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2011 IEEE AUTOTESTCON最新文献

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Logistics challenges with COTS dominated army ATE 后勤挑战与COTS主导的陆军ATE
2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058794
P. A. Curry, Joseph A. Cuccaro
{"title":"Logistics challenges with COTS dominated army ATE","authors":"P. A. Curry, Joseph A. Cuccaro","doi":"10.1109/AUTEST.2011.6058794","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058794","url":null,"abstract":"The last 30 years has seen the use of Commercial off the Shelf (COTS) components in military systems increase and most recently explode because the “as advertised” benefits of speed to fielding and rapid technology improvements were being realized, however some of the other claimed advantages are less than apparent and there are some challenges to be overcome as the military begins to look at the long term support requirements for COTS systems. This paper focuses on the logistical challenges faced by the Army's Standard Automatic Test Equipment (ATE) program that is taking advantage of the benefits of utilizing COTS components.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"162 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130386799","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Using general purpose digital hardware to perform boundary scan tests 使用通用数字硬件执行边界扫描测试
2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058738
T. Borroz
{"title":"Using general purpose digital hardware to perform boundary scan tests","authors":"T. Borroz","doi":"10.1109/AUTEST.2011.6058738","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058738","url":null,"abstract":"Boundary scan tests are typically developed to make use of the proprietary hardware provided by one of the companies that specialize in boundary scan testing. This can lead to fixturing and logistical problems on large scale test systems used for Defense and Aerospace test, because testing many different assemblies whose tests rely on different boundary scan vendors can require the use of test hardware from each of those vendors. This paper presents a better approach, in which a common runtime software library can be used by each boundary scan supplier to apply his tests using the system's existing general purpose digital hardware.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116055750","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Next generation test system architectures for Depot and O-level test 下一代测试系统架构，用于仓库和o级测试
2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058758
Jim Ginn, M. Dewey
{"title":"Next generation test system architectures for Depot and O-level test","authors":"Jim Ginn, M. Dewey","doi":"10.1109/AUTEST.2011.6058758","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058758","url":null,"abstract":"For over 30 years, ATE has been a key resource and tool for the maintenance and repair of electronic systems, subsystems and board level assemblies deployed on a wide range of military-aerospace systems. ATE has been relied upon to maintain and support electronic assemblies for avionics, weapons systems, and communication systems. In addition, repair logistics and the “up-time” demands for these systems have resulted in the need for repair / support strategies that shorten the repair loop. For the U S Marine Corp, the need to minimize this repair loop is acute and has resulted in the adoption of a maintenance / repair strategy that employs Depot - level test capabilities which can also be deployed at the field or O-level. This paper discusses how next generation test architectures can address this on-going requirement for portability, performance and cost effective test solutions which address both Depot and O-level test needs.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129591083","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Capacitive transducer for condition based maintenance after harsh landing events 电容式传感器，用于恶劣着陆事件后的状态维护
2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058792
O. Sági, David Maynard, E. Enikov
{"title":"Capacitive transducer for condition based maintenance after harsh landing events","authors":"O. Sági, David Maynard, E. Enikov","doi":"10.1109/AUTEST.2011.6058792","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058792","url":null,"abstract":"The objective of this work is to identify design parameters for a capacitive sensor designed to recognize and record helicopter harsh landing events. Harsh landing events are typically associated with landing speeds exceeding 2.5 m/s [1] and require mandatory structural inspection resulting in down-times that could last a week or longer. In cases where no visible damage occurs, harsh-landing events might be difficult to identify and record. This paper presents a finite element analysis of the acceleration profile at different locations of the skid of a Bell 206 L4 helicopter which is then used to design and test a low-cost capacitive sensor for monitoring harsh landing events. Time history and histograms of the acceleration signal during normal and harsh landings are presented. The capacitive accelerometer is designed to operate in the 10g to 360g range. The sensor is integrated directly on a wiring board and is readout by a micro-controller with a capacitive ASIC. Details of the sensor design, fabrication, and testing are presented. The presented material also provides hard-to-find design data on the structural accelerations which can occur during harsh landing.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131298093","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
A statistical approach to TPS transport optimization TPS运输优化的统计方法
2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058752
J. Orlet, G. Murdock
{"title":"A statistical approach to TPS transport optimization","authors":"J. Orlet, G. Murdock","doi":"10.1109/AUTEST.2011.6058752","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058752","url":null,"abstract":"This paper discusses the statistical challenges of TPS Transport. A TPS is not considered fieldable until all tests are passing. Based on the number of tests in a TPS and the inherent complexity of the transport process, the probability exists that less than 100% of all tests will pass the first time they are tested after undergoing the transport process. Optimizing what types of tests are transported significantly improves the probability that the next TPS will be successfully transported. This paper illustrates that prioritizing which functions to focus on can greatly improve the probability of success while reducing the overall characterization effort.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126420589","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The economics of diagnostics and repair in Development, Production and Support 在开发、生产和支持中诊断和维修的经济学
