{"title":"IEEE Transactions on Components, Packaging and Manufacturing Technology Publication Information","authors":"","doi":"10.1109/TCPMT.2025.3602195","DOIUrl":"https://doi.org/10.1109/TCPMT.2025.3602195","url":null,"abstract":"","PeriodicalId":13085,"journal":{"name":"IEEE Transactions on Components, Packaging and Manufacturing Technology","volume":"15 9","pages":"C2-C2"},"PeriodicalIF":3.0,"publicationDate":"2025-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11165616","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145100318","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Foreword: Special Section on Advances in Design, Modeling, and Simulation Methodologies for Modern Chip-Package-System Integration","authors":"Antonio Maffucci;Mihai Telescu","doi":"10.1109/TCPMT.2025.3598876","DOIUrl":"https://doi.org/10.1109/TCPMT.2025.3598876","url":null,"abstract":"","PeriodicalId":13085,"journal":{"name":"IEEE Transactions on Components, Packaging and Manufacturing Technology","volume":"15 9","pages":"1812-1813"},"PeriodicalIF":3.0,"publicationDate":"2025-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11165608","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145100430","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"IEEE Transactions on Components, Packaging and Manufacturing Technology Society Information","authors":"","doi":"10.1109/TCPMT.2025.3602199","DOIUrl":"https://doi.org/10.1109/TCPMT.2025.3602199","url":null,"abstract":"","PeriodicalId":13085,"journal":{"name":"IEEE Transactions on Components, Packaging and Manufacturing Technology","volume":"15 9","pages":"C3-C3"},"PeriodicalIF":3.0,"publicationDate":"2025-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11165615","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145073333","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"IEEE Transactions on Components, Packaging and Manufacturing Technology Information for Authors","authors":"","doi":"10.1109/TCPMT.2025.3602197","DOIUrl":"https://doi.org/10.1109/TCPMT.2025.3602197","url":null,"abstract":"","PeriodicalId":13085,"journal":{"name":"IEEE Transactions on Components, Packaging and Manufacturing Technology","volume":"15 9","pages":"2053-2053"},"PeriodicalIF":3.0,"publicationDate":"2025-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11165613","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145073374","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"IEEE Transactions on Components, Packaging and Manufacturing Technology Publication Information","authors":"","doi":"10.1109/TCPMT.2025.3593032","DOIUrl":"https://doi.org/10.1109/TCPMT.2025.3593032","url":null,"abstract":"","PeriodicalId":13085,"journal":{"name":"IEEE Transactions on Components, Packaging and Manufacturing Technology","volume":"15 8","pages":"C2-C2"},"PeriodicalIF":3.0,"publicationDate":"2025-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11134682","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144891049","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"IEEE Transactions on Components, Packaging and Manufacturing Technology Society Information","authors":"","doi":"10.1109/TCPMT.2025.3593037","DOIUrl":"https://doi.org/10.1109/TCPMT.2025.3593037","url":null,"abstract":"","PeriodicalId":13085,"journal":{"name":"IEEE Transactions on Components, Packaging and Manufacturing Technology","volume":"15 8","pages":"C3-C3"},"PeriodicalIF":3.0,"publicationDate":"2025-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11134681","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144892375","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Foreword: Frontiers of Photonic Integration and Packaging","authors":"Hiren D. Thacker;Stéphane Bernabé;Richard Pitwon","doi":"10.1109/TCPMT.2025.3591951","DOIUrl":"https://doi.org/10.1109/TCPMT.2025.3591951","url":null,"abstract":"","PeriodicalId":13085,"journal":{"name":"IEEE Transactions on Components, Packaging and Manufacturing Technology","volume":"15 8","pages":"1562-1564"},"PeriodicalIF":3.0,"publicationDate":"2025-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11134684","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144891281","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Stable HIPPO-Based Circuit Macro-Modeling","authors":"Bijan Shahriari;Roni Khazaka","doi":"10.1109/TCPMT.2025.3597811","DOIUrl":"https://doi.org/10.1109/TCPMT.2025.3597811","url":null,"abstract":"Behavioral modeling of analog circuits is an important step of the integrated circuit design flow. Indeed, closed-box behavior modeling allows users to replicate