ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)最新文献_第10页

On the thermooxidative degradation of polyethyleneterephtalate 热氧化降解聚乙二甲酸乙酯的研究

ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709280

M. Chipara, P. Notingher, J. Reyes, M. Chipara

{"title":"On the thermooxidative degradation of polyethyleneterephtalate","authors":"M. Chipara, P. Notingher, J. Reyes, M. Chipara","doi":"10.1109/ICSD.1998.709280","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709280","url":null,"abstract":"The thermal degradation in air of PET within the glass transition range is a complex phenomenon. According to mechanical data it might be concluded that the thermooxidative degradation of PET is described by a single first order process. Due to the thickness of the sample and as the degradation temperatures were above T/sub A/, the thermooxidative degradation process is homogeneous. Thermal analysis have revealed the presence of a weak liquid-liquid transition. Both the liquid-liquid transition and the glass transition depends on degradation time and temperature. From the effect of the thermooxidative degradation on T/sub G/, it is possible to conclude that at low degradation temperatures the polymer crosslinks. At 150/spl deg/C, a transition from crosslinking to chain scissions at large degradation times (above 500 h) is noticed. Hence T/sub c/ depends on the degradation time and temperature. Dc electrical conduction measurements have revealed two competing first order relaxation processes, ascribed to crystalline and amorphous domains. Further studies are in course, in order to elucidate this behaviour.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"134 7 1","pages":"283-285"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79626917","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Calibration of accumulated space charge in power cable using PEA measurement 用PEA测量校正电力电缆中累积空间电荷

ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709227

K. Nagashima, X. Qin, Y. Tanaka, T. Takada

引用次数: 7

Dielectric properties of SiCF film deposited by PECVD with low dielectric constants 低介电常数PECVD沉积SiCF薄膜的介电性能

ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709267

K. Kim, J. Lim, W. Ryu, J. Lee

引用次数: 0

Electric charge 3-dimensional profile measurement in dielectrics using acoustic microscope probe head 用声学显微镜探头测量电介质中电荷的三维轮廓

ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709216

X. Qin, K. Suzuki, M. Sazaki, Y. Tanaka, T. Takada

引用次数: 1

Identification of partial discharges sources using a combination of linear prediction and neural networks 利用线性预测和神经网络相结合的方法识别局部放电源

ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709251

T. Medjeldi, M. Nemamcha, J. Gosse

引用次数: 0

The influence of the semicon-insulation interface on the thermally stimulated current spectra of XLPE cable samples 半绝缘界面对XLPE电缆样品热激电流谱的影响

ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709352

S. Hobdell, T. J. Lewis, J. Llewellyn, S. Moody

引用次数: 0

Effects of metal impurities in insulation of distribution cables 金属杂质对配电电缆绝缘的影响

ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709266

Woo-Sun Lee, Nam-Oh Kim, Y. Chung, M. Han

引用次数: 1

The effect of inclusions in XLPE insulations on electrical trees generated by ac and grounded dc voltage 交联聚乙烯绝缘体中夹杂物对交流和接地直流电压产生的电流树的影响

ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709289

Y. Sekii, K. Maruta, T. Okada

{"title":"The effect of inclusions in XLPE insulations on electrical trees generated by ac and grounded dc voltage","authors":"Y. Sekii, K. Maruta, T. Okada","doi":"10.1109/ICSD.1998.709289","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709289","url":null,"abstract":"The effects of peroxide decomposition products and antioxidant in XLPE (cross-linked polyethylene) insulation on the initiation of ac tree (the tree generated by ac voltage) and the grounded dc tree (the tree generated by the grounded dc voltage) was investigated. Both inclusions were confirmed to have the effect of suppressing ac and the grounded dc tree. The peroxide decomposition products and antioxidant were confirmed to have almost the same effect in ac tree suppression at ambient temperature, while in grounded dc tree suppression peroxide decomposition products showed a greater effect than the AO. The ac tree inception voltage of XLPE containing peroxide decomposition products decreases with the increase of temperature. This decrease could be due to the loss of the decomposition products at elevated temperature. The tree inception voltage of degassed XLPE at high temperature is found to be almost equal to the inception voltage at ambient temperature. The mechanism of tree suppression and polarity effect of the grounded dc tree was examined.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"4 1","pages":"317-320"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87433084","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 6

Space charge distribution in new functional organic layer 新型功能有机层中的空间电荷分布

ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709222

Y. Hashimoto, N. Fujimura, K. Fukunaga, T. Maeno, T. Sakakibara

引用次数: 2

TSC of polyaniline thin film 聚苯胺薄膜的TSC

ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) Pub Date : 1998-06-22 DOI: 10.1109/ICSD.1998.709353

M. Yoshiura, F. Yoshida, Y. Kamitani, S. Maeta

引用次数: 3