2006 19th International Vacuum Nanoelectronics Conference最新文献

{"title":"Study of Phase Separation in Zr53Co23.5Al23.5 Bulk Amorphous Alloy by Atom Probe Tomography","authors":"A. Shariq, T. Al-Kassab, Reiner Kirchheim","doi":"10.1109/IVNC.2006.335336","DOIUrl":"https://doi.org/10.1109/IVNC.2006.335336","url":null,"abstract":"This paper investigates the phase separation of Zr53Co 23.5Al23.5 amorphous alloy and this alloy is characterized using tomographic atom probe (TAP), computer aided field ion image tomography (CFIIT) and differential scanning calorimetry (DSC). The crystallization in this system occurs in two steps. The magnetic anisotropy present in the bulk state is explained by the complex composite structure revealed by TAP and field ion microscopy. The phase separation results in Zr and Al enriched phase which is depleted in Co concentration and vice versa","PeriodicalId":108834,"journal":{"name":"2006 19th International Vacuum Nanoelectronics Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-07-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115905562","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Laser Atom Probe Tomography: some applications","authors":"D. Blavette, E. Cadel, D. Mangelinck, K. Hoummada, R. Lardé, F. Vurpillot, B. Gault, A. Vella, P. Pareige, J. Houard, B. Deconihout","doi":"10.1109/IVNC.2006.335352","DOIUrl":"https://doi.org/10.1109/IVNC.2006.335352","url":null,"abstract":"Laser atom probe tomography was used to investigate the inter-diffusive reactions at the silicon-nickel interface. The early stages of formation of a NiSi silicide was studied. The addition of Pt was shown to increase the temperature of formation of the high resistivity NiSi2 phase by approximately 150 degC","PeriodicalId":108834,"journal":{"name":"2006 19th International Vacuum Nanoelectronics Conference","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-07-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124851448","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Clustering and precipitation in neutron irradiated low copper and copper-free steels and model alloys","authors":"M. K. Miller, K. F. Russell","doi":"10.1109/IVNC.2006.335299","DOIUrl":"https://doi.org/10.1109/IVNC.2006.335299","url":null,"abstract":"The role of copper in the embrittlement of A533B and related steels used as the pressure vessels of nuclear reactors has been the subject of numerous atom probe investigations. As copper is deleterious to the mechanical properties of these neutron irradiated steels, some copper-free and low copper alloys have been investigated with the local electrode atom probe to ascertain if any other types of precipitates or clusters form with the other alloying elements. These model alloys were specifically designed to search for radiation enhanced precipitation of various phases (phosphides, silicides and manganese-nickel precipitates) in copper-free and low copper alloys.","PeriodicalId":108834,"journal":{"name":"2006 19th International Vacuum Nanoelectronics Conference","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-07-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128253089","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Field Emission Characteristics of Carbon Nanocoils Grown on Copper Micro-tips","authors":"Woo-Yong Sung, Wal-jun Kim, S. Yeon, Seungmin Lee, Ho-Young Lee, Yong-hyup Kim","doi":"10.1109/IVNC.2006.335377","DOIUrl":"https://doi.org/10.1109/IVNC.2006.335377","url":null,"abstract":"Carbon nanocoils (CNCs) were synthesized by using thermal chemical vapor deposition of C2H2 and NH3 gas at 600degC over copper micro-tips formed on silicon substrate. Copper micro-tips were formed by the high current pulse electroplating in order to investigate the effect of the surface morphology of the substrate on the growth of carbon nanostructures. We prepared three kinds of substrates with surface of electroplated copper micro-tips, electroplated copper film and evaporated copper film. Among the substrates, CNCs grown on the copper micro-tips showed the highest field emission characteristics","PeriodicalId":108834,"journal":{"name":"2006 19th International Vacuum Nanoelectronics Conference","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-07-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127043460","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Atomically Sharp Field Emitters and Oxygen Caused Thermal Faceting of W[111] Tip","authors":"R. Bryl, A. Szczepkowicz","doi":"10.1109/IVNC.2006.335320","DOIUrl":"https://doi.org/10.1109/IVNC.2006.335320","url":null,"abstract":"This paper demonstrates and summarises both temperature and oxygen exposure limitations of faceting in the system O/W[111], including facets evolution with-oxygen exposure leading to globally or steplike faceted