the behavior of circuit elements and devices without explicitly knowing the inner workings of the device. Prior works have automated the generation of behavioral models using machine learning (ML) at both the device and circuit level. More specifically, a recent work has used high-order polynomial projection operators (HIPPOs) to augment gated recurrent unit (GRU)-based macro-models. This new HIPPO-based model has been shown to outperform state-of-the-art GRU-based circuit macro-models. In this article, we introduce a new type of modified recurrent neural network (RNN) circuit macro-model that uses the HIPPO framework, called HIPPO-RNN. Additionally, we present a modified HIPPO-RNN (stable-HIPPO-RNN) model that is more suitable for enforcing input-to-state stability (ISS), and derive corresponding stability constraints. These constraints effectively guarantee ISS stability of the macro-model during transient simulation. We show the validity and superior performance of our macro-models on two circuit modeling examples.","PeriodicalId":13085,"journal":{"name":"IEEE Transactions on Components, Packaging and Manufacturing Technology","volume":"15 9","pages":"1823-1835"},"PeriodicalIF":3.0,"publicationDate":"2025-08-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145100491","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Antonio Carlucci;Ion Victor Gosea;Stefano Grivet-Talocia
{"title":"On the Generation of SPICE-Compatible Nonlinear Behavioral Macromodels","authors":"Antonio Carlucci;Ion Victor Gosea;Stefano Grivet-Talocia","doi":"10.1109/TCPMT.2025.3597771","DOIUrl":"https://doi.org/10.1109/TCPMT.2025.3597771","url":null,"abstract":"This article presents a complete framework for the generation of behavioral macromodels of a wide class of nonlinear components, devices, and systems. The model structure and related identification algorithms are based on the Volterra series formulated in the frequency domain through multivariate generalized transfer functions (GTFs). A multivariate rational model is first estimated in pole-residue form from sampled responses and then converted to a bilinear state-space form. The main novel contribution of this work is the SPICE-compatible circuit synthesis, which enables the usage of nonlinear macromodels within circuit simulation environments as part of more complex system-level simulations. Examples are provided for a low dropout voltage regulator and a system-level power distribution network embedding integrated regulators. For such examples, the proposed SPICE equivalents offer speedup factors ranging from <inline-formula> <tex-math>$12times $ </tex-math></inline-formula> up to <inline-formula> <tex-math>$650times $ </tex-math></inline-formula> with negligible loss in accuracy.","PeriodicalId":13085,"journal":{"name":"IEEE Transactions on Components, Packaging and Manufacturing Technology","volume":"15 9","pages":"1857-1867"},"PeriodicalIF":3.0,"publicationDate":"2025-08-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145100296","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Til Hillebrecht;Tommy Weber;Johannes Alfert;Christian Schuster
{"title":"Relational SI/PI-Database for a Data-Driven Approach to PCB Design Automation and Performance Prediction","authors":"Til Hillebrecht;Tommy Weber;Johannes Alfert;Christian Schuster","doi":"10.1109/TCPMT.2025.3597840","DOIUrl":"https://doi.org/10.1109/TCPMT.2025.3597840","url":null,"abstract":"The introduction of machine learning (ML) methods into the design process of printed circuit boards (PCBs) drives the need for large quantities of readily available data. This article addresses the problems of engineers to find ML-ready data that can be easily reused and combined to enhance PCB design by storing the defining parameters in a normalized format within a relational database. It implements search and filter functions to obtain relevant data quickly. The database contains data that were used to address a variety of different signal integrity (SI)- and power integrity (PI)-related problems. Details of the database structure, necessary data conversion steps, currently stored datasets, and a statistical analysis thereof are described. This database is capable of being automated to a degree that ML agents can interact with it.","PeriodicalId":13085,"journal":{"name":"IEEE Transactions on Components, Packaging and Manufacturing Technology","volume":"15 9","pages":"1847-1856"},"PeriodicalIF":3.0,"publicationDate":"2025-08-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145100443","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}