2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm)最新文献_第3页

Single and multi-spot current density distribution 单点和多点电流密度分布

2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm) Pub Date : 2016-10-01 DOI: 10.1109/HOLM.2016.7780014

R. Malucci

{"title":"Single and multi-spot current density distribution","authors":"R. Malucci","doi":"10.1109/HOLM.2016.7780014","DOIUrl":"https://doi.org/10.1109/HOLM.2016.7780014","url":null,"abstract":"This paper provides an analysis of the current density distribution in a single circular contact spot for cases that represents geometrical configurations that are closer to what occurs in real contacting members. In the past, flat contact spots have been used to estimate current density distributions for single circular spots by assuming that bridge conditions do not exist. However, the bridge condition changes the current density at the edge of the contact spot. With no bridge, the mixed boundary conditions for voltage and electric field lie in a plane and give rise to infinite current densities at the edge of the contact spot. In the present paper, when bridge geometries exist, it was found the mixed boundary conditions do not lie in a plane and give rise to finite current densities at the edges. In this work, electromagnetic theory was used to calculate the current density distribution that occurs for bridge geometries. These results are subsequently compared to the traditional results that are often used in analyses and show as the slope of the bridge increases, the current density at the edge decreases to finite values. In addition, it was seen that as the slope increases the current density tends to even out across the contact spot. Consequently, it is seen that the bridge condition at the contact spot may impact the degradation rate for current density driven mechanisms such as electro-migration. In addition, to complete the picture, the impact on average current density in individual spots is reviewed regarding the effects of spot size and position in the contact region.","PeriodicalId":117231,"journal":{"name":"2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134452185","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

A study on axial vibration-induced fretting corrosion in electrical connector pair 电连接器副轴向振动微动腐蚀研究

2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm) Pub Date : 2016-10-01 DOI: 10.1109/HOLM.2016.7780023

Fuxi Zhang, G. Flowers, R. Dean, J. Suhling, Jinchun Gao

引用次数: 5

The repulsion or blow-off force between closed contacts carrying current 承载电流的闭合触点之间的斥力或吹离力

2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm) Pub Date : 2016-10-01 DOI: 10.1109/HOLM.2016.7780025

P. Slade, E. Taylor

引用次数: 10

Simple 1D model of a short gap DC electric arc in in aeronautical pressure conditions 航空压力条件下短间隙直流电弧的简单一维模型

2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm) Pub Date : 2016-10-01 DOI: 10.1109/HOLM.2016.7780029

R. Boukadoum, A. Barbet, P. Dessante, R. Landfried, T. Leblanc, P. Teste

{"title":"Simple 1D model of a short gap DC electric arc in in aeronautical pressure conditions","authors":"R. Boukadoum, A. Barbet, P. Dessante, R. Landfried, T. Leblanc, P. Teste","doi":"10.1109/HOLM.2016.7780029","DOIUrl":"https://doi.org/10.1109/HOLM.2016.7780029","url":null,"abstract":"In the next few years the electrical power embedded in future aircrafts will strongly increase. The supply voltage will increase to 230 VAC and ± 270 VDC or 540 VDC; thereby studies concerning the embedded equipment behavior must be done. For such power networks characteristics the risk of arc fault and requirements for arc tracking will also increase. The aim of this work is to propose a simple 1D model of a DC short gap electric arc in aeronautical pressure conditions: i.e. a pressure in the range [10 mbar–1 bar] which corresponds to the aircrafts altitudes. By emitting certain assumptions, the approach is to find the temperature distribution in the arc column and deduce from that the characteristics of the arc current as a function of electric field in the column and the maximum temperature in the center of the arc column. The novelty of this work is the observation of the evolution of the temperature (and as a consequence the evolution of the arc current) if we assume that the radius of the arc column is not limited like in wall stabilized arc where the wall is water cooled, the arc radius can expand as much as possible. The study is done in the air.","PeriodicalId":117231,"journal":{"name":"2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm)","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114077401","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Break arc duration characteristics of AgSnO2 contacts under magnetic field application with contact opening speeds in the range up to 200mm/s in DC load conditions 直流负载条件下，磁场作用下触点开断速度可达200mm/s的AgSnO2触点断弧持续时间特性

2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm) Pub Date : 2016-10-01 DOI: 10.1109/HOLM.2016.7780018

M. Hasegawa, S. Tokumitsu

引用次数: 8

Microstructure of fretting debris on tin-plated terminals 镀锡端子微动碎屑的微观结构

2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm) Pub Date : 2016-10-01 DOI: 10.1109/HOLM.2016.7780022

