{"title":"Anecdotal experiences on the value of limited environmental testing for the analysis of “No Fault Found” assemblies","authors":"Raymond White, Brian Richardson","doi":"10.1109/AUTEST.2011.6058733","DOIUrl":null,"url":null,"abstract":"Electronic assemblies that fail on an aircraft often will not fail on a laboratory tester or will exhibit random and hard to pinpoint failures. This is a discussion of environmental testing types, why environmental testing is needed, and a brief review of several such assemblies and test systems and what extra environmental testing was performed to identify issues that were not identifiable under normal testing.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"120 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2011.6058733","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Electronic assemblies that fail on an aircraft often will not fail on a laboratory tester or will exhibit random and hard to pinpoint failures. This is a discussion of environmental testing types, why environmental testing is needed, and a brief review of several such assemblies and test systems and what extra environmental testing was performed to identify issues that were not identifiable under normal testing.