tip, for intermediate O2 exposures 0.3 L-3 L (31 L at elevated annealing temperature 1700 K). The results presented here were obtained using FIM technique. Results show that after annealing at temperatures lower than 800 K, higher than 1850 K or for Oa exposures lower than 0.5 L the oxygen caused faceting of W[111] tip was not observed. For exposures 0.5-1.9 L and annealing temperatures 800-1600 K well developed {112} facets with sharp edges formed, and the globally faceted tip topography formed mainly after exposing the emitter to 1-1.9 L of oxygen and annealing it at temperatures 1400-1600 K. For exposures higher than 2.0 L edges of the {112} facets were broadening and disappearing, what has been attributed to the formation of 3-dimensional tungsten oxides. The oxides could be easily removed by annealing the tip at 1700 K, what lead to the formation of sharp facet edges. On the basis of these results a method of atomically sharp field emitter preparation is proposed","PeriodicalId":108834,"journal":{"name":"2006 19th International Vacuum Nanoelectronics Conference","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-07-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125461894","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Growth and field emission properties of carbon nanotubes on glass substrate of Ni catalyst layer using PECVD","authors":"L. Xin, W. Van, Weihua Liu, Changchun Zhu","doi":"10.1109/IVNC.2006.335479","DOIUrl":"https://doi.org/10.1109/IVNC.2006.335479","url":null,"abstract":"The effects of NH3 on the growth characteristics of carbon nanotubes (CNTs) were systematically investigated in plasma enhanced chemical vapor deposition (PECVD) with C2H2 as a carbon source. The well aligned CNTs were grown from the Ni nanoparticles by plasma-enhanced chemical vapor deposition (PECVD). CNT films were formed with uniform surface morphology instead of nanotube-features. High-resolution transmission electron microscopy revealed that nanotubes grow from the boot with high adhesive ability. The lowest suitable growth temperature is around 560degC. The threshold field is smaller than 2 v/mum, the current within linear extend is from 200 to 700 mA. The luminescence of the CNTs film is not uniform, which resulted from the reduction of field screening effect","PeriodicalId":108834,"journal":{"name":"2006 19th International Vacuum Nanoelectronics Conference","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-07-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117021438","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Atom Probe Tomography Study of Homogeneous and Heterogeneous Precipitation of Niobium Carbides in a Model Ferritic Steel","authors":"F. Danoix, E. Bemont, P. Maugis, F. Vurpillot, D. Blavette","doi":"10.1109/IVNC.2006.335372","DOIUrl":"https://doi.org/10.1109/IVNC.2006.335372","url":null,"abstract":"The precipitation of the NbC phase in a ferritic low carbon microalloyed steel have been investigated since the early stages using atom probe tomography (APT). Homogeneous precipitation from the random solid solution is studied since the first minutes of ageing at 873 K. A (Fe;Nb)C-type metastable phase form prior to the precipitation of the equilibrium stoichiometric carbide NbC (NaCl structure), a semi-coherent phase that has a high misfit with the ferritic matrix. On the other hand, heterogeneous precipitation along dislocation lines is also observed by computerised field ion microscopy and APT. The results obtained are compared with conventional transmission electron microscopy studies and Monte Carlo simulations of heterogeneous precipitation recently obtained","PeriodicalId":108834,"journal":{"name":"2006 19th International Vacuum Nanoelectronics Conference","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-07-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125676849","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"γ'/γ\" Interfacial Chemistry in an Inconel 718 Alloy after Service","authors":"D. Ping, Y.F. Gu, C. Cui, H. Harada","doi":"10.1109/IVNC.2006.335417","DOIUrl":"https://doi.org/10.1109/IVNC.2006.335417","url":null,"abstract":"The γ'/γ interfacial chemistry of a blade of Inconel 718 alloy after service in an airplane engine is investigated using transmission electron microscopy, scanning electron microscopy and 3DAP technique. Results show that the size of both grain and precipitates and the interfacial chemistry are stable after service.","PeriodicalId":108834,"journal":{"name":"2006 19th International Vacuum Nanoelectronics Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-07-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134129728","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Atom Probe Field Ion Microscopy and High Resolution Electron Microscopy: