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IEEE Journal of Solid-state Circuits最新文献

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A 10.1-ENOB 8kHz Bandwidth 95–250nW PVT-Robust DT Level-Crossing ADC for Sparse and Generic Signals 一种用于稀疏和通用信号的10.1-ENOB 8kHz带宽95-250nW pvt -鲁棒DT平交ADC
IF 5.4 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2026-04-27 DOI: 10.1109/jssc.2026.3683078
Jixuan Mou, Pieter Harpe, Alessandro Saccon, Eugenio Cantatore, Marco Fattori
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引用次数: 0
A 28-nm System-in-One-Macro Computing-in-Memory Chip Utilizing Leakage-Eliminated 2T1C and Capacitor-Over-Logic 1T1C eDRAM 采用无泄漏2T1C和电容过逻辑1T1C eDRAM的28纳米单宏内存计算芯片
IF 5.4 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2026-04-24 DOI: 10.1109/jssc.2026.3684971
Zhihang Qian, Zhaori Cong, Shengzhe Yan, Zeyu Guo, Zhuoyu Dai, Yifan He, Wenyu Sun, Chunmeng Dou, Feng Zhang, Di Geng, Jinshan Yue, Yongpan Liu, Qi Liu, Ming Liu
{"title":"A 28-nm System-in-One-Macro Computing-in-Memory Chip Utilizing Leakage-Eliminated 2T1C and Capacitor-Over-Logic 1T1C eDRAM","authors":"Zhihang Qian, Zhaori Cong, Shengzhe Yan, Zeyu Guo, Zhuoyu Dai, Yifan He, Wenyu Sun, Chunmeng Dou, Feng Zhang, Di Geng, Jinshan Yue, Yongpan Liu, Qi Liu, Ming Liu","doi":"10.1109/jssc.2026.3684971","DOIUrl":"https://doi.org/10.1109/jssc.2026.3684971","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"58 1","pages":""},"PeriodicalIF":5.4,"publicationDate":"2026-04-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147739696","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Editorial New Associate Editor 新任副主编
IF 5.4 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2026-04-24 DOI: 10.1109/jssc.2026.3676712
Boris Murmann
{"title":"Editorial New Associate Editor","authors":"Boris Murmann","doi":"10.1109/jssc.2026.3676712","DOIUrl":"https://doi.org/10.1109/jssc.2026.3676712","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"5 1","pages":""},"PeriodicalIF":5.4,"publicationDate":"2026-04-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147739698","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A MEMS-Free 4096-Pixel CMOS E-Nose Array With MOF-Based Molecular Selectivity, In-Pixel Thermal Regeneration, and a Compact Single-Coefficient Bandpass Sigma–Delta ADC 一种无mems的4096像素CMOS电子鼻阵列，具有基于mof的分子选择性、像元内热再生和紧凑的单系数带通Sigma-Delta ADC
IF 5.4 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2026-04-24 DOI: 10.1109/jssc.2026.3685410
Marco Saif, Adam Y. Wang, Shao-Wei Lo, Fuze Jiang, Zhikai Huang, Jiachen Wang, Hangxing Liu, Chih-Jen Shih, Thomas Burger, Hua Wang
{"title":"A MEMS-Free 4096-Pixel CMOS E-Nose Array With MOF-Based Molecular Selectivity, In-Pixel Thermal Regeneration, and a Compact Single-Coefficient Bandpass Sigma–Delta ADC","authors":"Marco Saif, Adam Y. Wang, Shao-Wei Lo, Fuze Jiang, Zhikai Huang, Jiachen Wang, Hangxing Liu, Chih-Jen Shih, Thomas Burger, Hua Wang","doi":"10.1109/jssc.2026.3685410","DOIUrl":"https://doi.org/10.1109/jssc.2026.3685410","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"54 1","pages":""},"PeriodicalIF":5.4,"publicationDate":"2026-04-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147739697","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Journal of Solid-State Circuits Publication Information IEEE固态电路杂志出版信息
IF 5.4 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2026-04-24 DOI: 10.1109/jssc.2026.3681987
{"title":"IEEE Journal of Solid-State Circuits Publication Information","authors":"","doi":"10.1109/jssc.2026.3681987","DOIUrl":"https://doi.org/10.1109/jssc.2026.3681987","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"4 1","pages":""},"PeriodicalIF":5.4,"publicationDate":"2026-04-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147739699","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Guest Editorial Introduction to the Special Section on the 2025 RFIC Symposium 2025年RFIC专题研讨会特邀编辑导言
IF 5.4 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2026-04-24 DOI: 10.1109/jssc.2026.3678478
Omeed Momeni
