Next generation test system architectures for Depot and O-level test

Abstract

For over 30 years, ATE has been a key resource and tool for the maintenance and repair of electronic systems, subsystems and board level assemblies deployed on a wide range of military-aerospace systems. ATE has been relied upon to maintain and support electronic assemblies for avionics, weapons systems, and communication systems. In addition, repair logistics and the “up-time” demands for these systems have resulted in the need for repair / support strategies that shorten the repair loop. For the U S Marine Corp, the need to minimize this repair loop is acute and has resulted in the adoption of a maintenance / repair strategy that employs Depot - level test capabilities which can also be deployed at the field or O-level. This paper discusses how next generation test architectures can address this on-going requirement for portability, performance and cost effective test solutions which address both Depot and O-level test needs.