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IEEE Journal of Solid-state Circuits最新文献

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A Dual-Inductor Quad-Path Hybrid Buck (2L4PHB) Converter With Reduced Inductor Current
IF 5.4 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2025-02-27 DOI: 10.1109/jssc.2025.3543582
Wen-Liang Zeng, Guigang Cai, Yan Lu, Sai-Weng Sin, Rui P. Martins, Chi-Seng Lam
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引用次数: 0
An Emulated Curve Assisted Fast-Transient Buck Converter With One-Cycle Charge Balance
IF 5.4 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2025-02-25 DOI: 10.1109/jssc.2025.3539593
Zihao Tang, Yan Lu, Rui P. Martins, Mo Huang
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引用次数: 0
IEEE Journal of Solid-State Circuits Information for Authors
IF 4.6 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2025-02-25 DOI: 10.1109/JSSC.2025.3542930
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引用次数: 0
IEEE Journal of Solid-State Circuits Publication Information
IF 4.6 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2025-02-25 DOI: 10.1109/JSSC.2025.3542928
{"title":"IEEE Journal of Solid-State Circuits Publication Information","authors":"","doi":"10.1109/JSSC.2025.3542928","DOIUrl":"https://doi.org/10.1109/JSSC.2025.3542928","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"60 3","pages":"C2-C2"},"PeriodicalIF":4.6,"publicationDate":"2025-02-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10903210","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143489192","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Guest Editorial 2024 Custom Integrated Circuits Conference
IF 4.6 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2025-02-25 DOI: 10.1109/JSSC.2025.3526861
Taiyun Chi;Yoonmyung Lee;Shaolan Li
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引用次数: 0
New Associate Editor
IF 4.6 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2025-02-25 DOI: 10.1109/JSSC.2025.3531097
Dennis Sylvester
{"title":"New Associate Editor","authors":"Dennis Sylvester","doi":"10.1109/JSSC.2025.3531097","DOIUrl":"https://doi.org/10.1109/JSSC.2025.3531097","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"60 3","pages":"751-751"},"PeriodicalIF":4.6,"publicationDate":"2025-02-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10903513","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143489178","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Thank You for Your Authorship
IF 4.6 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2025-02-25 DOI: 10.1109/JSSC.2025.3542936
{"title":"Thank You for Your Authorship","authors":"","doi":"10.1109/JSSC.2025.3542936","DOIUrl":"https://doi.org/10.1109/JSSC.2025.3542936","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"60 3","pages":"1124-1124"},"PeriodicalIF":4.6,"publicationDate":"2025-02-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10903512","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143489091","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
TechRxiv: Share Your Preprint Research With the World!
IF 4.6 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2025-02-25 DOI: 10.1109/JSSC.2025.3542932
{"title":"TechRxiv: Share Your Preprint Research With the World!","authors":"","doi":"10.1109/JSSC.2025.3542932","DOIUrl":"https://doi.org/10.1109/JSSC.2025.3542932","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"60 3","pages":"1122-1122"},"PeriodicalIF":4.6,"publicationDate":"2025-02-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10903154","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143489191","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A 2.4-GHz-BW 59.7-dB-Range 0.39-dB-Error dB-Linear VGA Featuring –40 ∘C~110 ∘C and ±10%-Supply PVT Robustness in 40-Nm CMOS
IF 5.4 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2025-02-24 DOI: 10.1109/jssc.2025.3542071
Wen Zuo, Yun Wang, Sicheng Han, Yunhao Li, Wei Li, Yue Lin, Hongtao Xu
{"title":"A 2.4-GHz-BW 59.7-dB-Range 0.39-dB-Error dB-Linear VGA Featuring –40 ∘C~110 ∘C and ±10%-Supply PVT Robustness in 40-Nm CMOS","authors":"Wen Zuo, Yun Wang, Sicheng Han, Yunhao Li, Wei Li, Yue Lin, Hongtao Xu","doi":"10.1109/jssc.2025.3542071","DOIUrl":"https://doi.org/10.1109/jssc.2025.3542071","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"49 1","pages":""},"PeriodicalIF":5.4,"publicationDate":"2025-02-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143486211","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
All-Digital Event-Based Vision Sensor With Multi-Event Generation for Motion/Vibration-Adaptive Detection
IF 5.4 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2025-02-21 DOI: 10.1109/jssc.2025.3536184
Houk Lee, Jinpyo Han, Junhee Cho, Heesung Lee, Jung-Hoon Chun, Seong-Jin Kim, Jaehyuk Choi
{"title":"All-Digital Event-Based Vision Sensor With Multi-Event Generation for Motion/Vibration-Adaptive Detection","authors":"Houk Lee, Jinpyo Han, Junhee Cho, Heesung Lee, Jung-Hoon Chun, Seong-Jin Kim, Jaehyuk Choi","doi":"10.1109/jssc.2025.3536184","DOIUrl":"https://doi.org/10.1109/jssc.2025.3536184","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"2 1","pages":""},"PeriodicalIF":5.4,"publicationDate":"2025-02-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143470770","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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