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IEEE Journal of Solid-state Circuits最新文献

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A Scalable 1024-Channel Ultra-Low-Power Spike Sorting Chip With Event-Driven Detection and Spatial Clustering 具有事件驱动检测和空间聚类的可扩展1024通道超低功耗尖峰分选芯片
IF 5.4 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2025-10-01 DOI: 10.1109/jssc.2025.3611139
Arash Akhoundi, Pumiao Yan, Yawende Landbrug, Madeline Hays, Boris Murmann, E. J. Chichilnisky, Dante G. Muratore
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引用次数: 0
A 25.8% 3σ/μ-Accuracy, 0.12%/°C Temperature Drift Sigma-Delta Modulation Calibrated Pseudo-Resistor With GΩ to TΩ Tuning Range 一个3σ/μ-精度25.8%，0.12%/°C温度漂移σ - δ调制校准伪电阻，调谐范围GΩ至TΩ
IF 5.4 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2025-09-30 DOI: 10.1109/jssc.2025.3612895
Yuzhi Hao, Hua Fan, Yong Lian, Mingyi Chen
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引用次数: 0
IEEE Journal of Solid-State Circuits Information for Authors IEEE固态电路杂志作者信息
IF 5.6 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2025-09-29 DOI: 10.1109/JSSC.2025.3609094
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引用次数: 0
TechRxiv: Share Your Preprint Research With the World! techxiv：与世界分享你的预印本研究！
IF 5.6 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2025-09-29 DOI: 10.1109/JSSC.2025.3611035
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引用次数: 0
A 0.5-/0.95-dB NF, 50-/25-Ω Configurable CMOS Front-End ASIC for the Readout of Liquid Argon Calorimeter in the LHC 0.5-/0.95 db NF， 50-/25-Ω用于LHC中液氩量热计读出的可配置CMOS前端ASIC
IF 5.4 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2025-09-29 DOI: 10.1109/jssc.2025.3602751
Mietek Dabrowski, Filip Tavernier, Paul Leroux
{"title":"A 0.5-/0.95-dB NF, 50-/25-Ω Configurable CMOS Front-End ASIC for the Readout of Liquid Argon Calorimeter in the LHC","authors":"Mietek Dabrowski, Filip Tavernier, Paul Leroux","doi":"10.1109/jssc.2025.3602751","DOIUrl":"https://doi.org/10.1109/jssc.2025.3602751","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"20 1","pages":""},"PeriodicalIF":5.4,"publicationDate":"2025-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145188575","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Low-Jitter Fractional-N Digital PLL Using a Quantization-Error-Compensating BBPD and an Orthogonal-Polynomial-Based LMS Calibration 基于量化误差补偿BBPD和正交多项式LMS校准的低抖动分数n数字锁相环
IF 5.4 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2025-09-29 DOI: 10.1109/jssc.2025.3611417
Munjae Chae, Seheon Jang, Seungjae Lee, Jaehyouk Choi
{"title":"A Low-Jitter Fractional-N Digital PLL Using a Quantization-Error-Compensating BBPD and an Orthogonal-Polynomial-Based LMS Calibration","authors":"Munjae Chae, Seheon Jang, Seungjae Lee, Jaehyouk Choi","doi":"10.1109/jssc.2025.3611417","DOIUrl":"https://doi.org/10.1109/jssc.2025.3611417","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"65 1","pages":""},"PeriodicalIF":5.4,"publicationDate":"2025-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145188574","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Editorial New Associate Editor 新任副主编
IF 5.4 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2025-09-29 DOI: 10.1109/jssc.2025.3604692
Boris Murmann
{"title":"Editorial New Associate Editor","authors":"Boris Murmann","doi":"10.1109/jssc.2025.3604692","DOIUrl":"https://doi.org/10.1109/jssc.2025.3604692","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"31 1","pages":""},"PeriodicalIF":5.4,"publicationDate":"2025-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145188577","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A 180-nm Voltage-Controlled Magneto-Electric RAM With Sub-1-ns Switching Time 开关时间小于1ns的180nm压控磁电RAM
IF 5.4 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2025-09-29 DOI: 10.1109/jssc.2025.3609342
Haris Suhail, Haoran He, Vinod Kurian Jacob, Jiyue Yang, Kang L. Wang, Sudhakar Pamarti
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引用次数: 0
Guest Editorial Introduction to the Special Section on the 2024 Asian Solid-State Circuits Conference (A-SSCC) 2024年亚洲固态电路会议（A-SSCC）专题介绍
IF 5.4 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2025-09-29 DOI: 10.1109/jssc.2025.3590622
Pei-Yun Tsai, Tsung-Heng Tsai, Minoru Fujishima, Byungsub Kim
{"title":"Guest Editorial Introduction to the Special Section on the 2024 Asian Solid-State Circuits Conference (A-SSCC)","authors":"Pei-Yun Tsai, Tsung-Heng Tsai, Minoru Fujishima, Byungsub Kim","doi":"10.1109/jssc.2025.3590622","DOIUrl":"https://doi.org/10.1109/jssc.2025.3590622","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"5 1","pages":""},"PeriodicalIF":5.4,"publicationDate":"2025-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145188576","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Journal of Solid-State Circuits Publication Information IEEE固态电路杂志出版信息
IF 5.4 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2025-09-29 DOI: 10.1109/jssc.2025.3607519
{"title":"IEEE Journal of Solid-State Circuits Publication Information","authors":"","doi":"10.1109/jssc.2025.3607519","DOIUrl":"https://doi.org/10.1109/jssc.2025.3607519","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"17 1","pages":""},"PeriodicalIF":5.4,"publicationDate":"2025-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145188737","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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