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2006 19th International Vacuum Nanoelectronics Conference最新文献

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Fabrication and Emission Properties of Single Crystal Lanthanum Hexaboride Tip 单晶六硼化镧尖端的制备及其发射特性
2006 19th International Vacuum Nanoelectronics Conference Pub Date : 2006-07-01 DOI: 10.1109/IVNC.2006.335441
Xiaoju Wang, Zulun Lin, Zexiang Chen, Kangcheng Qi, Yadong Jiang, Haibo Yu
{"title":"Fabrication and Emission Properties of Single Crystal Lanthanum Hexaboride Tip","authors":"Xiaoju Wang, Zulun Lin, Zexiang Chen, Kangcheng Qi, Yadong Jiang, Haibo Yu","doi":"10.1109/IVNC.2006.335441","DOIUrl":"https://doi.org/10.1109/IVNC.2006.335441","url":null,"abstract":"Field emission cathode single tip was fabricated by electro-chemical etching method. The materials used here were single crystal lanthanum hexaboride (LaB6), polycrystalline lanthanum hexaboride, molybdenum, and tungsten, respectively. Electron emission characteristics of single crystal LaB6 cold cathode were studied in a diode test cell in vacuum system. When the distance between the single crystal LaB6 tip and the anode was 0.2mm, current density of 1.25times104 A/cm2 was obtained at a pressure of 3.4times10-4 Pa with DC-3000 V bias applied to the anode. Results show that single crystal LaB6 cold cathode, due to its high current density, low evaporation rates, high stability, strong ability of antipoisoning and long life, is an excellent electron source, particularly fitting for traveling-wave tubes, klystrons and other large vacuum apparatus","PeriodicalId":108834,"journal":{"name":"2006 19th International Vacuum Nanoelectronics Conference","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131451642","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Simulation of Temperature Dependence of Field Electron Emission from CuO Nanowires CuO纳米线场电子发射的温度依赖性模拟
2006 19th International Vacuum Nanoelectronics Conference Pub Date : 2006-07-01 DOI: 10.1109/IVNC.2006.335219
Z. Jiang, Wen Wang, Z. Li, N. Xu
{"title":"Simulation of Temperature Dependence of Field Electron Emission from CuO Nanowires","authors":"Z. Jiang, Wen Wang, Z. Li, N. Xu","doi":"10.1109/IVNC.2006.335219","DOIUrl":"https://doi.org/10.1109/IVNC.2006.335219","url":null,"abstract":"The temperature dependence of field emission currents from CuO nanowires are calculated using a method considering both nanowire core conducting current and hopping current induced by surface states. Results are compared to data from experimental work","PeriodicalId":108834,"journal":{"name":"2006 19th International Vacuum Nanoelectronics Conference","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131102325","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
CuO Nanowire Arrays: Preparation, Characterization and Field Emission Properties CuO纳米线阵列:制备、表征及场发射特性
2006 19th International Vacuum Nanoelectronics Conference Pub Date : 2006-07-01 DOI: 10.1109/IVNC.2006.335383
Jun Chen, S.M. Zhang, C.Y. Li, X. Liu, S. Deng, N. Xu
{"title":"CuO Nanowire Arrays: Preparation, Characterization and Field Emission Properties","authors":"Jun Chen, S.M. Zhang, C.Y. Li, X. Liu, S. Deng, N. Xu","doi":"10.1109/IVNC.2006.335383","DOIUrl":"https://doi.org/10.1109/IVNC.2006.335383","url":null,"abstract":"Well-aligned CuO nanowire arrays were grown using a thermal oxidation method at temperatures ranging from 350 to 650degC. Morphology and structure characterization was done by field emission scanning electron microscopy, high resolution transmission electron microscopy and selected area electron diffraction, while composition and electronic structure was studied by X-ray diffraction, Raman spectroscopy, X-ray photoelectron spectroscopy and ultraviolet photoelectron spectroscopy. Field emission properties including current-applied field characteristics, emission uniformity and temperature dependence are tested in a ultrahigh vacuum system","PeriodicalId":108834,"journal":{"name":"2006 19th International Vacuum Nanoelectronics Conference","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133155119","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Space Charge Effects on the I-V Characteristics of Field Emission Arrays 空间电荷对场发射阵列I-V特性的影响
2006 19th International Vacuum Nanoelectronics Conference Pub Date : 2006-07-01 DOI: 10.1116/1.2717198
Ming-Chieh Lin
