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ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)最新文献

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Dielectric properties of SiCF film deposited by PECVD with low dielectric constants 低介电常数PECVD沉积SiCF薄膜的介电性能
ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709267
K. Kim, J. Lim, W. Ryu, J. Lee
{"title":"Dielectric properties of SiCF film deposited by PECVD with low dielectric constants","authors":"K. Kim, J. Lim, W. Ryu, J. Lee","doi":"10.1109/ICSD.1998.709267","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709267","url":null,"abstract":"Low dielectric constant fluorocarbonated siliceous films were deposited by PECVD (plasma enhanced chemical vapor deposition) using 2% SiH/sub 4//N/sub 2/ and CF/sub 4/ gases in the chamber with parallel plate electrode of 13.56 MHz RF. The effects of RF power, chamber pressure and gas composition on the deposition rate were studied and the morphology of the films was tested by AES, XPS, AFM and SEM. The dielectric constant of the film determined by the capacitance-voltage measurements was 2.3.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"39 1","pages":"229-232"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84993772","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An automatic measurement system for 2-dimensional birefringence vector distribution 二维双折射矢量分布自动测量系统
ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709346
T. Koyama, Y. Zhu, T. Otsuka, T. Takada, Y. Murooka
{"title":"An automatic measurement system for 2-dimensional birefringence vector distribution","authors":"T. Koyama, Y. Zhu, T. Otsuka, T. Takada, Y. Murooka","doi":"10.1109/ICSD.1998.709346","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709346","url":null,"abstract":"We have developed a new high-speed and sensitive 2-Dimensional automatic measurement system with which the birefringence vector distribution corresponding to the internal stress distribution in a PMMA disk can be measured. The results obtained in a series of this experiment are compared with that obtained using the finite element calculation method.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"55 1","pages":"557-560"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84469753","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Electronic levels insulating polymers estimated by XPS and UPS 电子等级绝缘聚合物估计由XPS和UPS
ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709265
A. Kawamoto, Y. Suzuoki, T. Ikejiri, T. Mizutani, M. Ieda
{"title":"Electronic levels insulating polymers estimated by XPS and UPS","authors":"A. Kawamoto, Y. Suzuoki, T. Ikejiri, T. Mizutani, M. Ieda","doi":"10.1109/ICSD.1998.709265","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709265","url":null,"abstract":"In order to clarify the asymmetric properties on the basis of electronic levels, it is necessary to establish the methods for estimating electronic levels in polymers. In this paper, electronic levels in insulating polymers were estimated by contact potential difference, XPS, UPS in air and photoinjection current and the correlation among the estimated levels was investigated.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"59 1","pages":"221-224"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82986164","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Identification of partial discharges sources using a combination of linear prediction and neural networks 利用线性预测和神经网络相结合的方法识别局部放电源
ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709251
T. Medjeldi, M. Nemamcha, J. Gosse
{"title":"Identification of partial discharges sources using a combination of linear prediction and neural networks","authors":"T. Medjeldi, M. Nemamcha, J. Gosse","doi":"10.1109/ICSD.1998.709251","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709251","url":null,"abstract":"The ability to recognize forms by means of neural networks combined with a linear prediction analyze has been developed in this paper for partial discharges (PD) sources recognition. The PD sources are artificially created on a Teflon cell having two armatures isolated by polypropylene films. This experiments have been made at LEMD/CNRS Grenoble (France). This first work has been carried out by the use of a sample of seven specimens representing seven cases of presence of cavities on the cell insulation of study. The seven defects represented by respective signals of apparent charge were processed modeled by linear prediction and then passed to a back propagation neural networks.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"1 1","pages":"165-167"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76698044","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
High voltage insulation for power cables utilizing high temperature superconductivity 利用高温超导性的电力电缆高压绝缘
ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709309
A. Bulinski, J. Densley
{"title":"High voltage insulation for power cables utilizing high temperature superconductivity","authors":"A. Bulinski, J. Densley","doi":"10.1109/ICSD.1998.709309","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709309","url":null,"abstract":"This paper discusses several properties of HV tape-type insulation impregnated with LN/sub 2/ for cryogenic cables. Fibrous, film and laminated materials have been tested for their short and long-term properties under AC and impulse voltages. The effect of partial discharges and the relationship between the AC and the transient characteristics of the insulation are discussed.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"47 1","pages":"397-400"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73653585","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 30
Influence of metal inclusions on AC breakdown strength in EPDM 金属夹杂物对三元乙丙橡胶交流击穿强度的影响
ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709333
Jorgen Svahn, Kabeldon
