225

S. Mitsumoto, M. Nagao, M. Kosaki

{"title":"Observation of space charge distribution up to electric breakdown in acetophenone-coated polyethylene film","authors":"S. Mitsumoto, M. Nagao, M. Kosaki","doi":"10.1109/ICSD.1998.709225","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709225","url":null,"abstract":"This paper describes the effects of polarity of applied voltage and electrode metal on electric conduction and space charge formation up to electric breakdown in one-sidedly acetophenone-coated low-density polyethylene (LDPE) film. Up to the electric field of about 0.5 MV/cm with Au electrode, the acetophenone-coated positive electrode gives much larger conduction current than the negative one, suggesting that the existence of acetophenone at electrode interface enhances the hole injection rather than the electron injection. In the case of Al electrode this polarity dependence is opposite, suggesting the electron injection is more enhanced for Al electrode. Above about 0.5 MV/cm, however, these polarity effects changed oppositely. This change of polarity effect in high field region is explained by considering the space charge distribution and carrier injection from the acetophenone non-coated-side electrode. With the polarity where the current above 0.5 MV/cm became much larger, the dc electric strength showed significant decrease, showing that the dc breakdown is governed by the thermal process caused by Joule heating.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"173 1","pages":"51-54"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82948765","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 5

The effect of semiconductive screens and XLPE insulation combinations on electrical tree inception 半导体屏蔽和XLPE绝缘组合对电气树起始的影响

ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709237

S. Moody, R. N. Hampton

引用次数: 0

On the role of the interface with the substrate in the destructive dielectric breakdown of very thin insulating films grown on silicon 在硅上生长的极薄绝缘薄膜的破坏性介电击穿中与衬底的界面的作用

ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709338

N. Novkovski

引用次数: 0

Optimum test voltages for breakdown experiments 击穿实验的最佳测试电压

ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709325

C. Heitz

引用次数: 0

Phase-resolved study on partial discharge for degradation diagnosis in polymeric insulating materials using model electrode system 基于模型电极系统的聚合物绝缘材料局部放电降解诊断的相位分解研究

ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709248

F. Komori, A. Kojima, M. Hikita, Y. Suzuoki, T. Mizutani

引用次数: 6

Assessment of oil impregnated paper insulated transformers using recovery voltage measurements 用恢复电压测量评价油浸纸绝缘变压器

ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709228

A. Krivda, G. Russell

引用次数: 5