Electrical lifespan prediction of high-voltage direct-current relay based on arc charge accumulation

Cui Xinglei, Z. Xue, Chen Mo, Luo Fu-biao, Zhou Zhefeng
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引用次数: 3

Abstract

Electrical lifespan prediction has always been one of the greatest challenges in switching apparatus. In this paper, a mathematical model based on arc charge accumulation from experiments is set up to predict the electrical lifespan of high-voltage direct-current (HVDC) relays. The electrical circuit condition is 270VDC/200A, resistive load. The contact pair is bridge-type and made of copper. Experiments are carried out with a parameter-adjustable device in similar with actual HVDC relay structure. The magnetic field flux density for arc blowing is controlled in the range of 40mT to 80mT. The arc current waveforms are acquired and the arc charge during each breaking operation is calculated. The arc charge is accumulated until it reaches threshold value, which is decided according to electrical lifespan test results of actual products. The relationship between the lifespan and the magnetic field flux density is constructed, which can be used for lifespan prediction.
基于电弧电荷积累的高压直流继电器电气寿命预测
电气寿命预测一直是开关器件面临的最大挑战之一。本文从实验结果出发,建立了基于电弧电荷积累的高压直流继电器寿命预测数学模型。电路条件为270VDC/200A,电阻性负载。接触对是桥式的,由铜制成。采用与实际高压直流继电器结构相似的参数可调装置进行了实验。吹弧的磁场磁通密度控制在40mT ~ 80mT范围内。获得了电弧电流波形,并计算了每次开断时的电弧电荷。电弧电荷累积直至达到阈值,阈值根据实际产品的电气寿命试验结果确定。建立了寿命与磁场磁通密度之间的关系,可用于寿命预测。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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