{"title":"Influence of metal inclusions on AC breakdown strength in EPDM","authors":"Jorgen Svahn, Kabeldon","doi":"10.1109/ICSD.1998.709333","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709333","url":null,"abstract":"The aim of this work was to investigate the influence of metallic particles on the AC breakdown strength in EPDM rubber. Filled and unfilled EPDM rubbers were contaminated with two different particle sizes (50 /spl mu/m and 165 /spl mu/m) and different particle concentrations, to ascertain their influence on the breakdown strength. The inclusions were irregularly shaped iron particles. The breakdown tests were carried out by using /spl sim/0.7 mm thick circular rubber slabs between cylindrical electrodes. The result yielded the characteristic AC breakdown strengths of 78 kV/mm and 86 kV/mm respectively for non-contaminated filled and unfilled rubbers. The electric strength was considerably lowered for larger inclusions but not in the case of smaller ones. A statistical evaluation of the results is also provided.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"12 1","pages":"498-501"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85924448","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Space charge distribution in new functional organic layer 新型功能有机层中的空间电荷分布
ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709222
Y. Hashimoto, N. Fujimura, K. Fukunaga, T. Maeno, T. Sakakibara
{"title":"Space charge distribution in new functional organic layer","authors":"Y. Hashimoto, N. Fujimura, K. Fukunaga, T. Maeno, T. Sakakibara","doi":"10.1109/ICSD.1998.709222","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709222","url":null,"abstract":"We have studied the internal space charge behavior of a new functional organic insulators such as organic photoconductor (OPC) and organic light emitting diode (OLED). In this paper, some results of the experiments are reported for the specimens which are charge transport layer (CTL) of the OPC and light emitting layer (Alq3) of the OLED with the different kinds of the electrode materials. The experimental results indicate that the electron/hole injection into the new functional organic layer from the electrodes are influenced by the Fermi level of the electrode material. We will discuss the electronic behavior of the localized energy states of the new functional organic layer based on the measurement of the internal phenomena.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"9 1","pages":"40-42"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86543657","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Investigation of partial discharge pulse shapes occurring at interfaces in model joints 模型节理界面局部放电脉冲形状的研究
ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709240
Z. Nadolny, J. Braun, R. Densley
{"title":"Investigation of partial discharge pulse shapes occurring at interfaces in model joints","authors":"Z. Nadolny, J. Braun, R. Densley","doi":"10.1109/ICSD.1998.709240","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709240","url":null,"abstract":"The understanding of degradation processes in transmission-class cable joints is very important to the reliability of the operating system. Degradation caused by partial discharges (PD) and their associated characteristics were investigated in model \"pre-fabricated\" cable joints. Time to breakdown and PD pulse parameters such as rise time, width, fall time, amplitude and frequency were studied. The paper further describes PD pulse parameters occurring within different part of cable joints, such as within the epoxy casting near the high voltage electrode and along the EPR-epoxy interfaces.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"74 1","pages":"119-122"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86589848","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 15
TSC in PET containing ferrocene units 含二茂铁单元的PET中的TSC
ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709354
A. Volozhin, J. Subocz
{"title":"TSC in PET containing ferrocene units","authors":"A. Volozhin, J. Subocz","doi":"10.1109/ICSD.1998.709354","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709354","url":null,"abstract":"It is shown that a prolonged sample of PET containing a metallocene compound forming by means of electric field of several hours duration results in additional structural effects that are not well investigated as yet. A similar problem was also encountered at TSC measurements in polyimide and polystyrene films. This problem calls for further investigation when taking into account the possibility the film may be employed in the presence of a strong electric field and high temperatures.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"5 1","pages":"589-591"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89815758","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Effects of metal impurities in insulation of distribution cables 金属杂质对配电电缆绝缘的影响
ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709266
Woo-Sun Lee, Nam-Oh Kim, Y. Chung, M. Han
{"title":"Effects of metal impurities in insulation of distribution cables","authors":"Woo-Sun Lee, Nam-Oh Kim, Y. Chung, M. Han","doi":"10.1109/ICSD.1998.709266","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709266","url":null,"abstract":"Effect of metal impurities in insulation layer of distribution cables was investigated. The test samples of XLPE cables were fabricated with added metal impurities of Al,Cu,Fe, and electrical conductivity was measured in the voltage range of 0-10 kV. We observed the stimulated hysteresis curve, which becomes the relationship between forward and reverse charging currents. At the voltage range of 0.5/spl sim/10 kV, the charging current between the samples with and without carbon black electrodes became larger at higher voltage levels. In addition, some effects of the curves of charging current due to impurities are discussed.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"70 1","pages":"225-228"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90412422","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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