未来的物流途径

B. Spofford, Julie M. Altham, J. Stabler
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引用次数: 1

摘要

政府测试的未来充满挑战,但也非常令人兴奋。对于较新的平台,内建测试(BIT)和内建自测(BIST)的使用要比遗留平台广泛得多。此外,我们曾经搁置的一些旧的设计理念再次成为新的,并获得了更广泛的接受。这包括确保系统(包括测试系统)终身可支持,而无需为每次硬件和软件更改与原始设备制造商(OEM)绑定。美国国防部(DoD)和空军正积极参与开发后勤能力,以提供更好的平台系统支持方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Future logistics approaches
Moving towards the future in government testing is challenging yet very exciting. With newer platforms, Built in Test (BIT) and Built in Self Test (BIST) are used much more extensively than with legacy platforms. Additionally, some of the old design philosophies we once put aside have become new again, and have gained a much wider acceptance. This includes ensuring systems, including test systems, are supportable for life without being tied to the Original Equipment Manufacturer (OEM) for every hardware and software change. The Department of Defense (DoD) and the Air Force are actively involved in developing logistics capabilities to provide better approaches to platform systems support.
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