2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm)最新文献_第2页

Elastic-plastic axisymmetric sinusoidal surface asperity contact 弹塑性轴对称正弦表面凹凸接触

2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm) Pub Date : 2016-10-01 DOI: 10.1109/HOLM.2016.7780001

S. Saha, R. Jackson

{"title":"Elastic-plastic axisymmetric sinusoidal surface asperity contact","authors":"S. Saha, R. Jackson","doi":"10.1109/HOLM.2016.7780001","DOIUrl":"https://doi.org/10.1109/HOLM.2016.7780001","url":null,"abstract":"Closed-form finite-element empirical solutions are available for elastic-plastic spherical and sinusoidal contact. However, some of these models do not consider the effect of interaction with adjacent asperities or require extensive numerical resources because they employ a full 3-D model. The present work has considered these factors during modeling. The current finite element model (FEM) represents an axisymmetric elastic-plastic sinusoidal surface in contact with a rigid flat for a wide range of material properties and different values of the amplitude to wavelength ratio. The numerical results are compared with the existing elastic-plastic spherical contact model. Empirical equations are derived for the critical pressure at which two surface will reach complete contact. Complete contact occurs when there is no gap remaining between two contacting surfaces. An equation for the critical value of the amplitude of the sinusoidal asperity below which it will deform completely elastically from initial to complete contact is also established. The current study finds that for the cases which have amplitudes that fall below the critical value, and are elastic in nature, that the previously published perfectly elastic model can be used. The results are applicable for almost all kinds of metallic materials.","PeriodicalId":117231,"journal":{"name":"2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123731774","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 5

Simulation on dwell stage of arcs in bridge type contacts for high-voltage DC relay 高压直流继电器桥式触点电弧驻留阶段仿真

2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm) Pub Date : 2016-10-01 DOI: 10.1109/HOLM.2016.7780026

Kai Bo, Xue Zhou, G. Zhai, Xinlei Qiao

引用次数: 1

Human factors affecting bolted busbar reliability 影响螺栓式母线可靠性的人为因素

2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm) Pub Date : 2016-10-01 DOI: 10.1109/HOLM.2016.7780012

David M. Williams

引用次数: 5

Impact of the gas environment on the electric arc 气体环境对电弧的影响

2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm) Pub Date : 2016-10-01 DOI: 10.1109/HOLM.2016.7780019

D. Grogg, C. Schrank

引用次数: 6

Temperature rise in a load break switch 负载断开开关温升

2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm) Pub Date : 2016-10-01 DOI: 10.1109/HOLM.2016.7780006

E. Fjeld, W. Rondeel, M. Saxegaard

引用次数: 4

Study on contact spots of fractal rough surfaces based on three-dimensional Weierstrass-Mandelbrot function 基于三维Weierstrass-Mandelbrot函数的分形粗糙表面接触点研究

2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm) Pub Date : 2016-10-01 DOI: 10.1109/HOLM.2016.7780032

Junxing Chen, Fei Yang, K. Luo, Yi Wu, C. Niu, M. Rong

引用次数: 9

Single and multi-spot current density distribution 单点和多点电流密度分布

2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm) Pub Date : 2016-10-01 DOI: 10.1109/HOLM.2016.7780014

R. Malucci

{"title":"Single and multi-spot current density distribution","authors":"R. Malucci","doi":"10.1109/HOLM.2016.7780014","DOIUrl":"https://doi.org/10.1109/HOLM.2016.7780014","url":null,"abstract":"This paper provides an analysis of the current density distribution in a single circular contact spot for cases that represents geometrical configurations that are closer to what occurs in real contacting members. In the past, flat contact spots have been used to estimate current density distributions for single circular spots by assuming that bridge conditions do not exist. However, the bridge condition changes the current density at the edge of the contact spot. With no bridge, the mixed boundary conditions for voltage and electric field lie in a plane and give rise to infinite current densities at the edge of the contact spot. In the present paper, when bridge geometries exist, it was found the mixed boundary conditions do not lie in a plane and give rise to finite current densities at the edges. In this work, electromagnetic theory was used to calculate the current density distribution that occurs for bridge geometries. These results are subsequently compared to the traditional results that are often used in analyses and show as the slope of the bridge increases, the current density at the edge decreases to finite values. In addition, it was seen that as the slope increases the current density tends to even out across the contact spot. Consequently, it is seen that the bridge condition at the contact spot may impact the degradation rate for current density driven mechanisms such as electro-migration. In addition, to complete the picture, the impact on average current density in individual spots is reviewed regarding the effects of spot size and position in the contact region.","PeriodicalId":117231,"journal":{"name":"2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134452185","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Simple 1D model of a short gap DC electric arc in in aeronautical pressure conditions 航空压力条件下短间隙直流电弧的简单一维模型

