CuO纳米线阵列:制备、表征及场发射特性

Jun Chen, S.M. Zhang, C.Y. Li, X. Liu, S. Deng, N. Xu
{"title":"CuO纳米线阵列:制备、表征及场发射特性","authors":"Jun Chen, S.M. Zhang, C.Y. Li, X. Liu, S. Deng, N. Xu","doi":"10.1109/IVNC.2006.335383","DOIUrl":null,"url":null,"abstract":"Well-aligned CuO nanowire arrays were grown using a thermal oxidation method at temperatures ranging from 350 to 650degC. Morphology and structure characterization was done by field emission scanning electron microscopy, high resolution transmission electron microscopy and selected area electron diffraction, while composition and electronic structure was studied by X-ray diffraction, Raman spectroscopy, X-ray photoelectron spectroscopy and ultraviolet photoelectron spectroscopy. Field emission properties including current-applied field characteristics, emission uniformity and temperature dependence are tested in a ultrahigh vacuum system","PeriodicalId":108834,"journal":{"name":"2006 19th International Vacuum Nanoelectronics Conference","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"CuO Nanowire Arrays: Preparation, Characterization and Field Emission Properties\",\"authors\":\"Jun Chen, S.M. Zhang, C.Y. Li, X. Liu, S. Deng, N. Xu\",\"doi\":\"10.1109/IVNC.2006.335383\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Well-aligned CuO nanowire arrays were grown using a thermal oxidation method at temperatures ranging from 350 to 650degC. Morphology and structure characterization was done by field emission scanning electron microscopy, high resolution transmission electron microscopy and selected area electron diffraction, while composition and electronic structure was studied by X-ray diffraction, Raman spectroscopy, X-ray photoelectron spectroscopy and ultraviolet photoelectron spectroscopy. Field emission properties including current-applied field characteristics, emission uniformity and temperature dependence are tested in a ultrahigh vacuum system\",\"PeriodicalId\":108834,\"journal\":{\"name\":\"2006 19th International Vacuum Nanoelectronics Conference\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 19th International Vacuum Nanoelectronics Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVNC.2006.335383\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 19th International Vacuum Nanoelectronics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVNC.2006.335383","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

利用热氧化法在350 ~ 650℃的温度范围内生长出排列良好的CuO纳米线阵列。采用场发射扫描电镜、高分辨率透射电镜和选定区域电子衍射对其形貌和结构进行表征,采用x射线衍射、拉曼光谱、x射线光电子能谱和紫外光电子能谱对其组成和电子结构进行研究。在超高真空系统中测试了场发射特性,包括电流场特性、发射均匀性和温度依赖性
本文章由计算机程序翻译,如有差异,请以英文原文为准。
CuO Nanowire Arrays: Preparation, Characterization and Field Emission Properties
Well-aligned CuO nanowire arrays were grown using a thermal oxidation method at temperatures ranging from 350 to 650degC. Morphology and structure characterization was done by field emission scanning electron microscopy, high resolution transmission electron microscopy and selected area electron diffraction, while composition and electronic structure was studied by X-ray diffraction, Raman spectroscopy, X-ray photoelectron spectroscopy and ultraviolet photoelectron spectroscopy. Field emission properties including current-applied field characteristics, emission uniformity and temperature dependence are tested in a ultrahigh vacuum system
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