发布求助
文献互助 智能选刊 最新文献

ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)最新文献

筛选
英文 中文
Dielectric properties of SiCF film deposited by PECVD with low dielectric constants 低介电常数PECVD沉积SiCF薄膜的介电性能
ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709267
K. Kim, J. Lim, W. Ryu, J. Lee
{"title":"Dielectric properties of SiCF film deposited by PECVD with low dielectric constants","authors":"K. Kim, J. Lim, W. Ryu, J. Lee","doi":"10.1109/ICSD.1998.709267","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709267","url":null,"abstract":"Low dielectric constant fluorocarbonated siliceous films were deposited by PECVD (plasma enhanced chemical vapor deposition) using 2% SiH/sub 4//N/sub 2/ and CF/sub 4/ gases in the chamber with parallel plate electrode of 13.56 MHz RF. The effects of RF power, chamber pressure and gas composition on the deposition rate were studied and the morphology of the films was tested by AES, XPS, AFM and SEM. The dielectric constant of the film determined by the capacitance-voltage measurements was 2.3.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"39 1","pages":"229-232"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84993772","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An automatic measurement system for 2-dimensional birefringence vector distribution 二维双折射矢量分布自动测量系统
ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709346
T. Koyama, Y. Zhu, T. Otsuka, T. Takada, Y. Murooka
{"title":"An automatic measurement system for 2-dimensional birefringence vector distribution","authors":"T. Koyama, Y. Zhu, T. Otsuka, T. Takada, Y. Murooka","doi":"10.1109/ICSD.1998.709346","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709346","url":null,"abstract":"We have developed a new high-speed and sensitive 2-Dimensional automatic measurement system with which the birefringence vector distribution corresponding to the internal stress distribution in a PMMA disk can be measured. The results obtained in a series of this experiment are compared with that obtained using the finite element calculation method.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"55 1","pages":"557-560"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84469753","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Electronic levels insulating polymers estimated by XPS and UPS 电子等级绝缘聚合物估计由XPS和UPS
ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709265
A. Kawamoto, Y. Suzuoki, T. Ikejiri, T. Mizutani, M. Ieda
{"title":"Electronic levels insulating polymers estimated by XPS and UPS","authors":"A. Kawamoto, Y. Suzuoki, T. Ikejiri, T. Mizutani, M. Ieda","doi":"10.1109/ICSD.1998.709265","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709265","url":null,"abstract":"In order to clarify the asymmetric properties on the basis of electronic levels, it is necessary to establish the methods for estimating electronic levels in polymers. In this paper, electronic levels in insulating polymers were estimated by contact potential difference, XPS, UPS in air and photoinjection current and the correlation among the estimated levels was investigated.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"59 1","pages":"221-224"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82986164","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
TSC of polyaniline thin film 聚苯胺薄膜的TSC
ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709353
M. Yoshiura, F. Yoshida, Y. Kamitani, S. Maeta
{"title":"TSC of polyaniline thin film","authors":"M. Yoshiura, F. Yoshida, Y. Kamitani, S. Maeta","doi":"10.1109/ICSD.1998.709353","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709353","url":null,"abstract":"We report the results of thermally stimulated current (TSC) measurements of polyaniline thin films with electric conducting or insulating property and the latest application of the analytical estimation methods for TSC signals.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"68 1","pages":"585-588"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80848837","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Dielectric properties of new-type polyethylene polymerized using a single-site catalyst 单位点催化剂聚合新型聚乙烯的介电性能
ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709332
M. Araoka, H. Yoneda, Y. Ohki
{"title":"Dielectric properties of new-type polyethylene polymerized using a single-site catalyst","authors":"M. Araoka, H. Yoneda, Y. Ohki","doi":"10.1109/ICSD.1998.709332","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709332","url":null,"abstract":"We investigated dielectric properties of new-type polyethylene polymerized with a single-site catalyst. The new polyethylene has a much higher dielectric strength and a volume resistivity than the conventional low-density polyethylene and linear low-density polyethylene. The increase in the density is considered to be responsible for the increase in dielectric strength. The type of the comonomer and melt flow rate (MFR) scarcely affect the dielectric properties.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"71 1","pages":"493-497"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91226544","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Dielectric breakdown in F-doped SiO/sub 2/ films formed by plasma-enhanced chemical vapor deposition 等离子体增强化学气相沉积f掺杂SiO/ sub2 /薄膜的介电击穿
ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709302
H. Kato, S. Sakai, A. Takami, Y. Ohki, K. Ishii
{"title":"Dielectric breakdown in F-doped SiO/sub 2/ films formed by plasma-enhanced chemical vapor deposition","authors":"H. Kato, S. Sakai, A. Takami, Y. Ohki, K. Ishii","doi":"10.1109/ICSD.1998.709302","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709302","url":null,"abstract":"Fluorine-doped thin silicon dioxide films were synthesized by plasma-enhanced chemical vapor deposition of tetraethoxysilane and CF/sub 4/, and the dielectric strength was measured with a self-healing breakdown technique by applying short duration voltage pulses. As a result, the film containing a higher amount of fluorine has a higher dielectric strength. The reason for this increase is discussed from various aspects, and two persuasive mechanisms are presented.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"60 1","pages":"368-371"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91011762","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Influence of metal inclusions on AC breakdown strength in EPDM 金属夹杂物对三元乙丙橡胶交流击穿强度的影响
ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709333
Jorgen Svahn, Kabeldon
{"title":"Influence of metal inclusions on AC breakdown strength in EPDM","authors":"Jorgen Svahn, Kabeldon","doi":"10.1109/ICSD.1998.709333","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709333","url":null,"abstract":"The aim of this work was to investigate the influence of metallic particles on the AC breakdown strength in EPDM rubber. Filled and unfilled EPDM rubbers were contaminated with two different particle sizes (50 /spl mu/m and 165 /spl mu/m) and different particle concentrations, to ascertain their influence on the breakdown strength. The inclusions were irregularly shaped iron particles. The breakdown tests were carried out by using /spl sim/0.7 mm thick circular rubber slabs between cylindrical electrodes. The result yielded the characteristic AC breakdown strengths of 78 kV/mm and 86 kV/mm respectively for non-contaminated filled and unfilled rubbers. The electric strength was considerably lowered for larger inclusions but not in the case of smaller ones. A statistical evaluation of the results is also provided.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"12 1","pages":"498-501"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85924448","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Investigation of partial discharge pulse shapes occurring at interfaces in model joints 模型节理界面局部放电脉冲形状的研究
ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709240
Z. Nadolny, J. Braun, R. Densley
{"title":"Investigation of partial discharge pulse shapes occurring at interfaces in model joints","authors":"Z. Nadolny, J. Braun, R. Densley","doi":"10.1109/ICSD.1998.709240","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709240","url":null,"abstract":"The understanding of degradation processes in transmission-class cable joints is very important to the reliability of the operating system. Degradation caused by partial discharges (PD) and their associated characteristics were investigated in model \"pre-fabricated\" cable joints. Time to breakdown and PD pulse parameters such as rise time, width, fall time, amplitude and frequency were studied. The paper further describes PD pulse parameters occurring within different part of cable joints, such as within the epoxy casting near the high voltage electrode and along the EPR-epoxy interfaces.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"74 1","pages":"119-122"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86589848","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 15
Outdoor ageing of silicone rubber based polymeric materials 硅橡胶基高分子材料的室外老化
ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709310
T. Sorqvist, A. Vlastós
{"title":"Outdoor ageing of silicone rubber based polymeric materials","authors":"T. Sorqvist, A. Vlastós","doi":"10.1109/ICSD.1998.709310","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709310","url":null,"abstract":"Two silicone rubber based polymeric materials for outdoor insulation were studied under field conditions for about nine years. Then they were evaluated in the laboratory. The field test was conducted in an environment of light coastal pollution where the materials were non-energized as well as energized with both HVAC and HVDC. The long-term study focused on the hydrophobicity and the material changes of the insulator surfaces combined with the leakage current performance of the insulators. In general, the results presented in this paper show that the surface ageing of the two types of silicone rubbers was relatively moderate and that both the non-energized and energized materials remained highly water repellent. Moreover, no substantial differences in the hydrophobicity between the two material types were observed after almost nine-years in the field. However, the leakage currents of the insulators differed. This indicates that the hydrophobicity, as it is usually measured, is not a good indicator of the surface resistance of the insulator material.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"52 1","pages":"401-405"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84011687","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Accelerated aging of XLPE and EPR cable insulations in wet conditions and its influence on electrical characteristics 交联聚乙烯和EPR电缆绝缘在潮湿条件下的加速老化及其对电气特性的影响
ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709294
S. Nikolajevic
{"title":"Accelerated aging of XLPE and EPR cable insulations in wet conditions and its influence on electrical characteristics","authors":"S. Nikolajevic","doi":"10.1109/ICSD.1998.709294","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709294","url":null,"abstract":"This paper presents the results of an investigation into changing of crosslinked polyethylene (XLPE) ethylene-propylene rubber (EPR) cable insulations on electrical characteristics due to water absorption. The experimental set up was made for the following XLPE and EPR cable insulations: steam and dry cured with water tree retardant crosslinked polyethylene (TR-XLPE) and steam cured EPR. During tests, the tap water was injected (1) into the cable conductor with cable ends closed, (2) into the cable conductor with cable ends opened and into the metallic screen with the cable ends closed. The presence of water in TR XLPE and EPR cables was subjected to electrical stress and heating. The tests of electrical characteristics of TR XLPE and EPR cable insulations were performed as a function of aging time at different aging temperatures.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"7 1","pages":"337-340"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79077630","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
首页 上一页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：481959085
Book学术官方微信