2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058736
D. Lowenstein
{"title":"The economics of diagnostics and repair in Development, Production and Support","authors":"D. Lowenstein","doi":"10.1109/AUTEST.2011.6058736","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058736","url":null,"abstract":"Intrinsically everyone knows that the diagnostics and repair processes in any operation are a large area of inefficiencies for labor, material, time and other resources, ultimately leading to higher costs in some way, whether higher cost products, delayed deliveries, increase spares or other attributes. But with all this understanding, programs continue to short change investments in diagnostic and repair development. This paper will explore different economic models for the diagnostics and repair processes in Development, Production and Support. It will include a look at the tradeoffs with elements like prognostics, built in self-test and automated diagnostics.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114893944","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Improving Electrical Ground Support Equipment development for satellite testing 改进卫星试验用地面电气保障设备的研制
2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058767
J. Canoy
{"title":"Improving Electrical Ground Support Equipment development for satellite testing","authors":"J. Canoy","doi":"10.1109/AUTEST.2011.6058767","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058767","url":null,"abstract":"This paper examines the basic test method employed with Electrical Ground Support Equipment; evaluates the technical merits associated with enhanced capabilities and compares the relative cost of these enhancements. In addition, the paper explores the pros and cons of replacing current manual operations with integrating automated test methods. This study is not intended to be a precise cost analysis but is intended to provide a comparison of technical enhancements along with a basic measure of cost. This paper will provide some practical examples to support the premise that automated test methods give rise to a more thoroughly tested spacecraft, reduced test times and potential cost savings.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130355903","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A non-destructive high-voltage low-energy intermittent fault location system 一种无损高压低能间歇故障定位系统
2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058774
M. Ballas, Nicholas Locken, C. Parkey, C. Hughes
{"title":"A non-destructive high-voltage low-energy intermittent fault location system","authors":"M. Ballas, Nicholas Locken, C. Parkey, C. Hughes","doi":"10.1109/AUTEST.2011.6058774","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058774","url":null,"abstract":"The practical implementation of a high voltage/low energy portable tool is discussed to address the need for intermittent fault diagnostic solutions. Recent results from aircraft testing are reported, safety validation is discussed and future system upgrades are addressed to support ease of use as a field diagnostic tool.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"67 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128089374","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
A methodology for enhancing legacy TPS/ATS sustainability via employing Synthetic Instrumentation technology 一种通过采用合成仪器技术来提高传统TPS/ATS可持续性的方法
2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058772
D. Carey, C. Antall, R. W. Lowdermilk, Alexis Allegra
{"title":"A methodology for enhancing legacy TPS/ATS sustainability via employing Synthetic Instrumentation technology","authors":"D. Carey, C. Antall, R. W. Lowdermilk, Alexis Allegra","doi":"10.1109/AUTEST.2011.6058772","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058772","url":null,"abstract":"This paper presents a methodology for mitigating Test Program Set (TPS) & Automatic Test System (ATS) obsolescence and enhancing TPS/ATS sustainability via employing Synthetic Instrumentation (SI) technology. The methodology and the associated sub- processes described within this paper represent a major paradigm shift in current support equipment hardware & software sustainability approaches and will have a profound impact on the process of supporting and maintaining legacy automated test systems (ATS) and TPSs now and into the future. The subject methodology was validated employing the Tobyhanna Army Depot (TYAD) RF Test Platform as the demonstration vehicle test bed. The proof-of-concept demonstration validated the concept of emulating and replacing several legacy Commercial Off-the-Shelf (COTS) instruments with synthetic instrument technology. The primary goals of validating this technology paradigm were to provide an environment that would reduce TPS rework costs, decrease ATS maintenance and repair costs, and enhance the sustainability of legacy ATSs/TPSs going forward. During the course of this project the synthetic instrument technology insertion paradigm was demonstrated to the at-large DOD maintenance community.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"23 Suppl 6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134085159","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Future logistics approaches 未来的物流途径
2011 IEEE AUTOTESTCON Pub Date : 2011-10-24 DOI: 10.1109/AUTEST.2011.6058782
B. Spofford, Julie M. Altham, J. Stabler
{"title":"Future logistics approaches","authors":"B. Spofford, Julie M. Altham, J. Stabler","doi":"10.1109/AUTEST.2011.6058782","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058782","url":null,"abstract":"Moving towards the future in government testing is challenging yet very exciting. With newer platforms, Built in Test (BIT) and Built in Self Test (BIST) are used much more extensively than with legacy platforms. Additionally, some of the old design philosophies we once put aside have become new again, and have gained a much wider acceptance. This includes ensuring systems, including test systems, are supportable for life without being tied to the Original Equipment Manufacturer (OEM) for every hardware and software change. The Department of Defense (DoD) and the Air Force are actively involved in developing logistics capabilities to provide better approaches to platform systems support.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128998985","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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