{"title":"IEEE Journal of Solid-State Circuits Information for Authors","authors":"","doi":"10.1109/JSSC.2025.3553585","DOIUrl":"https://doi.org/10.1109/JSSC.2025.3553585","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"60 4","pages":"C3-C3"},"PeriodicalIF":4.6,"publicationDate":"2025-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10943277","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143716408","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Guest Editorial Introduction to the Special Issue on the 2024 Symposium on VLSI Circuits","authors":"Ron Kapusta;Sugako Otani","doi":"10.1109/JSSC.2025.3545371","DOIUrl":"https://doi.org/10.1109/JSSC.2025.3545371","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"60 4","pages":"1129-1131"},"PeriodicalIF":4.6,"publicationDate":"2025-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10943276","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143716418","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Mo’men Mansour, D. Shane Smith, Michael Kines, Samuel Ellicott, Trevor Dean, Vipul J. Patel, Waleed Khalil
{"title":"A Dynamic Voltage-, Frequency-, and Resolution-Scalable (DVFRS) 8-10 b 12.5-to-734 MS/s Non-Interleaved SAR ADC With 0.8-to-5.9 fJ/conv-Step in 22-nm FDSOI","authors":"Mo’men Mansour, D. Shane Smith, Michael Kines, Samuel Ellicott, Trevor Dean, Vipul J. Patel, Waleed Khalil","doi":"10.1109/jssc.2025.3550448","DOIUrl":"https://doi.org/10.1109/jssc.2025.3550448","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"57 1","pages":""},"PeriodicalIF":5.4,"publicationDate":"2025-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143702680","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Matthew R. Belz, Zhengqi Xu, Hsiang-Wen Chen, Seungheun Song, Michael P. Flynn
{"title":"A Digital-Sampling PLL With a Second-Order Noise Shaping SAR ADC Phase Detector","authors":"Matthew R. Belz, Zhengqi Xu, Hsiang-Wen Chen, Seungheun Song, Michael P. Flynn","doi":"10.1109/jssc.2025.3549690","DOIUrl":"https://doi.org/10.1109/jssc.2025.3549690","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"27 1","pages":""},"PeriodicalIF":5.4,"publicationDate":"2025-03-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143672435","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}