{"title":"关于有限环境测试对“无故障发现”组件分析价值的轶事经验","authors":"Raymond White, Brian Richardson","doi":"10.1109/AUTEST.2011.6058733","DOIUrl":null,"url":null,"abstract":"Electronic assemblies that fail on an aircraft often will not fail on a laboratory tester or will exhibit random and hard to pinpoint failures. This is a discussion of environmental testing types, why environmental testing is needed, and a brief review of several such assemblies and test systems and what extra environmental testing was performed to identify issues that were not identifiable under normal testing.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"120 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Anecdotal experiences on the value of limited environmental testing for the analysis of “No Fault Found” assemblies\",\"authors\":\"Raymond White, Brian Richardson\",\"doi\":\"10.1109/AUTEST.2011.6058733\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Electronic assemblies that fail on an aircraft often will not fail on a laboratory tester or will exhibit random and hard to pinpoint failures. This is a discussion of environmental testing types, why environmental testing is needed, and a brief review of several such assemblies and test systems and what extra environmental testing was performed to identify issues that were not identifiable under normal testing.\",\"PeriodicalId\":110721,\"journal\":{\"name\":\"2011 IEEE AUTOTESTCON\",\"volume\":\"120 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-10-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 IEEE AUTOTESTCON\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2011.6058733\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2011.6058733","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Anecdotal experiences on the value of limited environmental testing for the analysis of “No Fault Found” assemblies
Electronic assemblies that fail on an aircraft often will not fail on a laboratory tester or will exhibit random and hard to pinpoint failures. This is a discussion of environmental testing types, why environmental testing is needed, and a brief review of several such assemblies and test systems and what extra environmental testing was performed to identify issues that were not identifiable under normal testing.