2009 Asian Test Symposium最新文献_第2页

Bridging Fault Diagnosis to Identify the Layer of Systematic Defects 桥接故障诊断识别系统缺陷层

2009 Asian Test Symposium Pub Date : 2009-11-23 DOI: 10.1109/ATS.2009.58

Po-Juei Chen, C. Li, Hsing Jasmine Chao

引用次数: 4

LFSR-Based Performance Characterization of Nonlinear Analog and Mixed-Signal Circuits 基于lfsr的非线性模拟和混合信号电路性能表征

2009 Asian Test Symposium Pub Date : 2009-11-23 DOI: 10.1109/ATS.2009.66

Joonsung Park, Jaeyong Chung, J. Abraham

引用次数: 10

A Scalable Scan Architecture for Godson-3 Multicore Microprocessor Godson-3多核微处理器的可扩展扫描体系结构

2009 Asian Test Symposium Pub Date : 2009-11-23 DOI: 10.1109/ATS.2009.52

Zichu Qi, Hui Liu, Xiangku Li, Da Wang, Yinhe Han, Huawei Li, Weiwu Hu

引用次数: 5

New Algorithms for Address Decoder Delay Faults and Bit Line Imbalance Faults 地址解码器延迟故障和位线不平衡故障的新算法

2009 Asian Test Symposium Pub Date : 2009-11-23 DOI: 10.1109/ATS.2009.87

A. V. Goor, S. Hamdioui, G. Gaydadjiev, Z. Al-Ars

引用次数: 21

Testing Embedded Memories in the Nano-Era: Will the Existing Approaches Survive? 在纳米时代测试嵌入式记忆:现有的方法会继续存在吗?

2009 Asian Test Symposium Pub Date : 2009-11-23 DOI: 10.1109/ATS.2009.92

S. Hamdioui

引用次数: 0

Is Low Power Testing Necessary? What does the Test Industry Truly Need? 低功耗测试是必要的吗?测试行业真正需要什么?

2009 Asian Test Symposium Pub Date : 2009-11-23 DOI: 10.1109/ATS.2009.91

A. Uzzaman

引用次数: 0

Transaction Level Modeling and Design Space Exploration for SOC Test Architectures SOC测试架构的事务级建模与设计空间探索

2009 Asian Test Symposium Pub Date : 2009-11-23 DOI: 10.1109/ATS.2009.33

C. Chang, Chih-Yuan Hsiao, Kuen-Jong Lee, A. Su

引用次数: 2

Speeding up SAT-Based ATPG Using Dynamic Clause Activation 利用动态子句激活加速基于sat的ATPG

2009 Asian Test Symposium Pub Date : 2009-11-23 DOI: 10.1109/ATS.2009.26

Stephan Eggersglüß, Daniel Tille, R. Drechsler

引用次数: 15

Yield Ramp up by Scan Chain Diagnosis 通过扫描链诊断提高产量

2009 Asian Test Symposium Pub Date : 2009-11-23 DOI: 10.1109/ATS.2009.70

F. Kuo, Yuan-Shih Chen

引用次数: 7

Multiple-Core under Test Architecture for HOY Wireless Testing Platform HOY无线测试平台的多核测试架构

2009 Asian Test Symposium Pub Date : 2009-11-23 DOI: 10.1109/ATS.2009.43

Sung-Yu Chen, Ying-Yen Chen, Chun-Yu Yang, J. Liou

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引用次数: 0