{"title":"击穿实验的最佳测试电压","authors":"C. Heitz","doi":"10.1109/ICSD.1998.709325","DOIUrl":null,"url":null,"abstract":"When performing breakdown measurements on an electrical system, the test voltages have to be chosen carefully in order to yield maximum information about the breakdown characteristic of the system. The better the test voltages are chosen the smaller is the experimental effort for getting a predefined result quality. In this investigation the question \"What are the best test voltages in a breakdown experiment?\" is addressed. A general method is presented that allows to determine the optimum test voltage U/sub N+1/, when N breakdown experiments at voltages U/sub 1/,...U/sub N/ have already been performed. With this method a sequential determination of the optimum test voltages is possible. The usage of optimum test voltages lead to a minimization of the number of breakdown experiments when a predefined result quality has to be reached, or the result quality is maximized for a given number of breakdown experiments.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"1 1","pages":"464-469"},"PeriodicalIF":0.0000,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Optimum test voltages for breakdown experiments\",\"authors\":\"C. Heitz\",\"doi\":\"10.1109/ICSD.1998.709325\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"When performing breakdown measurements on an electrical system, the test voltages have to be chosen carefully in order to yield maximum information about the breakdown characteristic of the system. The better the test voltages are chosen the smaller is the experimental effort for getting a predefined result quality. In this investigation the question \\\"What are the best test voltages in a breakdown experiment?\\\" is addressed. A general method is presented that allows to determine the optimum test voltage U/sub N+1/, when N breakdown experiments at voltages U/sub 1/,...U/sub N/ have already been performed. With this method a sequential determination of the optimum test voltages is possible. The usage of optimum test voltages lead to a minimization of the number of breakdown experiments when a predefined result quality has to be reached, or the result quality is maximized for a given number of breakdown experiments.\",\"PeriodicalId\":13148,\"journal\":{\"name\":\"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)\",\"volume\":\"1 1\",\"pages\":\"464-469\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-06-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSD.1998.709325\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSD.1998.709325","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
When performing breakdown measurements on an electrical system, the test voltages have to be chosen carefully in order to yield maximum information about the breakdown characteristic of the system. The better the test voltages are chosen the smaller is the experimental effort for getting a predefined result quality. In this investigation the question "What are the best test voltages in a breakdown experiment?" is addressed. A general method is presented that allows to determine the optimum test voltage U/sub N+1/, when N breakdown experiments at voltages U/sub 1/,...U/sub N/ have already been performed. With this method a sequential determination of the optimum test voltages is possible. The usage of optimum test voltages lead to a minimization of the number of breakdown experiments when a predefined result quality has to be reached, or the result quality is maximized for a given number of breakdown experiments.