Chun-Yu Lin, Juinn-Dar Huang, Hailong Yao, Tsung-Yi Ho
{"title":"A Comprehensive Security System for Digital Microfluidic Biochips","authors":"Chun-Yu Lin, Juinn-Dar Huang, Hailong Yao, Tsung-Yi Ho","doi":"10.1109/ITC-ASIA.2018.00036","DOIUrl":"https://doi.org/10.1109/ITC-ASIA.2018.00036","url":null,"abstract":"Digital microfluidic biochips (DMFBs) have become popular in the healthcare industry recently because of its lowcost, high-throughput, and portability. Users can execute the experiments on biochips with high resolution, and the biochips market therefore grows significantly. However, malicious attackers exploit Intellectual Property (IP) piracy and Trojan attacks to gain illegal profits. The conventional approaches present defense mechanisms that target either IP piracy or Trojan attacks. In practical, DMFBs may suffer from the threat of being attacked by these two attacks at the same time. This paper presents a comprehensive security system to protect DMFBs from IP piracy and Trojan attacks. We propose an authentication mechanism to protect IP and detect errors caused by Trojans with CCD cameras. By our security system, we could generate secret keys for authentication and determine whether the bioassay is under the IP piracy and Trojan attacks. Experimental results demonstrate the efficacy of our security system without overhead of the bioassay completion time.","PeriodicalId":129553,"journal":{"name":"2018 IEEE International Test Conference in Asia (ITC-Asia)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123633492","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"[Publisher's information]","authors":"","doi":"10.1109/itc-asia.2018.00038","DOIUrl":"https://doi.org/10.1109/itc-asia.2018.00038","url":null,"abstract":"","PeriodicalId":129553,"journal":{"name":"2018 IEEE International Test Conference in Asia (ITC-Asia)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125089996","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"[Title page i]","authors":"","doi":"10.1109/itc-asia.2018.00001","DOIUrl":"https://doi.org/10.1109/itc-asia.2018.00001","url":null,"abstract":"","PeriodicalId":129553,"journal":{"name":"2018 IEEE International Test Conference in Asia (ITC-Asia)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129082109","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A No-Reference Error-Tolerability Test Methodology for Image Processing Applications","authors":"Tong-Yu Hsieh, Chao-Ru Chen","doi":"10.1109/itc-asia.2018.00033","DOIUrl":"https://doi.org/10.1109/itc-asia.2018.00033","url":null,"abstract":"Error-tolerance is a notion that can extend the lifetime of a system, especially for multimedia applications. In this paper we present a no-reference error-tolerability test methodology for image processing applications. No reference images are needed in this methodology for comparison with the images under test. As a result, the hardware that is usually needed in conventional on-line test methods for generating reference data can be totally eliminated. This greatly facilitates developing on-line error-tolerability test procedures for reliability concerns. Compared with the previous error-tolerability test work in the literature, this work is the first one that can test error-tolerability of images by using a no-reference manner. In this work we develop a particular attribute and the corresponding acquiring method that can effectively quantify acceptability of errors. In particular, the proposed methodology can be adaptively re-configured according to the characteristics of the target image so as to achieve high test accuracy. We also employ 126,894 images to generally evaluate the effectiveness of the proposed test methodology. The experimental results show that up to 93.39% test accuracy is achieved on average by the proposed methodology.","PeriodicalId":129553,"journal":{"name":"2018 IEEE International Test Conference in Asia (ITC-Asia)","volume":"76 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130009322","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Tara Ghasempouri, Siavoosh Payandeh Azad, Behrad Niazmand, J. Raik
{"title":"An Automatic Approach to Evaluate Assertions' Quality Based on Data-Mining Metrics","authors":"Tara Ghasempouri, Siavoosh Payandeh Azad, Behrad Niazmand, J. Raik","doi":"10.1109/ITC-ASIA.2018.00021","DOIUrl":"https://doi.org/10.1109/ITC-ASIA.2018.00021","url":null,"abstract":"The effectiveness of Assertion-Based Verification (ABV) depends on the quality of assertions. Assertions can be manually or automatically generated. In both cases assertion generation is error prone and needs high expertise. Moreover, the number of generated assertions is generally too large. Thus, assertion qualification is necessary to evaluate the quality of generated assertions to assist verification engineers to select only the highest quality assertions for systems' verification. Most of the current works for assertion qualification are based on fault injection analysis, which requires long simulation time. To fill in the gap, this work proposes a new automatic data mining-based approach for assertions already defined for a design, which in contrast to the state-of-the-art can evaluate assertions' quality precisely within a very short simulation time. Experimental results support the benefit of the proposed methodology.","PeriodicalId":129553,"journal":{"name":"2018 IEEE International Test Conference in Asia (ITC-Asia)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122576788","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"DVFS Binning Using Machine-Learning Techniques","authors":"Keng-Wei Chang, Chun-Yang Huang, Szu-Pang Mu, Jian-Min Huang, Shi-Hao Chen, M. Chao","doi":"10.1109/ITC-ASIA.2018.00016","DOIUrl":"https://doi.org/10.1109/ITC-ASIA.2018.00016","url":null,"abstract":"This paper presents a framework which can avoid the lengthy system test by utilizing machine-learning techniques to classify parts into different DVFS bins based on the results collected at CP and FT test only. The core machine-learning techniques in use are Bayesian linear regression for model fitting and stepwise regression for feature selection. Another method, called the incremental F_max-model search, is also presented to reduce the test time of collecting the required data for each training sample. The experiments are conducted based on 249 test chips of an industrial SoC. The experimental results demonstrate that our proposed framework can achieve a high accuracy ratio of placing a part into correct DVFS bin without placing any slower part into a faster DVFS bin. The experimental results also demonstrate that the incremental F_max-model search can save 45.1% and 52.6% of applications of the system-level test compared to the conventional median linear search and binary search, respectively.","PeriodicalId":129553,"journal":{"name":"2018 IEEE International Test Conference in Asia (ITC-Asia)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128730831","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"[Copyright notice]","authors":"","doi":"10.1109/itc-asia.2018.00003","DOIUrl":"https://doi.org/10.1109/itc-asia.2018.00003","url":null,"abstract":"","PeriodicalId":129553,"journal":{"name":"2018 IEEE International Test Conference in Asia (ITC-Asia)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121829316","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}