Aurojyoti Das, Qiuyang Lin, Yixiong Hu, Wim Sijbers, Eric Beamish, Chris Van Hoof, Georges Gielen, Nick Van Helleputte
{"title":"A 376-μW per-Channel, Drift-Tolerant Translocation Recording Frontend With Event Detection for Nanopore Sensor Arrays","authors":"Aurojyoti Das, Qiuyang Lin, Yixiong Hu, Wim Sijbers, Eric Beamish, Chris Van Hoof, Georges Gielen, Nick Van Helleputte","doi":"10.1109/jssc.2025.3570935","DOIUrl":"https://doi.org/10.1109/jssc.2025.3570935","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"29 1","pages":""},"PeriodicalIF":5.4,"publicationDate":"2025-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144164822","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"EMEP: Early-Monitoring Error Prediction for Activity and Variability Resilience in a 28-nm RISC-V Controller","authors":"Clara Nieto Taladriz, Wim Dehaene","doi":"10.1109/jssc.2025.3567294","DOIUrl":"https://doi.org/10.1109/jssc.2025.3567294","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"57 1","pages":"1-9"},"PeriodicalIF":5.4,"publicationDate":"2025-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144145974","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Multi-Band 5.3–18 GHz LNA for FR3 Bands Using Hybrid Switching With Sub-2 dB NF in FDSOI","authors":"Ahmed Afifi, Gabriel M. Rebeiz","doi":"10.1109/jssc.2025.3568823","DOIUrl":"https://doi.org/10.1109/jssc.2025.3568823","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"16 1","pages":"1-11"},"PeriodicalIF":5.4,"publicationDate":"2025-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144113835","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}