K. Mashimo, S. Yamazaki, Atsushi Shimoyamada, H. Nishikubo, Y. Hori, H. Sasaki

{"title":"Microstructure of fretting debris on tin-plated terminals","authors":"K. Mashimo, S. Yamazaki, Atsushi Shimoyamada, H. Nishikubo, Y. Hori, H. Sasaki","doi":"10.1109/HOLM.2016.7780022","DOIUrl":"https://doi.org/10.1109/HOLM.2016.7780022","url":null,"abstract":"Observations of sliced cross sections after sliding was made with a scanning transmission electron microscope (STEM). The sliced samples were picked from the fretting debris on the surface of specimens. Recently, high-angle annular dark-field STEM (HAADF STEM) technology has been significantly advanced [5-7]. The resolution is sufficiently fine to distinguish sub — angstrom structures, because of the improvement in convergence of electron beam. In dark — field images, the brightness contrast owing to the difference between the masses of two elements is clearly recognized. Thus, the electrical contact resistance after sliding might be estimated based on these observations. The authors have built a three-dimensional resistance-calculation model based on STEM observations. Presently, the observations are two-dimensional; therefore, the three-dimensional structure is built from discrete images with interpolation. The comparison of calculations and measurements is agreeable. The oxygen vacancies in SnO2 cannot be directly measured because of its low density. Though we can obtain the consistency of vacancies from the measurement of carrier density indirectly, this still adds uncertainty to the contact resistance simulation [4].","PeriodicalId":117231,"journal":{"name":"2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117068359","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

An analysis of generated fractal and measured rough surfaces 生成的分形和测量的粗糙表面的分析

2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm) Pub Date : 2016-10-01 DOI: 10.1109/HOLM.2016.7780031

Xiaohan Zhang, Yang Xu, R. Jackson

{"title":"An analysis of generated fractal and measured rough surfaces","authors":"Xiaohan Zhang, Yang Xu, R. Jackson","doi":"10.1109/HOLM.2016.7780031","DOIUrl":"https://doi.org/10.1109/HOLM.2016.7780031","url":null,"abstract":"This work studies the fractal dimensions of rough surfaces as calculated by several existing methods on measured and generated surface profiles. Two methods for generating rough surfaces are used in this work. The first one is to reconstruct the rough surface through the inverse Fourier transform based on a prescribed Power Spectrum Density (PSD) and the other one is using the Weierstrass-Mandelbrot (W-M) function. The fractal dimension values of all the rough surfaces are calculated by four different methods, namely, (1) the box-counting method, (2) the roughness-length method, (3) the power spectral density method and (4) the variogram method. Then the results from these four methods are compared. Since fractal surfaces are always clarified either as self-similar (the scaling ratio is the same in all directions) or as self-affine (scaling ratio varies in prescribed fashion over scales), it can be found that the fractal dimension values are not the same after analyzing the generated self-similar rough surfaces by these two methods. The fractal dimension values for real rough surfaces, as well as other parameters, are also calculated by four different methods. The analysis indicates that real rough surfaces are not easily represented as perfect fractals as researchers and engineers often assume.","PeriodicalId":117231,"journal":{"name":"2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128864192","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 9

Sliding friction, wear and tribofilm formation of silver films electro-plated on copper alloy sheets 铜合金片上电镀银膜的滑动摩擦、磨损及摩擦膜的形成

2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm) Pub Date : 2016-10-01 DOI: 10.1109/HOLM.2016.7780021

Song-Zhu Kure-Chu, Rie Nakagawa, T. Ogasawara, H. Yashiro, S. Sawada, A. Shimizu, Y. Saitoh

{"title":"Sliding friction, wear and tribofilm formation of silver films electro-plated on copper alloy sheets","authors":"Song-Zhu Kure-Chu, Rie Nakagawa, T. Ogasawara, H. Yashiro, S. Sawada, A. Shimizu, Y. Saitoh","doi":"10.1109/HOLM.2016.7780021","DOIUrl":"https://doi.org/10.1109/HOLM.2016.7780021","url":null,"abstract":"This study is aimed at clarifying the mechanism of wear process for Ag plating through a one-way sliding wear test. The samples of different hardness Ag plating on copper alloys were prepared as coupon and embossment specimens, which simulated terminal contacts. During the sliding test, the contact resistance and the friction coefficient are measured. The surface and cross-section morphologies, roughness, tribo-film formation, and wear volume of the Ag films after wear tests were investigated and the wear mechanism was discussed. As results, the hard Ag plating film (120 Hv) exhibited higher contact resistance comparing to the soft Ag plating film (80 Hv). The soft Ag film delivered a larger wear scar on embossment and wider wear trace on coupon specimens compared to the hard one. The overall wear volume of hard Ag film was less than that of soft Ag film, which can be attributed to the fine crystalline structure of hard Ag. Moreover, the observation of tribofilms formed on the Ag films after wear tests suggested that a mixed-type of adhesive and abrasive wears occurred for both of soft and hard Ag films.","PeriodicalId":117231,"journal":{"name":"2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm)","volume":"184 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114957433","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 4

Electrical lifespan prediction of high-voltage direct-current relay based on arc charge accumulation 基于电弧电荷积累的高压直流继电器电气寿命预测

2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm) Pub Date : 2016-10-01 DOI: 10.1109/HOLM.2016.7780027

Cui Xinglei, Z. Xue, Chen Mo, Luo Fu-biao, Zhou Zhefeng

引用次数: 3

Experimental study on electric resistance of tilted contact in air circuit breaker 空气断路器倾斜触点电阻的实验研究

2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm) Pub Date : 2016-10-01 DOI: 10.1109/HOLM.2016.7780017

Jianyu Qu, Xingwen Li, Qian Wang

引用次数: 6