{"title":"[Publisher's information]","authors":"","doi":"10.1109/itc-asia.2018.00038","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":129553,"journal":{"name":"2018 IEEE International Test Conference in Asia (ITC-Asia)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE International Test Conference in Asia (ITC-Asia)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/itc-asia.2018.00038","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}