2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm) Pub Date : 2016-10-01 DOI: 10.1109/HOLM.2016.7780029

R. Boukadoum, A. Barbet, P. Dessante, R. Landfried, T. Leblanc, P. Teste

{"title":"Simple 1D model of a short gap DC electric arc in in aeronautical pressure conditions","authors":"R. Boukadoum, A. Barbet, P. Dessante, R. Landfried, T. Leblanc, P. Teste","doi":"10.1109/HOLM.2016.7780029","DOIUrl":"https://doi.org/10.1109/HOLM.2016.7780029","url":null,"abstract":"In the next few years the electrical power embedded in future aircrafts will strongly increase. The supply voltage will increase to 230 VAC and ± 270 VDC or 540 VDC; thereby studies concerning the embedded equipment behavior must be done. For such power networks characteristics the risk of arc fault and requirements for arc tracking will also increase. The aim of this work is to propose a simple 1D model of a DC short gap electric arc in aeronautical pressure conditions: i.e. a pressure in the range [10 mbar–1 bar] which corresponds to the aircrafts altitudes. By emitting certain assumptions, the approach is to find the temperature distribution in the arc column and deduce from that the characteristics of the arc current as a function of electric field in the column and the maximum temperature in the center of the arc column. The novelty of this work is the observation of the evolution of the temperature (and as a consequence the evolution of the arc current) if we assume that the radius of the arc column is not limited like in wall stabilized arc where the wall is water cooled, the arc radius can expand as much as possible. The study is done in the air.","PeriodicalId":117231,"journal":{"name":"2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm)","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114077401","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Break arc duration characteristics of AgSnO2 contacts under magnetic field application with contact opening speeds in the range up to 200mm/s in DC load conditions 直流负载条件下，磁场作用下触点开断速度可达200mm/s的AgSnO2触点断弧持续时间特性

2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm) Pub Date : 2016-10-01 DOI: 10.1109/HOLM.2016.7780018

M. Hasegawa, S. Tokumitsu

引用次数: 8

Microstructure of fretting debris on tin-plated terminals 镀锡端子微动碎屑的微观结构

2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm) Pub Date : 2016-10-01 DOI: 10.1109/HOLM.2016.7780022

K. Mashimo, S. Yamazaki, Atsushi Shimoyamada, H. Nishikubo, Y. Hori, H. Sasaki

{"title":"Microstructure of fretting debris on tin-plated terminals","authors":"K. Mashimo, S. Yamazaki, Atsushi Shimoyamada, H. Nishikubo, Y. Hori, H. Sasaki","doi":"10.1109/HOLM.2016.7780022","DOIUrl":"https://doi.org/10.1109/HOLM.2016.7780022","url":null,"abstract":"Observations of sliced cross sections after sliding was made with a scanning transmission electron microscope (STEM). The sliced samples were picked from the fretting debris on the surface of specimens. Recently, high-angle annular dark-field STEM (HAADF STEM) technology has been significantly advanced [5-7]. The resolution is sufficiently fine to distinguish sub — angstrom structures, because of the improvement in convergence of electron beam. In dark — field images, the brightness contrast owing to the difference between the masses of two elements is clearly recognized. Thus, the electrical contact resistance after sliding might be estimated based on these observations. The authors have built a three-dimensional resistance-calculation model based on STEM observations. Presently, the observations are two-dimensional; therefore, the three-dimensional structure is built from discrete images with interpolation. The comparison of calculations and measurements is agreeable. The oxygen vacancies in SnO2 cannot be directly measured because of its low density. Though we can obtain the consistency of vacancies from the measurement of carrier density indirectly, this still adds uncertainty to the contact resistance simulation [4].","PeriodicalId":117231,"journal":{"name":"2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117068359","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2