{"title":"发射体温度和发射体原子电离势对蒸发离子电荷的影响","authors":"O. L. Golubev, M. V. Loginov","doi":"10.1109/IVNC.2006.335359","DOIUrl":null,"url":null,"abstract":"The influence of emitter temperature and ionisation potentials of emitter atoms on the process of field evaporation was studied by means of time-of flight atom probe and field emission microscopy. For the study of the influence of ionization potential on the evaporation process alloy NiCr (20% Cr, 80% Ni) and carbide W were selected. The mass spectrum were obtained at various emitter temperature T from 80 K to the temperature near the melting point. Evaporation of easy evaporated element leads to reduction of binding energy of more difficult evaporated element before such values, as its evaporation becomes to be possible at the same value Fev","PeriodicalId":108834,"journal":{"name":"2006 19th International Vacuum Nanoelectronics Conference","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Influence of Emitter Temperature and Ionization Potentials of Emitter Atoms on Charge of Evaporated Ions\",\"authors\":\"O. L. Golubev, M. V. Loginov\",\"doi\":\"10.1109/IVNC.2006.335359\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The influence of emitter temperature and ionisation potentials of emitter atoms on the process of field evaporation was studied by means of time-of flight atom probe and field emission microscopy. For the study of the influence of ionization potential on the evaporation process alloy NiCr (20% Cr, 80% Ni) and carbide W were selected. The mass spectrum were obtained at various emitter temperature T from 80 K to the temperature near the melting point. Evaporation of easy evaporated element leads to reduction of binding energy of more difficult evaporated element before such values, as its evaporation becomes to be possible at the same value Fev\",\"PeriodicalId\":108834,\"journal\":{\"name\":\"2006 19th International Vacuum Nanoelectronics Conference\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 19th International Vacuum Nanoelectronics Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVNC.2006.335359\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 19th International Vacuum Nanoelectronics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVNC.2006.335359","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Influence of Emitter Temperature and Ionization Potentials of Emitter Atoms on Charge of Evaporated Ions
The influence of emitter temperature and ionisation potentials of emitter atoms on the process of field evaporation was studied by means of time-of flight atom probe and field emission microscopy. For the study of the influence of ionization potential on the evaporation process alloy NiCr (20% Cr, 80% Ni) and carbide W were selected. The mass spectrum were obtained at various emitter temperature T from 80 K to the temperature near the melting point. Evaporation of easy evaporated element leads to reduction of binding energy of more difficult evaporated element before such values, as its evaporation becomes to be possible at the same value Fev
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