2011 IEEE AUTOTESTCON最新文献_第7页

Cost impact of automated acceptance testing of Electrical Ground Support Equipment for spacecraft testing 航天器地面电气支持设备自动化验收试验的成本影响

2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058769

Hien D. Nguyen, I. A. Miller

引用次数: 3

21st century strategies for minimizing cost of test ownership while maximizing availability and technology refresh for test and measurement assets 最小化测试所有权成本的21世纪策略，同时最大化测试和度量资产的可用性和技术更新

2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058734

T. Jamison, D. Lowenstein

引用次数: 1

Automated fiber optic cable endface field inspection technology 光纤电缆端面现场自动检测技术

2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058727

Abhjit Bhoite, N. Beke, Timothy Duffy, M. Moore, M. Torres

引用次数: 1

The test, usage and maintenance of power switching subsystems 电力交换子系统的测试、使用和维护

2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/MIM.2012.6263977

K. Paton

引用次数: 1

Anecdotal experiences on the value of limited environmental testing for the analysis of “No Fault Found” assemblies 关于有限环境测试对“无故障发现”组件分析价值的轶事经验

2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058733

Raymond White, Brian Richardson

引用次数: 1

Ontology-guided knowledge discovery of event sequences in maintenance data 维护数据中事件序列的本体引导知识发现

2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058745

M. Schuh, J. Sheppard, S. Strasser, R. Angryk, C. Izurieta

引用次数: 17

Software tools: A key component in the successful implementation of the ATML standards 软件工具:成功实现ATML标准的关键组件

2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058788

Ron Taylor

{"title":"Software tools: A key component in the successful implementation of the ATML standards","authors":"Ron Taylor","doi":"10.1109/AUTEST.2011.6058788","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058788","url":null,"abstract":"This paper examines the IEEE Automatic Test Markup Language (ATML) family of standards and some of the impediments which must be overcome to successfully implement these standards. The paper specifically focuses on how software tools can help alleviate these issues and increase the benefits of using these new standards in Automatic Test System (ATS) related applications. The ATML standards provide a common exchange format for test data adhering to the Extensible Markup Language (XML) standard. ATML promises to provide interoperability between tools and multiple test platforms through the standardization of common test related data. The ATML standards have now been published through the IEEE Standards Coordinating Committee 20 (SCC20) committee and are beginning to exhibit considerable interest in the ATS community and are now a requirement on some new Department of Defense (DoD) ATS programs. Different aspects of ATML related tools shall be discussed such as ATML Development tools which assist in the generation of ATML compliant instance files, new ATS related tools which use ATML data in their applications and the modification of existing ATS tools to utilize ATML Data. This paper also examines the work in progress of a Small Business Innovative Research (SBIR) Naval Air Systems Command (NAVAIR) sponsored program to develop ATML and test diagram tools. Utilizing ATML standards without the benefit of tools can be a labor-intensive, error-prone process, and requires an intimate knowledge of the ATML and XML standards. Employing the ATML standards on ATS programs promises to significantly reduce costs and schedule; the use of software tools are a key component in the success of these implementations and will help promote the use of ATML throughout the test industry.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123787199","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Remote Automatic Test Equipment software management - Information Assurance Vulnerability Alert management 远程自动测试设备软件管理-信息保障漏洞警报管理

2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058790

C. Koepping, Paul J. Rajcok, Christopher Yoon

引用次数: 1

Dynamic testing of an ADC for real application input 实际应用输入的ADC动态测试

2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058732

D. Mishra, R. Gamad

{"title":"Dynamic testing of an ADC for real application input","authors":"D. Mishra, R. Gamad","doi":"10.1109/AUTEST.2011.6058732","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058732","url":null,"abstract":"This paper presents a new approach for determination of nonlinearity and Effective Number of Bits (ENOB) of an Analog to Digital Converter (ADC) for application input. Many times the input to ADC in an application is other than standard signals such as sine wave or triangular wave. Parameters of ADC determined using dynamic testing with standard signals are not useful if input signals are different. Different sinusoidal components of application input can be determined by spectrum analyzer. Application input can be generated by downloading data points created by computer in an Arbitrary Waveform Generator (AWG). Differential Nonlinearity (DNL) of an ADC is determined using deviation of actual histogram from reference or ideal histogram. Further estimation of Integral Nonlinearity (INL) is done from summation of DNL. ENOB is determined by estimating ideal rms error and actual rms error. These rms errors are computed by taking difference of sampled ADC input value available in computer and corresponding ADC output. Simulation results for 5 and 8 bit ADCs are reported and experimental results for an actual 8 bit ADC are also reported.. Comparison of simulation results by proposed method is done for standard sine wave, triangular wave and application inputs. It is expected that this work will initiate research toward ADC testing using application input.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121768542","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Building hardware-in-the-loop communication test channels 构建硬件在环通信测试通道

2011 IEEE AUTOTESTCON Pub Date : 2011-09-01 DOI: 10.1109/AUTEST.2011.6058751

M. Lombardi

引用次数: 0