{"title":"Space Charge Effects on the I-V Characteristics of Field Emission Arrays","authors":"Ming-Chieh Lin","doi":"10.1116/1.2717198","DOIUrl":"https://doi.org/10.1116/1.2717198","url":null,"abstract":"In recent years, the wide applications of vacuum electronic devices call for a well development of field emission cathodes. Field emission arrays are a good candidate for the use as a field emitter. The electronic property, or the emission behavior, of an emitter is characterized by the I-V curves. The field emission due to quantum mechanical tunneling is described by the well-known Fowler-Nordheim (FN) equation. The FN plots are widely employed to fit the experimental data. With the advancement in the fabrication technology, the emission current density of a field emission array achieves even higher and higher values than ever before. In recent experiments of field emission arrays, the FN plots show that the results are apart from the FN fits. In this work, we study the space charge effects on the I-V characteristics of the field emission arrays that may be operated at high current density. Within the framework of the effective work function approximation, the FN equation is modified with an effective work function. The effective work function characterizes the surface properties of the field emission array. A self-consistent FN equation including the space charge effects of the field emission electrons is demonstrated to be a good fit to the I-V characteristics of field emission arrays. The theoretical results show good agreement in comparisons with some experimental results","PeriodicalId":108834,"journal":{"name":"2006 19th International Vacuum Nanoelectronics Conference","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131852285","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Overview of Computer Simulation Techniques for Field Emission Study 场发射研究的计算机模拟技术综述
2006 19th International Vacuum Nanoelectronics Conference Pub Date : 2006-07-01 DOI: 10.1109/IVNC.2006.335430
Z. Cui
{"title":"Overview of Computer Simulation Techniques for Field Emission Study","authors":"Z. Cui","doi":"10.1109/IVNC.2006.335430","DOIUrl":"https://doi.org/10.1109/IVNC.2006.335430","url":null,"abstract":"In field emission study, computer simulations are used to basically acquire two types of information: field distribution around a field emitter and charged particles emission from the emitter, which includes tracing charged particle trajectories and evaluating space charge effect. These involve solving Maxwell equations, Lorenz force equations and calculating emission current from the Fowler-Nordheim equation. There are well established numerical methods to solve these equations, such as finite difference method (FDM), finite element method (FEM) and boundary element method (BEM). In term of simulating field distribution, there are many commercial or home-made software packages and programmes, ranging from much generalized software such as MATLAB to much specialised software such as SOURCE. The MATLAB and the SOURCE are all FEM-based software. FEM is flexible in field simulation because unstructured meshing technique can be used to fit to complicated shape of field emitters. However, it is more difficult to calculate electron trajectories in a FEM-based mesh domain than in a FDM-based mesh domain. Therefore the early simulation programmes were primarily FDM-based","PeriodicalId":108834,"journal":{"name":"2006 19th International Vacuum Nanoelectronics Conference","volume":"1 12","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131879466","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Influence of Emitter Temperature and Ionization Potentials of Emitter Atoms on Charge of Evaporated Ions 发射体温度和发射体原子电离势对蒸发离子电荷的影响
2006 19th International Vacuum Nanoelectronics Conference Pub Date : 2006-07-01 DOI: 10.1109/IVNC.2006.335359
O. L. Golubev, M. V. Loginov
{"title":"Influence of Emitter Temperature and Ionization Potentials of Emitter Atoms on Charge of Evaporated Ions","authors":"O. L. Golubev, M. V. Loginov","doi":"10.1109/IVNC.2006.335359","DOIUrl":"https://doi.org/10.1109/IVNC.2006.335359","url":null,"abstract":"The influence of emitter temperature and ionisation potentials of emitter atoms on the process of field evaporation was studied by means of time-of flight atom probe and field emission microscopy. For the study of the influence of ionization potential on the evaporation process alloy NiCr (20% Cr, 80% Ni) and carbide W were selected. The mass spectrum were obtained at various emitter temperature T from 80 K to the temperature near the melting point. Evaporation of easy evaporated element leads to reduction of binding energy of more difficult evaporated element before such values, as its evaporation becomes to be possible at the same value Fev","PeriodicalId":108834,"journal":{"name":"2006 19th International Vacuum Nanoelectronics Conference","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133078908","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Carbon Nanotube Lateral Field Emitters with Metallic Anode 金属阳极碳纳米管横向场发射体
