2011 IEEE AUTOTESTCON最新文献

Analyzing artifacts in the time domain waveform to locate wire faults 分析时域波形中的伪影以定位电线故障

2011 IEEE AUTOTESTCON Pub Date : 2012-08-09 DOI: 10.1109/MIM.2012.6263978

C. Parkey, C. Hughes, Nicholas Locken

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引用次数: 24

A system-level approach to designing modular switching software 设计模块化交换软件的系统级方法

2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058757

T. Sarfi

{"title":"A system-level approach to designing modular switching software","authors":"T. Sarfi","doi":"10.1109/AUTEST.2011.6058757","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058757","url":null,"abstract":"The system switch plays a crucial role in any automated test system as it provides ATE engineers the ability to distribute a finite amount of instrumentation I/O to multiple test points. The popularity of modular architectures such as VXI and PXI, created an opportunity for consolidation of instrumentation and switching within a single mainframe, resulting in high-channel count capability in a reduced footprint. A modular approach to switching systems also affords the ATE architect design flexibility through the use of domain-specific modules (i.e, power, RF, and analog) that can be combined to cover a broad range of the signal spectrum. Unfortunately, software development and integration can become unnecessarily complicated when the system switch is viewed simply as a collection of discrete modules that are assembled to accommodate the required I/O count. This paper will discuss web-based methodologies and software platforms that VTI Instruments has developed to create a versatile system-level switching programming environment. This framework, which is implemented on web-enabled LXI-based modular switch instruments, significantly reduces test program set development time and simplifies debugging and design validation activities without the overhead of third party configuration tools.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121398889","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Development of a command and telemetry processing interface to be independent of ground control systems 开发独立于地面控制系统的命令和遥测处理接口

2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058770

L. Segal

{"title":"Development of a command and telemetry processing interface to be independent of ground control systems","authors":"L. Segal","doi":"10.1109/AUTEST.2011.6058770","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058770","url":null,"abstract":"The Johns Hopkins University Applied Physics Laboratory (APL) has developed numerous spacecraft for national security and civilian space applications that have used varied flight computers and ground control systems. On missions that have utilized different ground control systems, the command and telemetry (C&T) database development has been unique to the specific mission. On missions that have utilized a common ground control system, APL has leveraged a limited extent of commonality in the development of the C&T databases, which has shown promise in development, schedule, and cost efficiency and has improved the quality of the early C&T database deliveries. On its recent Radiation Belt Storm Probes mission (RBSP), APL developed a set of C&T tools to tackle the challenge of developing a common C&T database across multiple satellites, over full mission life cycles, that minimizes coupling with the core ground control system such that the use across different ground systems is maximized. This paper discusses the specific approach taken in evaluating the C&T database development for APL's past missions and the shortfalls that were encountered. Lessons learned were evaluated and decisions were made in implementing the RBSP C&T databases. The tool development is briefly discussed with an emphasis on the engineering use during satellite subsystem development. Recent successes during the testing are also presented. Finally, plans are described for continued improvement to the approach and tools for subsequent APL spacecraft so that the C&T database can be ported to other missions of interest.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"76 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132785858","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Optimal switching architecture for Automated Test Equipment 自动化测试设备的最佳交换架构

2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058761

Rich Hooper

引用次数: 1

Development of a business case template for organizational-level testers 为组织级测试人员开发业务用例模板

2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058780

Mel Hocker, Virginia Slay

引用次数: 0

Where did my signal go? A discussion of signal loss between the ATE and UUT 我的信号到哪里去了?ATE和ut之间信号损耗的讨论

2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058748

T. Gohel

引用次数: 2

Proposed system for automating electrical verification and validation of spacecraft liquid propulsion systems 提出了一种航天器液体推进系统的自动化电气验证和验证系统

2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058768

I. A. Miller

引用次数: 0

Creating test systems using AXIe and PXI modules 使用AXIe和PXI模块创建测试系统

2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058749

S. Narciso

引用次数: 1

Common RF test platform 通用射频测试平台

2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058766

Rich Hooper, Doug Shuffield, Ketan Merchant, D. Savage

{"title":"Common RF test platform","authors":"Rich Hooper, Doug Shuffield, Ketan Merchant, D. Savage","doi":"10.1109/AUTEST.2011.6058766","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058766","url":null,"abstract":"A wide range of Radio Frequency (RF) assemblies require testing during their development and production. These include amplifiers, mixers, filters, up converters, down converters, antennas, phase shifters, power dividers, power combiners, Integrated Master Assemblies (IMAs), Weapons Replaceable Assemblies (WRAs), Line Replaceable Units (LRUs) and radio subassemblies. Though there are many differences between the RF assemblies, they all require a test system that is accurate, reliable and traceable while simultaneously minimizing test times. Other important attributes of a test platform for RF assemblies are that it must be calibrated, fully-characterized and incorporate self-test functionality. The test platform must also include a digital control solution for triggering, communicating with Units Under Test (UUT) and interfacing with handlers, fixtures, etc. Finally, the software for the test equipment must also be considered. Typical software functionality would include sequencing, reporting, testing, calibration, and self-test. While it is certainly possible to develop a test system specific to each type of RF assembly; there are many benefits to developing a common RF test platform that includes the functionality listed above.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"IA-21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126563042","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Structural and physical measurements at the speed of light 以光速进行结构和物理测量

2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058744

N. Yang

引用次数: 1