{"title":"Guest Editorial Introduction to the Special Section on the 2025 RFIC Symposium","authors":"Omeed Momeni","doi":"10.1109/jssc.2026.3678478","DOIUrl":"https://doi.org/10.1109/jssc.2026.3678478","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"26 1","pages":""},"PeriodicalIF":5.4,"publicationDate":"2026-04-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147739592","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A 16-MHz CMOS RC Frequency Reference Achieving Accuracies of ±125 ppm From −40 °C to 85 °C and −560/+580 ppm After Accelerated Aging 16 mhz CMOS RC频率基准，在- 40°C至85°C范围内实现±125 ppm的精度，加速老化后实现- 560/+580 ppm的精度
IF 5.4 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2026-04-21 DOI: 10.1109/jssc.2026.3684094
Runtao Huo, Weihao Jie, Yiwen Zhang, Honglan Jiang, Hui Wang
{"title":"A 16-MHz CMOS RC Frequency Reference Achieving Accuracies of ±125 ppm From −40 °C to 85 °C and −560/+580 ppm After Accelerated Aging","authors":"Runtao Huo, Weihao Jie, Yiwen Zhang, Honglan Jiang, Hui Wang","doi":"10.1109/jssc.2026.3684094","DOIUrl":"https://doi.org/10.1109/jssc.2026.3684094","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"15 1","pages":""},"PeriodicalIF":5.4,"publicationDate":"2026-04-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147731888","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An 18.3- μ W 108.3-dB DR Discrete-Time Delta-Sigma Modulator Using a Loop Filter Auto-Shift Technique 基于环路滤波自动移位技术的18.3 μ W 108.3 db DR离散时间δ - σ调制器
IF 5.4 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2026-04-21 DOI: 10.1109/jssc.2026.3684106
Cong Wei, Ziqiang Peng, Lijie Huang, Jinze Lai, Rongshan Wei, Xiaoqiang Lu, Zhichao Tan
{"title":"An 18.3- μ W 108.3-dB DR Discrete-Time Delta-Sigma Modulator Using a Loop Filter Auto-Shift Technique","authors":"Cong Wei, Ziqiang Peng, Lijie Huang, Jinze Lai, Rongshan Wei, Xiaoqiang Lu, Zhichao Tan","doi":"10.1109/jssc.2026.3684106","DOIUrl":"https://doi.org/10.1109/jssc.2026.3684106","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"55 1","pages":""},"PeriodicalIF":5.4,"publicationDate":"2026-04-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147731890","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A 40k-Pixel Multimodal Biophysiology Monitoring Platform With 10k Concurrent Electrophysiology Channels and a Mixer-Embedded Σ Δ Impedance Sensor 40k像素多模态生物生理监测平台，具有10k并发电生理通道和嵌入式混频器Σ Δ阻抗传感器
IF 5.4 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2026-04-21 DOI: 10.1109/jssc.2026.3684715
Hangxing Liu, Fuze Jiang, Jingjing Zang, Marco Saif, Thomas Burger, Stephan C. F. Neuhauss, Hua Wang
{"title":"A 40k-Pixel Multimodal Biophysiology Monitoring Platform With 10k Concurrent Electrophysiology Channels and a Mixer-Embedded Σ Δ Impedance Sensor","authors":"Hangxing Liu, Fuze Jiang, Jingjing Zang, Marco Saif, Thomas Burger, Stephan C. F. Neuhauss, Hua Wang","doi":"10.1109/jssc.2026.3684715","DOIUrl":"https://doi.org/10.1109/jssc.2026.3684715","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"22 1","pages":""},"PeriodicalIF":5.4,"publicationDate":"2026-04-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147731889","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A 16× Interleaved 32-GS/s 8b Hybrid ADC With Self-Tracking Inter-Stage Gain Achieving 44.3-dB SFDR at 20.9-GHz Input 具有自跟踪级间增益的16×交错32-GS/s 8b混合ADC，在20.9 ghz输入下实现44.3 db SFDR
IF 5.4 1区 工程技术
IEEE Journal of Solid-state Circuits Pub Date : 2026-04-17 DOI: 10.1109/jssc.2026.3680919
Hongzhi Liang, Jun Chang, Yixiao Luo, Li Dang, Haolin Han, Yi Shen, Dengquan Li, Shubin Liu, Ruixue Ding, Zhangming Zhu
{"title":"A 16× Interleaved 32-GS/s 8b Hybrid ADC With Self-Tracking Inter-Stage Gain Achieving 44.3-dB SFDR at 20.9-GHz Input","authors":"Hongzhi Liang, Jun Chang, Yixiao Luo, Li Dang, Haolin Han, Yi Shen, Dengquan Li, Shubin Liu, Ruixue Ding, Zhangming Zhu","doi":"10.1109/jssc.2026.3680919","DOIUrl":"https://doi.org/10.1109/jssc.2026.3680919","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"66 1","pages":""},"PeriodicalIF":5.4,"publicationDate":"2026-04-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147708975","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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