Jun Chen, S.M. Zhang, C.Y. Li, X. Liu, S. Deng, N. Xu
{"title":"CuO纳米线阵列:制备、表征及场发射特性","authors":"Jun Chen, S.M. Zhang, C.Y. Li, X. Liu, S. Deng, N. Xu","doi":"10.1109/IVNC.2006.335383","DOIUrl":null,"url":null,"abstract":"Well-aligned CuO nanowire arrays were grown using a thermal oxidation method at temperatures ranging from 350 to 650degC. Morphology and structure characterization was done by field emission scanning electron microscopy, high resolution transmission electron microscopy and selected area electron diffraction, while composition and electronic structure was studied by X-ray diffraction, Raman spectroscopy, X-ray photoelectron spectroscopy and ultraviolet photoelectron spectroscopy. Field emission properties including current-applied field characteristics, emission uniformity and temperature dependence are tested in a ultrahigh vacuum system","PeriodicalId":108834,"journal":{"name":"2006 19th International Vacuum Nanoelectronics Conference","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"CuO Nanowire Arrays: Preparation, Characterization and Field Emission Properties\",\"authors\":\"Jun Chen, S.M. Zhang, C.Y. Li, X. Liu, S. Deng, N. Xu\",\"doi\":\"10.1109/IVNC.2006.335383\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Well-aligned CuO nanowire arrays were grown using a thermal oxidation method at temperatures ranging from 350 to 650degC. Morphology and structure characterization was done by field emission scanning electron microscopy, high resolution transmission electron microscopy and selected area electron diffraction, while composition and electronic structure was studied by X-ray diffraction, Raman spectroscopy, X-ray photoelectron spectroscopy and ultraviolet photoelectron spectroscopy. Field emission properties including current-applied field characteristics, emission uniformity and temperature dependence are tested in a ultrahigh vacuum system\",\"PeriodicalId\":108834,\"journal\":{\"name\":\"2006 19th International Vacuum Nanoelectronics Conference\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 19th International Vacuum Nanoelectronics Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVNC.2006.335383\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 19th International Vacuum Nanoelectronics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVNC.2006.335383","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
CuO Nanowire Arrays: Preparation, Characterization and Field Emission Properties
Well-aligned CuO nanowire arrays were grown using a thermal oxidation method at temperatures ranging from 350 to 650degC. Morphology and structure characterization was done by field emission scanning electron microscopy, high resolution transmission electron microscopy and selected area electron diffraction, while composition and electronic structure was studied by X-ray diffraction, Raman spectroscopy, X-ray photoelectron spectroscopy and ultraviolet photoelectron spectroscopy. Field emission properties including current-applied field characteristics, emission uniformity and temperature dependence are tested in a ultrahigh vacuum system