2006 19th International Vacuum Nanoelectronics Conference Pub Date : 2006-07-01 DOI: 10.1109/IVNC.2006.335248
Y. Wong, W. Kang, J. Davidson, B. Choi, J.H. Huang
{"title":"Carbon Nanotube Lateral Field Emitters with Metallic Anode","authors":"Y. Wong, W. Kang, J. Davidson, B. Choi, J.H. Huang","doi":"10.1109/IVNC.2006.335248","DOIUrl":"https://doi.org/10.1109/IVNC.2006.335248","url":null,"abstract":"A lateral carbon nanotube (CNT) field emission device with a metallic anode is fabricated through a dual-mask microfabrication process complemented with a two-step microwave plasma-enhanced chemical vapor deposition. SEM was employed to characterize the structure of the fabricated device","PeriodicalId":108834,"journal":{"name":"2006 19th International Vacuum Nanoelectronics Conference","volume":"139 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115022277","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Effective Lamp for LCD-Backlightning with the Field Emission Cathode 具有场发射阴极的lcd背雷有效灯
2006 19th International Vacuum Nanoelectronics Conference Pub Date : 2006-07-01 DOI: 10.1109/IVNC.2006.335215
A. Leychenko, M. Leshukov, N. N. Chadaev, E. Sheshin
{"title":"Effective Lamp for LCD-Backlightning with the Field Emission Cathode","authors":"A. Leychenko, M. Leshukov, N. N. Chadaev, E. Sheshin","doi":"10.1109/IVNC.2006.335215","DOIUrl":"https://doi.org/10.1109/IVNC.2006.335215","url":null,"abstract":"This work is devoted to create an effective cathodoluminescent light source for using in systems of backlighting of LCDs. In the heart of the development of such light source the idea of using the field emission cathode made of nanostructured carbon materials underlies","PeriodicalId":108834,"journal":{"name":"2006 19th International Vacuum Nanoelectronics Conference","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114131945","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Residual Gas Analysis based on CNT-FED 基于CNT-FED的残余气体分析
2006 19th International Vacuum Nanoelectronics Conference Pub Date : 2006-07-01 DOI: 10.1109/IVNC.2006.335264
Jinchan Wang, Xiaobing Zhang, W. Lei, Mei Xiao, Yunkang Cui, Y. Di, Fuming Mao
{"title":"Residual Gas Analysis based on CNT-FED","authors":"Jinchan Wang, Xiaobing Zhang, W. Lei, Mei Xiao, Yunkang Cui, Y. Di, Fuming Mao","doi":"10.1109/IVNC.2006.335264","DOIUrl":"https://doi.org/10.1109/IVNC.2006.335264","url":null,"abstract":"We studied the residual gases inside field emission displays (FEDs) with carbon nanotube(CNTs) emitters, and found that the main residual gases inside sealed CNT-FEDs are Ar and CO, both of which are typical residual gases inside electronic vacuum tubes","PeriodicalId":108834,"journal":{"name":"2006 19th International Vacuum Nanoelectronics Conference","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115134038","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Field Emission and Lifetime Characteristics of Titanium-coated Carbon Nanotubes 钛包覆碳纳米管的场发射和寿命特性
2006 19th International Vacuum Nanoelectronics Conference Pub Date : 2006-07-01 DOI: 10.1109/IVNC.2006.335223
HeesungMoon, Jae-myung Kim, Changwook Kim, Youngmi Cho, S. Cho, Jong-Hwan Park, D. Zang
{"title":"Field Emission and Lifetime Characteristics of Titanium-coated Carbon Nanotubes","authors":"HeesungMoon, Jae-myung Kim, Changwook Kim, Youngmi Cho, S. Cho, Jong-Hwan Park, D. Zang","doi":"10.1109/IVNC.2006.335223","DOIUrl":"https://doi.org/10.1109/IVNC.2006.335223","url":null,"abstract":"We investigated the effect of titanium (Ti)-coated carbon nanotubes (CNTs) theoretically and experimentally. We found that adsorption of single Ti atom lowers the work function of CNTs by density functional calculations. Also, Ti-coated CNTs showed the largest increase in local density of states around Fermi level under electric fields. Coating of Ti metal on CNTs was carried out by electroless plating method. Ti-coated CNTs were mixed with conductive pastes, and then screen-printed. The measurement of field emission carried out using a diode structure showed that the electron emission of Ti-coated CNT films uniformly had a field of 3.7 V/mum at a current density of 100 mu/cm2 (1/500 duty), as compare to bare CNT films showed a field of 5.5 V/mum. Furthermore, the lifetime of our CNT samples was about a few times as much as that of the pristine ones. Therefore, Ti-coated CNTs improved the characteristics of CNT-based field emission emitters","PeriodicalId":108834,"journal":{"name":"2006 19th International Vacuum Nanoelectronics Conference","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123090562","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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