two complementary methods for atomic scale characterisation","authors":"F. Danoix, T. Gloriant, T. Epicier, F. Vurpillot, W. Lefebvre","doi":"10.1109/IVNC.2006.335304","DOIUrl":"https://doi.org/10.1109/IVNC.2006.335304","url":null,"abstract":"Summary form only given. Atom probe tomography is now a well recognized technique for both imaging and analyzing metallic materials at the subnanometer scale. The limitations of this techniques are mostly related to the smallness of the investigated volume, and to the limited microstructural information it can access. APT investigations are limited to volumes of about 100times100times100 nm3, which may not be fully representative of the materials microstructure. Therefore APT investigations are mostly combined with electron microscopy studies. On the other hand, APT offers a true subnanometer resolution. As compared to TEM related techniques, the major advantage of APT lies in its depth resolution, which overcomes the problem of depth sampling. Another major advantage of APT is that it also offers composition analysis capabilities with the same resolution, which can usually not be challenged by electron microscopy related techniques. On the basis of some selected metallurgical problems, the complementarity of both techniques will be highlighted, both in terms of structure and composition information: First, the nanoscale shell structure of Al3(ZrSc) precipitates is investigated. The combination of APFIM and HREM clearly proves the existence of a Zr rich shell surrounding a Zr depleted core, explaining the growth and coarsening behavior of these precipitates during annealing at 475degC. Second, a partially nanocrystallized amorphous Al92Sm8 (at.%) alloy obtained by a rapid solidification process will be investigated. A unique characterization of the nanostructure combined with the atomic species distribution of the nanocomposite materials will be presented. The absence of excessive solute concentration at the interface nanocrystallites/amorphous matrix and the particle size (about 50-60 nm), higher than the one usually observed in similar alloys, can explain the excellent observed ductility of this nanocrystallized alloy. At last, the first experimental evidence of GP zones in a very dilute Fe-Nb-C-N model high-strength low alloy (HSLA) will be given. The precipitation sequence, from a random solid solution under the simple action of temperature, will be shown. In particular, we will focus on the evidence of monolayered NbN precipitates. A tentative structure will be proposed, based on the information derived from APT and HREM","PeriodicalId":108834,"journal":{"name":"2006 19th International Vacuum Nanoelectronics Conference","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-07-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127519836","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Design of a Wide Angle Laser Assited Tomographic Atom Probe","authors":"B. Deconihout, François Vurpillot, Baptiste Gault, M. Gilbert, Angela Vella, A. Bostel, G. D. Costa, A. Menand, D. Blavette","doi":"10.1109/IVNC.2006.335349","DOIUrl":"https://doi.org/10.1109/IVNC.2006.335349","url":null,"abstract":"A wide angle tomographic atom probe has been designed in which the field evaporation of atoms is assisted by subpicosecond laser pulses. It has been shown that the field evaporation is due to the generation of a THz pulse due to the rectification of the optical field at the specimen surface. The very short duration of the pulsed field (a few hundred fs) offers several advantages as compared to conventional pulsing method. First, it makes possible to bring intense electric field at the surface of resistive specimens opening the field of application of the atom probe tomography to new materials such as oxydes or semiconductors. Second, a high mass resolution can be achieved in a straight type configuration allowing to fully open the field of view in order to collect the whole amount of data available from field emitter specimens. Third, because the pulse duration is below the phonon vibration time, no cycling stress in applied on the specimen during the analysis. As a result, very fragile materials can be investigated by APT. In addition, this makes possible to investigate materials at very low temperature making the spatial resolution better. In this contribution, the design of the LaWaTAP will be presented and the performance of the instrument discussed through some applications to metals, oxydes and semiconductors","PeriodicalId":108834,"journal":{"name":"2006 19th International Vacuum Nanoelectronics Conference","volume":"301 12","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-07-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120838692","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}